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A versatile X-ray/neutron reflectivity (specular) simulator using LabVIEW(National Instruments Corp.) for structural study of a multi-layer thin film having any combination, including the repetitions, of nano-scale layers of different…

Mesoscale and Nanoscale Physics · Physics 2013-09-27 Sirshendu Gayen

Recent developments in thin-film fabrication and processing open up interesting possibilities for both established and emerging optics technologies. There, one of the key questions requiring more complete understanding is by how much one…

Optics · Physics 2025-01-03 Pyry Kivisaari , Mikko Partanen , Jani Oksanen

Free surfaces of liquids exhibit thermally excited (capillary) surface waves. We show that the surface roughness which results from capillary waves when a glassy material is cooled below the glass transition temperature can have a large…

Soft Condensed Matter · Physics 2008-05-30 B. N. J. Persson

We show that to account for the full spectrum of surface fluctuations from low scattering vector qd << 1 (classical capillary wave theory) to high qd > 1 (bulk-like fluctuations), one must take account of the interface's bending rigidity at…

Soft Condensed Matter · Physics 2009-11-13 Edgar M. Blokhuis

To take advantage of high-resolution optics sensitive to a broad energy range, future X-ray imaging instruments will require thick detectors with small pixels. This pixel aspect ratio affects spectral response in the soft X-ray band, vital…

Atomically controlled crystal growth of thin films has established foundations of nanotechnology aimed at the development of advanced functional devices. Crystallization under non-equilibrium conditions allows engineering of new materials…

We review here the physics of capillary condensation of liquids in confined media, with a special regard to the application in nanotechnologies. The thermodynamics of capillary condensation and thin film adsorption are first exposed along…

Fluid Dynamics · Physics 2009-10-27 Elisabeth Charlaix , Matteo Ciccotti

The theoretical formulation of x-ray resonant magnetic scattering from rough surfaces and interfaces is given for specular reflectivity. A general expression is derived for both structurally and magnetically rough interfaces in the…

Materials Science · Physics 2009-11-10 D. R. Lee , D. Haskel , Y. Choi , J. C. Lang , S. A. Stepanov , G. Srajer , S. K. Sinha

We propose a methodology to measure the mechanical properties of membranes from their fluctuations and apply this to optical microscopy measurements of giant unilamellar vesicles of lipids. We analyze the effect of the projection of thermal…

Soft Condensed Matter · Physics 2017-11-17 S. Alex Rautu , Davide Orsi , Lorenzo Di Michele , George Rowlands , Pietro Cicuta , Matthew S. Turner

Paints and coatings often feature interfacial defects due to disturbances during the deposition process which, if they persist until solidification, worsen the product quality. In this article, we investigate the stability of a thin liquid…

Fluid Dynamics · Physics 2023-07-26 David Barreiro-Villaverde , Anne Gosset , Marcos Lema , Miguel Alfonso Mendez

Potential applications in spintronics and quantum computing have motivated much recent research in epitaxial films of bismuth telluride. This system is also an example of van der Waals (vdW) epitaxy where the interface coherence between…

We analyze a non-isothermal Darcy-Brinkman thin-film flow with a periodically oscillating boundary and viscous dissipation acting as a heat source. Using asymptotic analysis and the periodic unfolding method, we establish the convergence of…

Analysis of PDEs · Mathematics 2026-04-08 María Anguiano , Igor Pažanin , Francisco J. Suárez-Grau

X-ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films. In this study, we show how a simple artificial neural network model can be used to predict the…

We study the effects of chiral constituent molecules on the macroscopic shapes attained by lipid bilayer membranes. Such fluid membranes are beautiful examples of statistical ensembles of random shapes, sometimes coupled to in-plane order.…

Condensed Matter · Physics 2008-02-03 P. Nelson , T. Powers

We present x-ray reflectivity and diffuse scattering measurements from the liquid surface of pure potassium. They strongly suggest the existence of atomic layering at the free surface of a pure liquid metal with low surface tension. Prior…

Statistical Mechanics · Physics 2007-05-23 Oleg Shpyrko , Patrick Huber , Peter S. Pershan , Holger Tostmann , Alexei Grigoriev , Ben Ocko , Moshe Deutsch

Thermal motions of molecules can generate nanowaves on the free surface of a liquid film. As nanofilms are susceptible to the contamination of surfactants, this work investigates the effects of surfactants on dynamics of nanowaves on a…

Fluid Dynamics · Physics 2023-06-21 Yixin Zhang , Zijing Ding

This paper presents the analysis and characterization of the surface scattering process for both specular and diffused components. The study is focused on the investigation of various building materials each having a different roughness, at…

Signal Processing · Electrical Eng. & Systems 2017-10-17 Angelos A. Goulianos , Alberto L. Freire , Tom Barratt , Evangelos Mellios , Peter Cain , Moray Rumney , Andrew Nix , Mark Beach

We examine the dynamics of a thin film formed by a distributed liquid source on a vertical solid wall. The model is derived using the lubrication approximation and includes the effects of gravity, upward airflow and surface tension. When…

Fluid Dynamics · Physics 2020-07-01 Yadong Ruan , Ali Nadim , Marina Chugunova

The theory of specular X-ray reflectivity from a rough interface based upon the reflection function method (RFM) is proposed. The RFM transforms the second order differential equation for the wave amplitude into the non-linear first order…

Materials Science · Physics 2007-05-23 N. V. Bagrets , E. A. Kravtsov , V. V. Ustinov

Grazing incidence x-ray scattering provides nanostructural information for thin film samples, but single images generally do not provide information on film thickness or the full complex index of refraction. Additionally, for thin films…

Applied Physics · Physics 2020-11-10 Peter J. Dudenas , Adam Z. Weber , Ahmet Kusoglu