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The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…

Atomic force microscopy (AFM) is widely used to measure surface topography of solid, soft, and living matter at the nanoscale. Moreover, by mapping forces as a function of distance to the surface, AFM can provide a wealth of information…

We analyze an advanced two-spring model with an ultra-low effective tip mass to predict nontrivial and physically rich 'fine structure' in the atomic stick-slip motion in Friction Force Microscopy (FFM) experiments. We demonstrate that this…

Soft Condensed Matter · Physics 2009-11-13 D. Abel , S. Yu. Krylov , J. W. M. Frenken

Scanning probe microscopy is one of the most versatile windows into the nanoworld, providing imaging access to a variety of sample properties, depending on the probe employed. Tunneling probes map electronic properties of samples, magnetic…

Mesoscale and Nanoscale Physics · Physics 2015-01-09 Thomas Häberle , Dominik Schmid-Lorch , Friedemann Reinhard , Jörg Wrachtrup

We demonstrate a simple method to significantly improve the sharpness of standard silicon probes for an atomic force microscope, or to repair a damaged probe. The method is based on creating and maintaining a strong, spatially localized…

Mesoscale and Nanoscale Physics · Physics 2016-12-21 Alexei Temiryazev , Sergey I. Bozhko , A. Edward Robinson , Marina Temiryazeva

We demonstrate a combined magneto-optical trap and imaging system that is suitable for the investigation of cold atoms near surfaces. In particular, we are able to trap atoms close to optically scattering surfaces and to image them with an…

Atomic Physics · Physics 2011-01-04 Hamid Ohadi , Matthew Himsworth , André Xuereb , Tim Freegarde

This work presents a methodology to the morphology analysis and characterization of nanostructured material images acquired from FEG-SEM (Field Emission Gun-Scanning Electron Microscopy) technique. The metrics were extracted from the image…

Data Analysis, Statistics and Probability · Physics 2015-06-12 João B. Florindo , Mariana S. Sikora , Ernesto C. Pereira , Odemir M. Bruno

Interfaces play critical roles in materials, and are usually both structurally and compositionally complex microstructural features. The precise characterization of their nature in three-dimensions at the atomic-scale is one of the grand…

Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable and gentle imaging mode with widespread applications. Over the several decades that tapping mode has been in use,…

Mesoscale and Nanoscale Physics · Physics 2017-09-07 Marta Kocun , Aleksander Labuda , Waiman Meinhold , Irene Revenko , Roger Proksch

A recent advance in improving the spatial resolution of magnetic force microscopy (MFM) uses as sensor tips carbon nanotubes grown at the apex of conventional silicon cantilever pyramids and coated with a thin ferromagnetic layer. Magnetic…

Mesoscale and Nanoscale Physics · Physics 2009-11-13 John R. Kirtley , Zhifeng Deng , Lan Luan , Erhan Yenilmez , Hongjie Dai , Kathryn A. Moler

Hard point-contact spectroscopy and scanning probe microscopy/spectroscopy are powerful techniques for investigating materials with strong expandability. To support these studies, tips with various physical and chemical properties are…

Materials Science · Physics 2021-02-01 Jiawei Zhang , Pinyuan Wang , Xuao Zhang , Haoran Ji , Jiawei Luo , He Wang , Jian Wang

The optical transmission and reflection in between two metalized optical fiber tips is studied in the optical near-field and far-field domains. Besides aluminum-coated tips for near-field scanning optical microscopy (NSOM), specifically…

We introduce a new direction in the field of atom optics, atom interferometry, and neutral-atom quantum information processing. It is based on the use of microfabricated optical elements. With these elements versatile and integrated atom…

Quantum Physics · Physics 2009-11-06 G. Birkl , F. B. J. Buchkremer , R. Dumke , W. Ertmer

Atomic scale characterization and manipulation with scanning probe microscopy rely upon the use of an atomically sharp probe. Here we present automated methods based on machine learning to automatically detect and recondition the quality of…

Mesoscale and Nanoscale Physics · Physics 2018-03-26 Mohammad Rashidi , Robert A. Wolkow

We fabricate and characterize carbon-fiber tips for their use in combined scanning tunneling and force microscopy based on piezoelectric quartz tuning fork force sensors. An electrochemical fabrication procedure to etch the tips is used to…

Atomic force microscopy is based on tip sample interaction, which is determined by the properties of tip and sample. Unfortunately, in particular in ambient conditions the tip as well as the sample are contaminated, and it is not clear how…

Mesoscale and Nanoscale Physics · Physics 2017-12-19 J. Sánchez , L. Almonte , J. Colchero

The ability to confine light down to atomic scales is critical for the development of applications in optoelectronics and optical sensing as well as for the exploration of nanoscale quantum phenomena. Plasmons in metallic nanostructures can…

Nanoparticle surface structural dynamics is believed to play a significant role in regulating functionalities such as diffusion, reactivity, and catalysis but the atomic-level processes are not well understood. Atomic resolution…

The work of this thesis comprises extensive Noncontact Atomic Force Microscopy (NC-AFM) characterization of clean metal-oxide (YSZ(100)/(111) and MgO(100)) and graphitic (HOPG) supports as templates for the novel, photochemically induced…

Materials Science · Physics 2017-11-29 David J. Mandia

Scattering-type scanning near-field microscopy (s-SNOM) at terahertz (THz) frequencies could become a highly valuable tool for studying a variety of phenomena of both fundamental and applied interest, including mobile carrier excitations or…