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Many modern products are highly reliable, often exhibiting long lifetimes. As a result, conducting experiments under normal operating conditions can be prohibitively time-consuming to collect sufficient failure data for robust statistical…

Methodology · Statistics 2026-03-31 María Jaenada , Juan Millán , Leandro Pardo

Accelerated life-tests (ALTs) are used for inferring lifetime characteristics of highly reliable products. In particular, step-stress ALTs increase the stress level at which units under test are subject at certain pre-fixed times, thus…

Statistics Theory · Mathematics 2024-02-12 Narayanaswamy Balakrishnan , Maria Jaenada , Leandro Pardo

Accelerated life tests (ALTs) play a crucial role in reliability analyses, providing lifetime estimates of highly reliable products. Among ALTs, step-stress design increases the stress level at predefined times, while maintaining a constant…

Statistics Theory · Mathematics 2024-02-12 Narayanaswamy Balakrishnan , María Jaenada , Leandro Pardo

Many modern products exhibit high reliability under normal operating conditions. Conducting life tests under these conditions may result in very few observed failures, insufficient for accurate inferences. Instead, accelerated life tests…

Applications · Statistics 2024-09-25 Narayanaswamy Balakrishnan , María Jaenada , Leandro Pardo

A one-shot device is a unit that operates only once, after which it is either destroyed or needs to be rebuilt. For this type of device, the operational status can only be assessed at a specific inspection time, determining whether failure…

Statistics Theory · Mathematics 2025-03-03 María González-Calderón , María Jaenada , Leandro Pardo

Accelerated life-testing (ALT) is a very useful technique for examining the reliability of highly reliable products. It allows testing the products at higher than usual stress conditions to induce failures more quickly and economically than…

Statistics Theory · Mathematics 2020-05-15 Aida Calviño

One-shot devices data represent an extreme case of interval censoring.Some kind of one-shot units do not get destroyed when tested, and so, survival units can continue within the test providing extra information about their lifetime.…

Statistics Theory · Mathematics 2022-05-17 Narayanaswamy Balakrishnan , María Jaenada , Leandro Pardo

One-shot devices analysis involves an extreme case of interval censoring, wherein one can only know whether the failure time is either before or after the test time. Some kind of one-shot devices do not get destroyed when tested, and so can…

Methodology · Statistics 2022-04-26 Narayanaswamy Balakrishnan , Elena Castilla , María Jaenada , Leandro Pardo

Robust inferential methods based on divergences measures have shown an appealing trade-off between efficiency and robustness in many different statistical models. In this paper, minimum density power divergence estimators (MDPDEs) for the…

Statistics Theory · Mathematics 2023-12-06 A. Felipe , M. Jaenada , P. Miranda , L. Pardo

Many real-life data sets can be analyzed using Linear Mixed Models (LMMs). Since these are ordinarily based on normality assumptions, under small deviations from the model the inference can be highly unstable when the associated parameters…

Methodology · Statistics 2024-02-06 Giovanni Saraceno , Abhik Ghosh , Ayanendranath Basu , Claudio Agostinelli

Accelerated life testing (ALT) is a method of reducing the lifetime of components through exposure to extreme stress. This method of obtaining lifetime information involves the design of a testing experiment, i.e., an accelerated test plan.…

Applications · Statistics 2025-11-10 Owen McGrath , Kevin Burke

This paper develops a new family of estimators, the minimum density power divergence estimators (MDPDEs), for the parameters of the one-shot device model as well as a new family of test statistics, Z-type test statistics based on MDPDEs,…

Methodology · Statistics 2017-04-27 N. Balakrishnan , E. Castilla , N. Martin , L. Pardo

Accelerated degradation tests are used to provide accurate estimation of lifetime properties of highly reliable products within a relatively short testing time. There data from particular tests at high levels of stress (e.\,g.\ temperature,…

Applications · Statistics 2021-10-13 Helmi Shat , Rainer Schwabe

In recent years, more attention has been paid prominently to accelerated degradation testing in order to characterize accurate estimation of reliability properties for systems that are designed to work properly for years of even decades.…

Applications · Statistics 2021-09-23 Helmi Shat

In various practical situations, we encounter data from stochastic processes which can be efficiently modelled by an appropriate parametric model for subsequent statistical analyses. Unfortunately, the most common estimation and inference…

Methodology · Statistics 2022-04-12 Rohan Hore , Abhik Ghosh

Nondestructive one-shot device (NOSD) testing plays a crucial role in engineering, particularly in the reliability assessment of high-stakes systems such as aerospace components, medical devices, and semiconductor technologies. Accurate…

Applications · Statistics 2025-03-11 Shanya Baghel , Shuvashree Mondal

Many products in engineering are highly reliable with large mean lifetimes to failure. Performing lifetests under normal operations conditions would thus require long experimentation times and high experimentation costs. Alternatively,…

Methodology · Statistics 2024-02-12 Narayanaswamy Balakrishnan , María Jaenada , Leandro Pardo

Recently, a growing amount interest is quite evident in modelling dependent competing risks in life time prognosis problem. In this work, we propose to model the dependent competing risks by Marshal-Olkin bivariate exponential distribution.…

Applications · Statistics 2022-10-13 Shuvashree Mondal , Shanya Baghel

In real life, we frequently come across data sets that involve some independent explanatory variable(s) generating a set of ordinal responses. These ordinal responses may correspond to an underlying continuous latent variable, which is…

Methodology · Statistics 2024-01-08 Arijit Pyne , Subhrajyoty Roy , Abhik Ghosh , Ayanendranath Basu

The semi-parametric Cox proportional hazards regression model has been widely used for many years in several applied sciences. However, a fully parametric proportional hazards model, if appropriately assumed, can often lead to more…

Methodology · Statistics 2020-09-29 Amarnath Nandy , Abhik Ghosh , Ayanendranath Basu , Leandro Pardo
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