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We investigate unsupervised anomaly detection for high-dimensional data and introduce a deep metric learning (DML) based framework. In particular, we learn a distance metric through a deep neural network. Through this metric, we project the…

Machine Learning · Computer Science 2020-05-13 Selim F. Yilmaz , Suleyman S. Kozat

We explore how the thermodynamic properties and dynamics of a self-interstitial prismatic dislocation loop are affected by microscopic-scale variations in its geometric configuration, an aspect that rarely received attention in literature.…

Materials Science · Physics 2026-05-12 Sho Hayakawa , Sergei L. Dudarev , Max Boleininger

High-dimensional datasets often contain multiple meaningful clusterings in different subspaces. For example, objects can be clustered either by color, weight, or size, revealing different interpretations of the given dataset. A variety of…

Machine Learning · Computer Science 2025-04-08 Collin Leiber , Dominik Mautz , Claudia Plant , Christian Böhm

Unsupervised clustering is one of the most fundamental challenges in machine learning. A popular hypothesis is that data are generated from a union of low-dimensional nonlinear manifolds; thus an approach to clustering is identifying and…

Machine Learning · Computer Science 2017-12-27 Dejiao Zhang , Yifan Sun , Brian Eriksson , Laura Balzano

Currently, identification of crystallization pathways in polymers is being carried out using molecular simulation-based data on a preset cut-off point on a single order parameter (OP) to define nucleated or crystallized regions. Aside from…

Computational Physics · Physics 2025-07-25 Elyar Tourani , Brian J. Edwards , Bamin Khomami

Supervised learning is based on the assumption that the ground truth in the training data is accurate. However, this may not be guaranteed in real-world settings. Inaccurate training data will result in some unexpected predictions. In image…

Computer Vision and Pattern Recognition · Computer Science 2022-01-06 Yunhao Yang , Andrew Whinston

Computing atomic-scale properties of chemically disordered materials requires an efficient exploration of their vast configuration space. Traditional approaches such as Monte Carlo or Special Quasirandom Structures either entail sampling an…

Materials Science · Physics 2026-03-17 Maciej J. Karcz , Luca Messina , Eiji Kawasaki , Emeric Bourasseau

The pretraining-finetuning paradigm is a crucial strategy in metallic surface defect detection for mitigating the challenges posed by data scarcity. However, its implementation presents a critical dilemma. Pretraining on natural image…

Computer Vision and Pattern Recognition · Computer Science 2026-05-27 Chuni Liu , Hongjie Li , Jiaqi Du , Yangyang Hou , Qian Sun , Lei Jin , Ke Xu

The unsupervised visual inspection of defects in industrial products poses a significant challenge due to substantial variations in product surfaces. Current unsupervised models struggle to strike a balance between detecting texture and…

Computer Vision and Pattern Recognition · Computer Science 2023-11-22 Peng Wang , Haiming Yao , Wenyong Yu

There is intense interest in uncovering design rules that govern the formation of various structural phases as a function of chemical composition in multi-principal element alloys (MPEAs). In this paper, we develop a machine learning (ML)…

Materials Science · Physics 2022-06-22 Kyungtae Lee , Mukil Ayyasamy , Paige Delsa , Timothy Q. Hartnett , Prasanna V. Balachandran

Irradiation-induced void swelling is a critical degradation mechanism for structural materials in nuclear reactors, dictating component operational lifespan and safety. While recent machine learning (ML) approaches have improved the…

Applications · Statistics 2026-03-03 Minhee Kim , Yong Yang

We propose a new representation of visual data that disentangles object position from appearance. Our method, termed Deep Latent Particles (DLP), decomposes the visual input into low-dimensional latent ``particles'', where each particle is…

Computer Vision and Pattern Recognition · Computer Science 2022-07-27 Tal Daniel , Aviv Tamar

This survey paper offers a comprehensive review of methodologies utilizing machine learning (ML) classification techniques for identifying wafer defects in semiconductor manufacturing. Despite the growing body of research demonstrating the…

Machine Learning · Computer Science 2024-03-21 Kamal Taha

We propose an unsupervised learning methodology with descriptors based on Topological Data Analysis (TDA) concepts to describe the local structural properties of materials at the atomic scale. Based only on atomic positions and without a…

Disordered Systems and Neural Networks · Physics 2022-04-20 Sébastien Becker , Emilie Devijver , Rémi Molinier , Noël Jakse

Recently, deep learning approaches for MR motion artifact correction have been extensively studied. Although these approaches have shown high performance and reduced computational complexity compared to classical methods, most of them…

Computer Vision and Pattern Recognition · Computer Science 2020-11-13 Gyutaek Oh , Jeong Eun Lee , Jong Chul Ye

Modern machine learning (ML) has grown into a tightly coupled, full-stack ecosystem that combines hardware, software, network, and applications. Many users rely on cloud providers for elastic, isolated, and cost-efficient resources.…

Performance · Computer Science 2025-11-03 Ziji Chen , Steven W. D. Chien , Peng Qian , Noa Zilberman

Machine-learning of atomic-scale properties amounts to extracting correlations between structure, composition and the quantity that one wants to predict. Representing the input structure in a way that best reflects such correlations makes…

Chemical Physics · Physics 2021-02-02 Michael J. Willatt , Félix Musil , Michele Ceriotti

Principal component analysis (PCA) is a commonly used pattern analysis method that maps high-dimensional data into a lower-dimensional space maximizing the data variance, that results in the promotion of separability of data. Inspired by…

Signal Processing · Electrical Eng. & Systems 2022-06-20 Xiaoqiang Hua , Yusuke Ono , Linyu Peng , Yuting Xu

We introduce the first comprehensive 3D dataset for the task of unsupervised anomaly detection and localization. It is inspired by real-world visual inspection scenarios in which a model has to detect various types of defects on…

Computer Vision and Pattern Recognition · Computer Science 2022-02-25 Paul Bergmann , Xin Jin , David Sattlegger , Carsten Steger

Quantitative image analysis often depends on accurate classification of pixels through a segmentation process. However, imaging artifacts such as the partial volume effect and sensor noise complicate the classification process. These…

Computer Vision and Pattern Recognition · Computer Science 2018-08-01 Brendan A. West , Taylor S. Hodgdon , Matthew D. Parno , Arnold J. Song
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