Related papers: Grazing incidence X-ray scattering alignment using…
Grazing incidence x-ray scattering provides nanostructural information for thin film samples, but single images generally do not provide information on film thickness or the full complex index of refraction. Additionally, for thin films…
We present a computational imaging technique for imaging thin films at grazing-incidence (GI) angles by incorporating structured illumination into existing GI X-ray scattering setups. This method involves scanning a micro-coded aperture…
When an X-ray area detector based on a single crystalline material, for instance, a state of the art hybrid pixel detector, is illuminated from a point source by monochromatic radiation, a pattern of lines appears which overlays the…
GISAXS is often used as a versatile tool for the contactless and destruction-free investigation of nanostructured surfaces. However, due to the shallow incidence angles, the footprint of the X-ray beam is significantly elongated, limiting…
Grazing-Incidence X-ray fluorescence (GIXRF) analysis, which is closely related to total-reflection XRF, is a very powerful technique for the in-depth analysis of many types of technologically relevant samples, e.g. nanoparticle…
Grazing Incidence X-ray Diffraction (GIXD) is a surface sensitive X-ray investigation technique (or geometry configuration) that can reveal the structural properties of a film deposited on a flat substrate. The term grazing indicates that…
Grazing incidence interferometry has been applied to rough planar and cylindrical surfaces. As suitable beam splitters diffractive optical phase elements are quite common because these allow for the same test sensitivity for all surface…
Resonant inelastic x-ray scattering (RIXS) is an extremely valuable tool for the study of elementary, including magnetic, excitations in matter. Latest developments of this technique mostly aimed at improving the energy resolution and…
For the reliable fabrication of the current and next generation of nanostructures it is essential to be able to determine their material composition and dimensional parameters. Using the grazing incidence X-ray fluoresence technique, which…
The increasing importance of well-controlled ordered nanostructures on surfaces represents a challenge for existing metrology techniques. To develop such nanostructures and monitor complex processing constraints fabrication, both a…
We demonstrate a technique that allows highly surface sensitive imaging of nanostructures on planar surfaces over large areas, providing a new avenue for research in materials science, especially for \textit{in situ} applications. The…
We present general algorithms to convert scattering data of linear and area detectors recorded in various scattering geometries to reciprocal space coordinates. The presented algorithms work for any goniometer configuration including…
We study active array imaging of small but strong scatterers in homogeneous media when multiple scattering between them is important. We use the Foldy-Lax equations to model wave propagation with multiple scattering when the scatterers are…
This paper presents a new method to model X-ray scattering on random rough surfaces. It combines the approaches we presented in two previous papers -- \zs\cite{zhao03} \& \pz\cite{zhao15}. An actual rough surface is (incompletely) described…
A new experimental equipment allowing to study the sputtering induced by ion beam irradiation is presented. The sputtered particles are collected on a catcher which is analyzed in situ by Auger electron spectroscopy without breaking the…
X-ray reflectometry (XRR) provides researchers and manufacturers with a non-destructive way to determine thickness, roughness, and density of thin films deposited on smooth substrates. Due to the nested nature of equations modeling this…
Grazing incidence mirrors for X-ray astronomy are usually designed in the parabola-hyperbola (Wolter I) configuration. This design allows for optimal images on-axis, which however degrade rapidly with the off-axis angle. Mirror surfaces…
We propose a test of conformal invariance in critical phenomena based on the study of a two-point correlation function in the presence of a boundary. This two-point function can be studied using X-ray or neutron scattering in the conditions…
Treating protons as de Broglie waves shows that up to a few MeV energies protons experience total external reflection using the index of refraction concept for the target earlier applied to electrons. Angular scattering distributions can be…
To enhance the reflectivity of X-ray mirrors beyond the critical angle, multilayer coatings are required. Interface imperfections in the multilayer growth process are known to cause non-specular scattering and degrade the mirror optical…