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During the last few years, serial electron crystallography (Serial Electron Diffraction, SerialED) has been gaining attention for the structure determination of crystalline compounds that are sensitive to the irradiation of the electron…

Materials Science · Physics 2025-07-29 Sergi Plana-Ruiz , Penghan Lu , Govind Ummethala , Rafal Dunin-Borkowski

This comprehensive review discusses the development of scanning electron microscopy and the application of this technology in different fields such as biology, nanobiotechnology and biomedical science. Besides being a tool for high…

Quantitative Methods · Quantitative Biology 2023-11-02 Aniruddha Acharya

Electron microscopy has enabled many scientific breakthroughs across multiple fields. A key challenge is the tuning of microscope parameters based on images to overcome optical aberrations that deteriorate image quality. This calibration…

Computer Vision and Pattern Recognition · Computer Science 2026-03-20 Jilles S. van Hulst , W. P. M. H. Heemels , Duarte J. Antunes

Characterizing crystal structures and interfaces down to the atomic level is an important step for designing advanced materials. Modern electron microscopy routinely achieves atomic resolution and is capable to resolve complex arrangements…

Materials Science · Physics 2023-09-07 Andreas Leitherer , Byung Chul Yeo , Christian H. Liebscher , Luca M. Ghiringhelli

Space charge layers (SCLs) at grain boundaries play a crucial role in modulating local electric fields and influencing the functional properties of materials, such as oxygen vacancy migration and ionic conductivity in oxide ceramics.…

In the technique of Electron Backscatter Diffraction (EBSD), the accurate detection and identification of different phases existing in a sample is often limited by overlapping Kikuchi diffraction patterns originating from the extended…

Materials Science · Physics 2026-01-23 Grzegorz Cios , Aimo Winkelmann , Tomasz Tokarski , Wiktor Bednarczyk , Piotr Bała

Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns.…

Materials Science · Physics 2024-06-04 Jiake Wei , Zhangze Xu , Wenjie Shen , Bin Feng , Ryo Ishikawa , Naoya Shibata , Yuichi Ikuhara , Xuedong Bai

Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration corrector to produce a sub-{\AA}ngstr\"om probe is a complex…

Scanning nanobeam electron diffraction (NBED) with fast pixelated detectors is a valuable technique for rapid, spatially resolved mapping of lattice structure over a wide range of length scales. However, intensity variations caused by…

Ultrasound standard plane recognition is essential for clinical tasks such as disease screening, organ evaluation, and biometric measurement. However, existing methods fail to effectively exploit shallow structural information and struggle…

Computer Vision and Pattern Recognition · Computer Science 2025-11-18 Qing Cai , Guihao Yan , Fan Zhang , Cheng Zhang , Zhi Liu

Microstructure characterisation has been greatly enhanced through the use of electron backscatter diffraction (EBSD), where rich maps are generated through analysis of the crystal phase and orientation in the scanning electron microscope…

Materials Science · Physics 2018-11-15 Vivian S Tong , Alexander J Knowles , David Dye , T Ben Britton

Existing Electric Field Conjugation (EFC) methods are not suited for treating small polarization effects, referred to here as cross polarization. EFC utilizes a deformable mirror (DM) to nullify the electric fields from the host star within…

Instrumentation and Methods for Astrophysics · Physics 2024-10-11 Richard A. Frazin

We introduce a phase imaging mechanism for scanning transmission electron microscopy that exploits the complementary intensity changes of transmitted disks at different scattering angles. For scanning transmission electron microscopy, this…

Instrumentation and Detectors · Physics 2023-07-06 Binbin Wang , David W. McComb

A new method for dark field imaging is introduced which uses scanned electron diffraction (or 4DSTEM - 4-dimensional scanning transmission electron microscopy) datasets as its input. Instead of working on simple summation of intensity, it…

Materials Science · Physics 2024-09-18 Ian MacLaren , Andrew T. Fraser , Matthew R. Lipsett , Colin Ophus

The Controlled Source Electromagnetic (CSEM) method aims to image electrical resistivity at intermediate depths (0-3 km) for geothermal, mineral, and groundwater exploration. It was developed both as a deeper extension of DC resistivity…

Geophysics · Physics 2026-05-28 F Bretaudeau , S Védrine , C Patzer , B Kim , F Dubois , U Autio , J Kamm , M Darnet

Side Channel Analysis (SCA) relaxes the black-box assumption of conventional cryptanalysis by incorporating physical measurements acquired during cryptographic operations. Electro-magnetic (EM) emissions of a chip during computations often…

Cryptography and Security · Computer Science 2026-04-28 Elie Bursztein , Michael Gruber , Karel Král , Jean-Michel Picod , Matthias Probst , Georg Sigl

Electrical capacitance tomography (ECT) is a nonoptical imaging technique in which a map of the interior permittivity of a volume is estimated by making capacitance measurements at its boundary and solving an inverse problem. While previous…

Computer Vision and Pattern Recognition · Computer Science 2023-12-05 Manar Abdelatty , Joseph Incandela , Kangping Hu , Joseph W. Larkin , Sherief Reda , Jacob K. Rosenstein

The utilization of deep learning on electrocardiogram (ECG) analysis has brought the advanced accuracy and efficiency of cardiac healthcare diagnostics. By leveraging the capabilities of deep learning in semantic understanding, especially…

Signal Processing · Electrical Eng. & Systems 2024-10-25 Han Yu , Peikun Guo , Akane Sano

A growing need exists for efficient and accurate methods for detecting defects in semiconductor materials and devices. These defects can have a detrimental impact on the efficiency of the manufacturing process, because they cause critical…

Computer Vision and Pattern Recognition · Computer Science 2023-08-21 Thibault Lechien , Enrique Dehaerne , Bappaditya Dey , Victor Blanco , Sandip Halder , Stefan De Gendt , Wannes Meert

Contrast transfer mechanisms for electron scattering have been extensively studied in transmission electron microscopy. Here we revisit H. Rose's generalized contrast formalism from scattering theory to understand where information is…

Optics · Physics 2025-10-28 Desheng Ma , Guanxing Li , David A Muller , Steven E Zeltmann
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