English
Related papers

Related papers: Angular Resolution Enhancement of Electron Backsca…

200 papers

We introduce and discuss a new approach to the phase retrieval of fields radiated by continuous aperture sources having a circular support, which is of interest in many applications including the detection of shape deformations on reflector…

Systems and Control · Electrical Eng. & Systems 2022-10-26 R. Palmeri , G. M. Battaglia , A. F. Morabito , T. Isernia

In coherent X-ray diffraction microscopy the diffraction pattern generated by a sample illuminated with coherent x-rays is recorded, and a computer algorithm recovers the unmeasured phases to synthesize an image. By avoiding the use of a…

Blind super-resolution methods based on stable diffusion showcase formidable generative capabilities in reconstructing clear high-resolution images with intricate details from low-resolution inputs. However, their practical applicability is…

Computer Vision and Pattern Recognition · Computer Science 2024-12-30 Rui Xie , Chen Zhao , Kai Zhang , Zhenyu Zhang , Jun Zhou , Jian Yang , Ying Tai

In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably…

Recent advances in the field of attosecond science hold the promise of tracking electronic processes at the shortest space and time scales. Imaging methods that combine attosecond temporal with nanometer spatial resolution are currently out…

Electron-beam propagation experiments have been used to determine the energy and angle dependence of electron-electron (ee) scattering a two-dimensional electron gas (2DEG) in a very direct manner by a new spectroscopy method. The…

Mesoscale and Nanoscale Physics · Physics 2009-10-31 A. V. Yanovsky , H. Predel , H. Buhmann , R. N. Gurzhi , A. N. Kalinenko , A. I. Kopeliovich , L. W. Molenkamp

Printed Circuit Boards (PCBs) are critical components in modern electronics, which require stringent quality control to ensure proper functionality. However, the detection of defects in small-scale PCBs images poses significant challenges…

Computer Vision and Pattern Recognition · Computer Science 2025-06-17 Xiem HoangVan , Dang Bui Dinh , Thanh Nguyen Canh , Van-Truong Nguyen

Nowadays, modern electron microscopes deliver images at atomic scale. The precise atomic structure encodes information about material properties. Thus, an important ingredient in the image analysis is to locate the centers of the atoms…

Computer Vision and Pattern Recognition · Computer Science 2017-09-13 Benjamin Berkels , Benedikt Wirth

Despite recent strides made by AI in image processing, the issue of mixed exposure, pivotal in many real-world scenarios like surveillance and photography, remains inadequately addressed. Traditional image enhancement techniques and current…

Computer Vision and Pattern Recognition · Computer Science 2026-01-27 Eashan Adhikarla , Kai Zhang , Rosaura G. VidalMata , Manjushree Aithal , Nikhil Ambha Madhusudhana , John Nicholson , Lichao Sun , Brian D. Davison

Three-dimensional electron diffraction (3DED) is a powerful technique providing for crystal structure solutions of sub-micron sized crystals too small for structure determination via X-ray techniques. The entry requirement, however, of a…

High precision measurements of stellar spectroscopic line profiles and their changes over time contain very valuable information about the physics of the stellar photosphere (stellar activity) and can be used to characterize extrasolar…

Earth and Planetary Astrophysics · Physics 2017-11-08 John B. P. Strachan , Guillem Anglada-Escude

Scanning nanobeam electron diffraction (NBED) with fast pixelated detectors is a valuable technique for rapid, spatially resolved mapping of lattice structure over a wide range of length scales. However, intensity variations caused by…

In addition to the optical aberrations, the magnitude of the optical cells of detectors is one of the most important parameters, which restricts the resolution of detectors. Adaptive optic and the methods of reducing the aberrations are…

Optics · Physics 2007-05-23 S. Khademi , A. Darudi , M. Shahsavari

Scalar diffraction calculations such as the angular spectrum method (ASM) and Fresnel diffraction, are widely used in the research fields of optics, X-rays, electron beams, and ultrasonics. It is possible to accelerate the calculation using…

Light field cameras have a wide range of uses due to their ability to simultaneously record light intensity and direction. The angular resolution of light fields is important for downstream tasks such as depth estimation, yet is often…

Computer Vision and Pattern Recognition · Computer Science 2023-11-15 Langqing Shi , Ping Zhou

Analytical Dark Field Scanning Transmission Electron Microscopy (ADF-STEM) tomography reconstructs nanoscale materials in 3D by integrating multi-view tilt-series images, enabling precise analysis of their structural and compositional…

Computer Vision and Pattern Recognition · Computer Science 2026-04-07 Beiyuan Zhang , Hesong Li , Ruiwen Shao , Ying Fu

Resolving pseudosymmetry has long presented a challenge for electron backscatter diffraction (EBSD) and has been notoriously challenging in the case of tetragonal ZrO2 in particular. In this work, a method is proposed to resolve…

Materials Science · Physics 2020-03-11 Edward L. Pang , Peter M. Larsen , Christopher A. Schuh

Surface Patterson Functions have been derived by direct inversion of experimental Low-Energy Electron Diffraction I-V spectra measured at multiple incident angles. The direct inversion is computationally simple and can be used to…

Materials Science · Physics 2009-11-07 Celia Rogero , Jose-Angel Martin-Gago , Pedro L. de Andres

Spectroscopic photoemission microscopy is a well-established method to investigate the electronic structure of surfaces. In modern photoemission microscopes the electron optics allows imaging of the image plane, momentum plane, or…

In this study, proposes a method for improved object detection from the low-resolution images by integrating Enhanced Super-Resolution Generative Adversarial Networks (ESRGAN) and Faster Region-Convolutional Neural Network (Faster R-CNN).…

Computer Vision and Pattern Recognition · Computer Science 2025-06-16 Divya Swetha K , Ziaul Haque Choudhury , Hemanta Kumar Bhuyan , Biswajit Brahma , Nilayam Kumar Kamila