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Related papers: Fast 4D-STEM-based phase mapping for amorphous and…

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Accurate computational ptychographic phase reconstructions are enabled by fast direct-electron cameras with high dynamic ranges used for four-dimensional scanning transmission electron microscopy (4D-STEM). The availability of open software…

Materials Science · Physics 2025-05-01 Toma Susi

Precession of a converged beam during acquisition of a 4D-STEM dataset improves strain, orientation, and phase mapping accuracy by averaging over continuous angles of illumination. Precession experiments usually rely on integrated systems,…

Instrumentation and Detectors · Physics 2025-10-20 Stephanie M. Ribet , Rohan Dhall , Colin Ophus , Karen C. Bustillo

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM) is a powerful technique for high-resolution and high-precision materials characterization at multiple length scales, including the characterization of beam-sensitive…

Applied Physics · Physics 2023-08-11 Hsu-Chih Ni , Renliang Yuan , Jiong Zhang , Jian-Min Zuo

4D-STEM-based orientation and phase mapping has enabled rapid microstructure quantification that can be directly combined with standard TEM- and STEM-based imaging modes. Typically, orientation mapping is coupled with beam precession (i.e.…

Materials Science · Physics 2026-04-01 Yichen Yang , Olivier Pierron , Josh Kacher , David Rowenhorst

Understanding lattice deformations is crucial in determining the properties of nanomaterials, which can become more prominent in future applications ranging from energy harvesting to electronic devices. However, it remains challenging to…

We analyze the quantum limit of sensitivity in four-dimensional scanning transmission electron microscopy (4D-STEM), which has emerged as a favored technique for imaging the structure of a wide variety of materials, including biological and…

Optics · Physics 2024-08-14 Christian Dwyer , David M. Paganin

Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a…

Layered materials (LMs) are at the centre of an ever increasing research effort due to their potential use in a variety of applications. The presence of imperfections, such as bi- or multilayer areas, holes, grain boundaries, isotropic and…

While electron microscopy offers crucial atomic-resolution insights into structure-property relationships, radiation damage severely limits its use on beam-sensitive materials like proteins and 2D materials. To overcome this challenge, we…

Computer Vision and Pattern Recognition · Computer Science 2025-07-18 Zifei Wang , Zian Mao , Xiaoya He , Xi Huang , Haoran Zhang , Chun Cheng , Shufen Chu , Tingzheng Hou , Xiaoqin Zeng , Yujun Xie

Understanding the relationship between atomic structure (order) and chemical composition (chemistry) is critical for advancing materials science, yet traditional spectroscopic techniques can be slow and damaging to sensitive samples.…

Materials Science · Physics 2025-08-29 Mridul Kumar , Yevgeny Rakita

Non-Negative Matrix Factorization (NMF) is an unsupervised learning method offering low-rank representations across various domains such as audio processing, biomedical signal analysis, and image recognition. The incorporation of…

Machine Learning · Computer Science 2025-10-09 Yasaman Torabi , Shahram Shirani , James P. Reilly

Analyzing large X-ray diffraction (XRD) datasets is a key step in high-throughput mapping of the compositional phase diagrams of combinatorial materials libraries. Optimizing and automating this task can help accelerate the process of…

Four-dimensional scanning transmission electron microscopy (4D-STEM) provides rich, atomic-scale insights into materials structures. However, extracting specific physical properties - such as polarization directions essential for…

The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…

Applied Physics · Physics 2025-02-18 Nikita Denisov , Andrey Orekhov , Johan Verbeeck

Non-negative Matrix Factorization (NMF) methods offer an appealing unsupervised learning method for real-time analysis of streaming spectral data in time-sensitive data collection, such as $\textit{in situ}$ characterization of materials.…

Applied Physics · Physics 2024-06-12 Phillip M. Maffettone , Aidan C. Daly , Daniel Olds

Energy dispersive X-ray (EDX) spectroscopy in the transmission electron microscope is a key tool for nanomaterials analysis, providing a direct link between spatial and chemical information. However, using it for precisely determining…

Materials Science · Physics 2024-05-24 Hui Chen , Duncan T. L. Alexander , Cécile Hébert

Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure-property relationships. 4D-STEM, a technique where diffraction…

Materials Science · Physics 2023-05-03 Stephanie M. Ribet , Colin Ophus , Roberto dos Reis , Vinayak P. Dravid

The physical properties of polycrystalline materials depend on their microstructure, which is the nano-to-centimeter-scale arrangement of phases and defects in their interior. Such microstructure depends on the shape, crystallographic phase…

We apply the vectorized Non-negative Matrix Factorization (NMF) method to post-processing of direct imaging data for exoplanetary systems such as circumstellar disks. NMF is an iterative approach, which first creates a non-orthogonal and…

Instrumentation and Methods for Astrophysics · Physics 2018-03-20 Bīn Rén , Laurent Pueyo , Guangtun Ben Zhu , John Debes , Gaspard Duchêne

In this paper, we develop structure assisted nonnegative matrix factorization (NMF) methods for blind source separation of degenerate data. The motivation originates from nuclear magnetic resonance (NMR) spectroscopy, where a multiple…

Numerical Analysis · Mathematics 2021-03-10 Yuanchang Sun , Kai Huang , Jack Xin