Related papers: Angular Resolution Enhancement of Electron Backsca…
We propose a unified diffusion model-based correction and super-resolution method to enhance the fidelity and resolution of diverse low-quality data through a two-step pipeline. First, the correction step employs a novel enhanced stochastic…
By placing a diffractive element in front of an image sensor, we are able to multiplex the spectral and angular information of a scene onto the image sensor. Reconstruction of the angular-spectral distribution is attained by first…
The low repetition rates and possible shot-to-shot variations in laser-plasma studies place a high value on single-shot diagnostics. For example, white-beam scattering methods based on broadband backlighter x-ray sources are used to…
Electron microscopy (EM) is a foundational tool for directly assessing the structure of materials. Recent advances in direct electron detectors have improved signal-to noise ratios via single-electron counting. However, accurately counting…
We present a new analysis method for atomic resolution four-dimensional scanning transmission electron microscopy (4D-STEM, in which a diffraction pattern is collected at each point of a raster scan of a focused electron beam across the…
We introduce the first learning-based dense matching algorithm, termed Equirectangular Projection-Oriented Dense Kernelized Feature Matching (EDM), specifically designed for omnidirectional images. Equirectangular projection (ERP) images,…
Current and next-generation particle tracking detectors will incorporate precision timing capabilities with resolutions approaching tens of picoseconds. Using Technology Computer-Aided Design (TCAD) simulations of Low-Gain Avalanche Diode…
Recently introduced speckle-correlations based techniques enable noninvasive imaging of objects hidden behind scattering layers. In these techniques the hidden object Fourier amplitude is retrieved from the scattered light autocorrelation,…
Aberration-corrected scanning transmission electron microscopes (STEM) provide sub-angstrom lateral resolution; however, the large convergence angle greatly reduces the depth of field. For microscopes with a small depth of field,…
Area detectors are used in many scientific and technological applications such as particle and radiation physics. Thanks to the recent technological developments, the radiation sources are becoming increasingly brighter and the detectors…
High-Resolution Electron Backscatter Diffraction (HR-EBSD) has advanced rapidly in recent years, significantly improving elastic strain measurements and dislocation density evaluation with submicron spatial resolution. To achieve better…
We report resolution enhancement in scanning electron microscopy (SEM) images using a generative adversarial network. We demonstrate the veracity of this deep learning-based super-resolution technique by inferring unresolved features in…
Three-dimensional electron diffraction (3D ED) has emerged as a powerful method for solving the structures of sub-micron-sized particles down to nanoparticles. However, it faces technical challenges when applied to beam-sensitive samples or…
In this paper, a systematic approach is employed to design a photonic crystal with a boundary between positive and negative refraction to boost the refractive properties of the crystal. Mathematical techniques are employed to turn the…
Detecting moving objects from ground-based videos is commonly achieved by using background subtraction techniques. Low-rank matrix decomposition inspires a set of state-of-the-art approaches for this task. It is integrated with structured…
Convergent beam electron diffraction is routinely applied for studying deformation and local strain in thick crystals by matching the crystal structure to the observed intensity distributions. Recently, it has been demonstrated that CBED…
Diffraction analysis in four dimensional scanning transmission electron microscopy now enables the mapping of local structures including symmetry, strain, and polarization of materials. However, measuring the distribution of these…
Recent years have witnessed the prosperity of reference-based image super-resolution (Ref-SR). By importing the high-resolution (HR) reference images into the single image super-resolution (SISR) approach, the ill-posed nature of this…
Refraction of an optical probe beam by a plasma can be measured with angular filter refractometry (AFR), which produces an image containing intensity contours that correspond to curves of constant refraction angle. Further analysis is…
Electron microscopy prevalently uses energy-dispersive x-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) for elemental analysis. EDS and EELS energy resolutions are commonly between 30-100 eV or 0.01-1 eV, respectively.…