Related papers: Cepstral Strain Mapping for Small Pixel-Count Dete…
Strain engineering in semiconductor transistor devices has become vital in the semiconductor industry due to the ever increasing need for performance enhancement at the nanoscale. Raman spectroscopy is a non-invasive measurement technique…
Some applications in scientific imaging, like space-based high-precision photometry, benefit from a detailed characterization of the sensitivity variation within a pixel. A detailed map of the intra-pixel sensitivity (IPS) allows to…
Synthetic apertures find applications in many fields, such as radar, radio telescopes, microscopy, sonar, ultrasound, LiDAR, and optical imaging. They approximate the signal of a single hypothetical wide aperture sensor with either an array…
Based on image encoding in a serial-temporal format, optical time-stretch imaging entails a stringent requirement of state-of-the- art fast data acquisition unit in order to preserve high image resolution at an ultrahigh frame rate ---…
Metal thin films on soft polymers provide a unique opportunity for resistance-based strain sensors. A mechanical mismatch between the conductive film and the flexible substrate causes cracks to open and close, changing the electrical…
This Paper introduces a new Non-Contact, Optical method for displacement measurements, and strain mapping as well as comparing it to traditional Digital Image correlation (DIC) and laser interferometry measurement method. This Method…
While Spectral Methods have long been used for Principal Component Analysis, this survey focusses on work over the last 15 years with three salient features: (i) Spectral methods are useful not only for numerical problems, but also discrete…
Visual inspection of solar modules is an important monitoring facility in photovoltaic power plants. Since a single measurement of fast CMOS sensors is limited in spatial resolution and often not sufficient to reliably detect small defects,…
Residual stress is an important factor governing evaluating and controlling the quality of metal materials in industrial products. X-ray measurements provide one of the most effective means of evaluating residual stress without destruction.…
Recently, sparsity-based algorithms are proposed for super-resolution spectrum estimation. However, to achieve adequately high resolution in real-world signal analysis, the dictionary atoms have to be close to each other in frequency,…
This report reviews current trends in the R&D of semiconductor pixellated sensors for vertex tracking and radiation imaging. It identifies requirements of future HEP experiments at colliders, needed technological breakthroughs and…
The use of fast pixelated detectors and direct electron detection technology is revolutionising many aspects of scanning transmission electron microscopy (STEM). The widespread adoption of these new technologies is impeded by the technical…
Good geometrical calibration is essential in the use of high resolution detectors. The individual sensors in the detector have to be calibrated with an accuracy better than the intrinsic resolution, which typically is of the order of 10 um.…
Complex field measurements are increasingly becoming the standard for state-of-the-art astronomical instrumentation. Complex field measurements have been used to characterize a suite of ground, airborne, and space-based heterodyne receiver…
Electron diffraction through a thin patterned silicon membrane can be used to create complex spatial modulations in electron distributions by varying the intensity of different reflections using parameters such as crystallographic…
The recently developed precession electron diffraction (PED) technique in scanning transmission electron microscopy (STEM) has been used to elucidate the local strain distribution and crystalline misorientation in CMOS fabricated strained…
Pixel tracking detectors at upcoming collider experiments will see unprecedented charged-particle densities. Real-time data reduction on the detector will enable higher granularity and faster readout, possibly enabling the use of the pixel…
Strain-engineering in SiGe nanostructures is fundamental for the design of optoelectronic devices at the nanoscale. Here we explore a new strategy, where SiGe structures are laterally confined by the Si substrate, to obtain high tensile…
Pixelated silicon detectors are state-of-the-art technology to achieve precise tracking and vertexing at collider experiments, designed to accurately measure the hit position of incoming particles in high rate and radiation environments.…
Filled arrays of bolometers are currently being employed for use in astronomy from the far-infrared through millimeter parts of the electromagnetic spectrum. Because of the large range of wavelengths for which such detectors are applicable,…