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Related papers: Unsupervised Learning for Industrial Defect Detect…

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Anomaly Detection (AD), as a critical problem, has been widely discussed. In this paper, we specialize in one specific problem, Visual Defect Detection (VDD), in many industrial applications. And in practice, defect image samples are very…

Computer Vision and Pattern Recognition · Computer Science 2022-11-30 Yapeng Teng , Haoyang Li , Fuzhen Cai , Ming Shao , Siyu Xia

Automatic defect recognition is one of the research hotspots in steel production, but most of the current methods mainly extract features manually and use machine learning classifiers to recognize defects, which cannot tackle the situation,…

Computer Vision and Pattern Recognition · Computer Science 2019-09-18 Jingwen Fu , Xiaoyan Zhu , Yingbin Li

Traditional feature-based image stitching technologies rely heavily on feature detection quality, often failing to stitch images with few features or low resolution. The learning-based image stitching solutions are rarely studied due to the…

Computer Vision and Pattern Recognition · Computer Science 2021-07-07 Lang Nie , Chunyu Lin , Kang Liao , Shuaicheng Liu , Yao Zhao

We consider the problem of anomaly detection with a small set of partially labeled anomaly examples and a large-scale unlabeled dataset. This is a common scenario in many important applications. Existing related methods either exclusively…

Machine Learning · Computer Science 2021-06-11 Guansong Pang , Anton van den Hengel , Chunhua Shen , Longbing Cao

Complex industrial systems are continuously monitored by a large number of heterogeneous sensors. The diversity of their operating conditions and the possible fault types make it impossible to collect enough data for learning all the…

Artificial Intelligence · Computer Science 2019-08-27 Gabriel Michau , Yang Hu , Thomas Palmé , Olga Fink

We present a novel unsupervised deep learning approach that utilizes the encoder-decoder architecture for detecting anomalies in sequential sensor data collected during industrial manufacturing. Our approach is designed not only to detect…

Metric learning is an important problem in machine learning. It aims to group similar examples together. Existing state-of-the-art metric learning approaches require class labels to learn a metric. As obtaining class labels in all…

Computer Vision and Pattern Recognition · Computer Science 2020-09-29 Ujjal Kr Dutta , Mehrtash Harandi , Chellu Chandra Sekhar

Unsupervised learning is becoming more and more important recently. As one of its key components, the autoencoder (AE) aims to learn a latent feature representation of data which is more robust and discriminative. However, most AE based…

Machine Learning · Computer Science 2019-04-02 Jingcai Guo , Song Guo

Anomaly detection (AD), separating anomalies from normal data, has many applications across domains, from security to healthcare. While most previous works were shown to be effective for cases with fully or partially labeled data, that…

Machine Learning · Computer Science 2022-08-08 Jinsung Yoon , Kihyuk Sohn , Chun-Liang Li , Sercan O. Arik , Chen-Yu Lee , Tomas Pfister

Deep learning methods have proven to outperform traditional computer vision methods in various areas of image processing. However, the application of deep learning in industrial surface defect detection systems is challenging due to the…

Computer Vision and Pattern Recognition · Computer Science 2021-09-24 Dominik Martin , Simon Heinzel , Johannes Kunze von Bischhoffshausen , Niklas Kühl

Unsupervised learning poses one of the most difficult challenges in computer vision today. The task has an immense practical value with many applications in artificial intelligence and emerging technologies, as large quantities of unlabeled…

Computer Vision and Pattern Recognition · Computer Science 2019-05-28 Ioana Croitoru , Simion-Vlad Bogolin , Marius Leordeanu

Sequential sensor data is generated in a wide variety of practical applications. A fundamental challenge involves learning effective classifiers for such sequential data. While deep learning has led to impressive performance gains in recent…

Machine Learning · Computer Science 2020-10-07 Nauman Ahad , Mark A. Davenport

We present a representation learning method that learns features at multiple different levels of scale. Working within the unsupervised framework of denoising autoencoders, we observe that when the input is heavily corrupted during…

Machine Learning · Computer Science 2015-04-14 Krzysztof J. Geras , Charles Sutton

We introduce an unsupervised feature learning approach that embeds 3D shape information into a single-view image representation. The main idea is a self-supervised training objective that, given only a single 2D image, requires all unseen…

Computer Vision and Pattern Recognition · Computer Science 2018-08-01 Dinesh Jayaraman , Ruohan Gao , Kristen Grauman

Deep learning models are known to be vulnerable to adversarial examples that are elaborately designed for malicious purposes and are imperceptible to the human perceptual system. Autoencoder, when trained solely over benign examples, has…

Computer Vision and Pattern Recognition · Computer Science 2022-08-30 Zhaoxi Zhang , Leo Yu Zhang , Xufei Zheng , Jinyu Tian , Jiantao Zhou

Training image-based object detectors presents formidable challenges, as it entails not only the complexities of object detection but also the added intricacies of precisely localizing objects within potentially diverse and noisy…

Computer Vision and Pattern Recognition · Computer Science 2024-02-22 Chandan Kumar , Jansel Herrera-Gerena , John Just , Matthew Darr , Ali Jannesari

Deep learning segmentation relies heavily on labeled data, but manual labeling is laborious and time-consuming, especially for volumetric images such as brain magnetic resonance imaging (MRI). While recent domain-randomization techniques…

Computer Vision and Pattern Recognition · Computer Science 2025-12-05 Bella Specktor-Fadida , Malte Hoffmann

In this work, we introduce LEAD, an approach to discover landmarks from an unannotated collection of category-specific images. Existing works in self-supervised landmark detection are based on learning dense (pixel-level) feature…

Computer Vision and Pattern Recognition · Computer Science 2022-04-07 Tejan Karmali , Abhinav Atrishi , Sai Sree Harsha , Susmit Agrawal , Varun Jampani , R. Venkatesh Babu

Deep learning has transformed computer vision but relies heavily on large labeled datasets and computational resources. Transfer learning, particularly fine-tuning pretrained models, offers a practical alternative; however, models…

Computer Vision and Pattern Recognition · Computer Science 2025-05-23 Iván Matas , Carmen Serrano , Miguel Nogales , David Moreno , Lara Ferrándiz , Teresa Ojeda , Begoña Acha

Anomaly detection is an important task for complex systems (e.g., industrial facilities, manufacturing, large-scale science experiments), where failures in a sub-system can lead to low yield, faulty products, or even damage to components.…

Machine Learning · Computer Science 2023-09-06 Ryan Humble , Zhe Zhang , Finn O'Shea , Eric Darve , Daniel Ratner
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