Related papers: On the influence of reference sample properties on…
In this work we present a novel, compact, power efficient magnetic field source design for magnetic field imaging microscopy. The device is based on a pair of diametrically magnetized permanent magnet cylinders with electro-mechanical…
The contrast transfer function (CTF) is widely used to evaluate phase retrieval methods in scanning transmission electron microscopy (STEM), including center-of-mass imaging, parallax imaging, direct ptychography, and iterative…
In applied forms of time-of-flight mass spectrometry utilizing ion storage devices prior to an analysis device, a non instantaneous electric ejection pulse applied in the region of ion storage is used to accelerate ions into the…
This paper introduces a novel framework for image quality transfer based on conditional flow matching (CFM). Unlike conventional generative models that rely on iterative sampling or adversarial objectives, CFM learns a continuous flow…
Image restoration of biological structures in microscopy poses unique challenges for preserving fine textures and sharp edges. While recent GAN-based image restoration formulations have introduced frequency-domain losses for natural images,…
The Gaussian function (GF) is widely used to explain the behavior or statistical distribution of many natural phenomena as well as industrial processes in different disciplines of engineering and applied science. For example, the GF can be…
The inspection of local flaws (LFs) in Steel Wire Ropes (SWRs) is crucial for ensuring safety and reliability in various industries. Magnetic Flux Leakage (MFL) imaging is commonly used for non-destructive testing, but its effectiveness is…
Scattering-type scanning near-field microscopy (s-SNOM) at terahertz (THz) frequencies could become a highly valuable tool for studying a variety of phenomena of both fundamental and applied interest, including mobile carrier excitations or…
We present an alternative switching-magnetization magnetic force microscopy (SM- MFM) method using planar tip-on-chip probes. Unlike traditional needle-like tips, the planar probe approach integrates a microdevice near the tip apex with…
While the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is mainly due to the…
This paper addresses the problems of blind channel identification and multichannel equalization for speech dereverberation and noise reduction. The time-domain cross-relation method is not suitable for blind room impulse response…
The normal field instability in magnetic liquids is investigated experimentally by means of a radioscopic technique which allows a precise measurement of the surface topography. The dependence of the topography on the magnetic field is…
The precise derivation of physical quantities like temperature or pressure at arbitrary locations is useful in numerous contexts, e.g. medical procedures or industrial process engineering. The novel sensor technology of magneto-mechanical…
How does the training data affect a model's behavior? This is the question we seek to answer with data attribution. The leading practical approaches to data attribution are based on influence functions (IF). IFs utilize a first-order Taylor…
We introduce a novel three-dimensional (3D) traction force microscopy (TFM) method motivated by the recent discovery that cells adhering on plane surfaces exert both in-plane and out-of-plane traction stresses. We measure the 3D deformation…
We investigate the ellipticity of the point-spread function (PSF) produced by imaging an unresolved source with a telescope, subject to the effects of atmospheric turbulence. It is important to quantify these effects in order to understand…
We employ an optical fiber doped with randomly oriented fluorescent sub-micron diamonds and the novel zero-field resonance protocol to collect information on the localization and orientation of a magnetic-field source and its distribution.…
Thermal fluctuation of the cantilever position sets a fundamental limit for the precision of any Scanning Force Microscope. In the present work we analyse how these fluctuations limit the determination of the resonance frequency of the…
Using electrostatic coupling between an AFM tip and a metallic surface as a test interaction, we here present the measurement of the force between the tip and the surface, together with the measurement of the interaction stiffness and the…
The topography and the electrical properties are two crucial characteristics in determining roles and functionalities of materials. Conductive atomic force microscopy (CAFM) is widely recognized for its ability to independently measure the…