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Electronic devices are engineered at increasingly smaller length scales; new metrologies to understand nanoscale thermodynamics are needed. Temperature and pressure are fundamental thermodynamic quantities whose nanoscale measurement is…

Mesoscale and Nanoscale Physics · Physics 2025-10-24 Yueyun Chen , Xin Yi Ling , Jared Lodico , Tristan P. O`Neill , B. C. Regan , Matthew Mecklenburg

The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…

Applied Physics · Physics 2025-02-18 Nikita Denisov , Andrey Orekhov , Johan Verbeeck

Thermal transport in nanostructures plays a critical role in modern technologies. As devices shrink, techniques that can measure thermal properties at nanometer and nanosecond scales are increasingly needed to capture transient,…

Accurate, non-contact temperature measurement with high spatial resolution is essential for understanding thermal behavior in integrated nanoscale devices and heterogeneous interfaces. However, existing techniques are often limited by the…

Materials Science · Physics 2026-03-13 Kun Yang , Chao Zhang , Chengwei Wu , Qian Du , Bingzhi Li , Zhen Fang , Liang Li , Jianbo Wu , Tianru Wu , Hui Wang , Tao Deng , Wenpei Gao

Understanding microstructural evolution under extreme thermal conditions is essential for advancing metal additive manufacturing (AM). This work demonstrates the feasibility of employing micro-electro-mechanical system (MEMS) heating…

Materials Science · Physics 2026-01-12 C. Koenig , P. Mayr , J. R. Jinschek , A. Bastos Fanta

The reliable measurement and accurate control of the temperature within nanophotonic devices is a key prerequisite for their application in both classical and quantum technologies. Established approaches use sensors that are attached in…

Quantum Physics · Physics 2025-02-19 Kilian Sandholzer , Stephan Rinner , Justus Edelmann , Andreas Reiserer

A monolithic active pixel sensor based direct detector that is optimized for the primary beam energies in scanning electron microscopes is implemented for electron back-scattered diffraction (EBSD) applications. The high detection…

To engineer the next generation of advanced materials we must understand their microstructure, and this requires microstructural characterization. This can be achieved through the collection of high contrast, data rich, and insightful…

Materials Science · Physics 2024-01-09 Tianbi Zhang , T. Ben Britton

Understanding heat transport at the nanometer scale is critical for semiconductor devices, quantum materials, and thermal management of nanostructures, yet direct local measurements of thermal conductivity and heat capacity remain scarce.…

Thermal properties have an outsized impact on efficiency and sensitivity of devices with nanoscale structures, such as in integrated electronic circuits. A number of thermal conductivity measurements for semiconductor nanostructures exist,…

The next generation of ultra-low-noise cryogenic detectors for space science applications require continued exploration of materials characteristics at low temperatures. The low noise and good energy sensitivity of current Transition Edge…

Mesoscale and Nanoscale Physics · Physics 2011-02-01 D. J. Goldie , D. M. Glowacka , K. Rostem† , S. Withington

Electron Backscatter Diffraction (EBSD) is a technique to obtain microcrystallographic information from materials by collecting large-angle Kikuchi patterns in the scanning electron microscope (SEM). An important fundamental question…

Materials Science · Physics 2019-03-06 Aimo Winkelmann , T. Ben Britton , Gert Nolze

Energy dissipation is a fundamental process governing the dynamics of physical, chemical, and biological systems. It is also one of the main characteristics distinguishing quantum and classical phenomena. In condensed matter physics, in…

Scanning Electron Microscopy (SEM) experiments provide detailed insights into material microstructures, enabling high-resolution imaging as well as crystallographic analysis through advanced techniques like Electron Backscatter Diffraction…

Materials Science · Physics 2024-12-05 Christina Koenig , Alice Bastos da Silva Fanta , Joerg R. Jinschek

Diffraction pattern analysis can be used to reveal the crystalline structure of materials, and this information is used to nano- and micro-structure of advanced engineering materials that enable modern life. For nano-structured materials…

Materials Science · Physics 2023-12-13 Tianbi Zhang , T. Ben Britton

Temperature sensors with micro- and nanoscale spatial resolution have long been explored for their potential to investigate the details of physical systems at an unprecedented scale. In particular, the rapid miniaturization of transistor…

We present a methodology for in situ Transmission Kikuchi Diffraction (TKD) tensile testing that enables nanoscale characterization of the evolution of complex plasticity mechanisms. By integrating a modified in situ scanning electron…

Materials Science · Physics 2025-02-18 Tijmen Vermeij , Amit Sharma , Douglas Steinbach , Jun Lou , Johann Michler , Xavier Maeder

Nanoscale thermometry is paramount to study primary processes of heat transfer in solids and is a subject of hot debate in cell biology. Here we report ultrafast temperature sensing using all-optical thermometry exploiting synthetic…

Applied Physics · Physics 2019-04-24 Sumin Choi , Viatcheslav N. Agafonov , Valery A. Davydov , Taras Plakhotnik

The action of a nanoscopic spherically symmetric refractive index profile on a focused Gaussian beam may easily be envisaged as the action of a phase-modifying element, i.e. a lens: Rays traversing the inhomogeneous refractive index field…

Optics · Physics 2011-09-14 Selmke Markus , Braun Marco , Cichos Frank

This work builds on the previous introduction [1] of a coupled experimental-computational system devised to fully characterize the thermal behavior of complex 3D submicron electronic devices. The new system replaces the laser-based surface…

Materials Science · Physics 2007-09-13 Peter E. Raad , Pavel L. Komarov , M. Burzo
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