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Electrochemical strains are a ubiquitous feature of solid state ionic devices ranging from ion batteries and fuel cells to electroresistive and memristive memories. Recently, we proposed a scanning probe microscopy (SPM) based approach,…

Materials Science · Physics 2015-06-03 A. N. Morozovska , E. A. Eliseev , S. V. Kalinin

Piezoresponse force microscopy (PFM) is a powerful tool widely used to characterize piezoelectricity and ferroelectricity at the nanoscale. However, it is necessary to distinguish microscopic mechanisms between piezoelectricity and…

Materials Science · Physics 2018-04-26 Junxi Yu , Ehsan Nasr Esfahani , Qingfeng Zhu , Dongliang Shan , Tingting Jia , Shuhong Xie , Jiangyu Li

Scanning probe microscopy (SPM) images of regularly arranged spatially periodic objects can be processed crystallographically. The resulting information may be used to remove from the SPM image distortions that are due to a less than…

Materials Science · Physics 2020-12-16 Peter Moeck

We demonstrate a cryogenic scanned probe microscope (SPM) that has been modified to be controlled with a haptic device, such that the operator can `feel' the surface of a sample under investigation. This system allows for direct tactile…

Instrumentation and Detectors · Physics 2022-08-29 Maxwell Freeman , Rhett Applestone , Wyatt Behn , Victor Brar

Surface plasmon polaritons (SPPs) are optical waves that propagate along a metal surface. They exhibit properties such as sub-wavelength localization and field enhancement which make them attractive for surface sensing, as commonly…

Optics · Physics 2023-01-25 Zohreh Hirbodvash , Pierre Berini

Devices made from two-dimensional (2D) materials such as graphene or transition metal dichalcogenides possess interesting electronic properties that can become accessible to experimental probes when the samples are protected from…

Mesoscale and Nanoscale Physics · Physics 2019-07-16 Michael A. Altvater , Tianhui Zhu , Guohong Li , Kenji Watanabe , Takashi Taniguchi , Eva Y. Andrei

An in-depth understanding of the electronic properties of grain boundaries (GB) in polycrystalline semiconductor absorbers is of high importance since their charge carrier recombination rates may be very high and hence limit the solar cell…

We study the potential and the charge distribution across the interface of a plasma and a dielectric wall. For this purpose, the charge bound to the wall is modelled as a quasi-stationary electron surface layer which satisfies Poisson's…

Plasma Physics · Physics 2015-05-30 Rafael L. Heinisch , Franz X. Bronold , Holger Fehske

Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the number of secondary electrons from a material of interest, and…

A method for the separation and quantitative characterization of the electrostatic and Van der Waals contribution to tip-sample interaction in non-contact Scanning Force Microscopy is presented. It is based on the simultaneous measurement…

Materials Science · Physics 2007-11-06 Elisa Palacios-Lidon , Jaime Colchero

A novel scanning probe technique is presented: Scanning microSQUID Force microscopy (SSFM). The instrument features independent topographic and magnetic imaging. The SSFM operates in a dilution refrigerator in cryogenic vacuum. Sample and…

Superconductivity · Physics 2007-05-23 C. Veauvy , D. Mailly , K. Hasselbach

We have studied the electrically induced off-plane surface displacement on two microelectronic devices using Scanning Joule Expansion Microscopy (SJEM). We present the experimental method and surface displacement results. We show that they…

General Physics · Physics 2008-01-08 S. Grauby , L. -D. Patino Lopez , A. Salhi , E. Puyoo , J. -M. Rampnoux , W. Claeys , S. Dilhaire

We investigate the electric double layer formed between charged walls of a slit-like pore and a solvent primitive model (SPM) for electrolyte solution. The recently developed version of the weighted density functional approach for…

Soft Condensed Matter · Physics 2014-07-14 O. Pizio , S. Sokołowski

We present a general theory for the contribution from contact electrification to the work necessary to separate two solid bodies. The theory depends on the surface charge density correlation function, which we deduce from Kelvin Force…

Soft Condensed Matter · Physics 2015-06-15 B. N. J. Persson , M. Scaraggi , A. I. Volokitin

We report the results of a cryogenic study of the modification of YBa2Cu3O7-delta surface electronic properties with the probe of a scanning tunneling microscope (STM). A negative voltage applied to the sample during STM tunneling is found…

Superconductivity · Physics 2009-11-10 S. Urazhdin , W. K. Neils , S. H. Tessmer , Norman O. Birge , D. J. Van Harlingen

We develop a semi-analytical method for analyzing surface plasmon interferometry using near-field scanning optical sources. We compare our approach to Young double hole interferometry experiments using scanning tunneling microscope (STM)…

Optics · Physics 2015-06-18 O. Mollet , G. Bachelier , C. Genet , S. Huant , A. Drezet

An algorithm is introduced for using electrical surface measurements to detect and monitor cracks inside a two-dimensional conductive body. The technique is based on transforming the probing functions of the classical enclosure method by…

Analysis of PDEs · Mathematics 2019-01-30 Andreas Hauptmann , Masaru Ikehata , Hiromichi Itou , Samuli Siltanen

The development of electron spin resonance (ESR) combined with scanning tunneling spectroscopy (STM) is undoubtedly one of the main experimental breakthroughs in surface science of the last decade thanks to joining the extraordinarily high…

Strongly Correlated Electrons · Physics 2022-08-31 Fernando Delgado , Nicolás Lorente

We investigated the possibility of using a layer of quantum dots (QDs) deposited on the microparticle surface for the measurement of the charge the microparticle acquires when immersed into a plasma. To that end, we performed the…

Plasma Physics · Physics 2021-12-08 Mikhail Pustylnik , Zahra Marvi , Job Beckers

The distance dependence and atomic-scale contrast observed in nominal contact potential difference (CPD) signals recorded by KPFM on surfaces of insulating and semiconducting samples, have stimulated theoretical attempts to explain such…