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Recent progress in the application of color centers to nanoscale spin sensing makes the combined use of noise spectroscopy and scanning probe imaging an attractive route for the characterization of arbitrary material systems. Unfortunately,…

As the scale and complexity of integrated circuits continue to increase, traditional modeling methods are struggling to address the nonlinear challenges in radio frequency (RF) chips. Deep learning has been increasingly applied to RF device…

Signal Processing · Electrical Eng. & Systems 2024-12-06 Zhaokun Hu , Yindong Xiao , Houjun Wang , Jiayong Yu , Zihang Gao

Metasurfaces have shown promising potentials in shaping optical wavefronts while remaining compact compared to bulky geometric optics devices. Design of meta-atoms, the fundamental building blocks of metasurfaces, relies on trial-and-error…

We present an ultra-fast, precise, parameter-free method, which we term Deep-STORM, for obtaining super-resolution images from stochastically-blinking emitters, such as fluorescent molecules used for localization microscopy. Deep-STORM uses…

Optics · Physics 2018-05-03 Elias Nehme , Lucien E. Weiss , Tomer Michaeli , Yoav Shechtman

Fluorescence lifetime imaging microscopy (FLIM) systems are limited by their slow processing speed, low signal-to-noise ratio (SNR), and expensive and challenging hardware setups. In this work, we demonstrate applying a denoising…

Image and Video Processing · Electrical Eng. & Systems 2021-06-09 Varun Mannam , Yide Zhang , Xiaotong Yuan , Takashi Hato , Pierre C. Dagher , Evan L. Nichols , Cody J. Smith , Kenneth W. Dunn , Scott Howard

Pathological brain lesions exhibit diverse appearance in brain images, in terms of intensity, texture, shape, size, and location. Comprehensive sets of data and annotations are difficult to acquire. Therefore, unsupervised anomaly detection…

Noise is an important issue for radiographic and tomographic imaging techniques. It becomes particularly critical in applications where additional constraints force a strong reduction of the Signal-to-Noise Ratio (SNR) per image. These…

Computer Vision and Pattern Recognition · Computer Science 2023-03-28 Yaroslav Zharov , Evelina Ametova , Rebecca Spiecker , Tilo Baumbach , Genoveva Burca , Vincent Heuveline

In spectroscopic experiments, data acquisition in multi-dimensional phase space may require long acquisition time, owing to the large phase space volume to be covered. In such case, the limited time available for data acquisition can be a…

Recording atomic-resolution transmission electron microscopy (TEM) images is becoming increasingly routine. A new bottleneck is then analyzing this information, which often involves time-consuming manual structural identification. We have…

Electron energy-loss spectroscopy (EELS) coupled with scanning transmission electron microscopy (STEM) is a powerful technique to determine materials composition and bonding with high spatial resolution. Noise is often a limitation…

Instrumentation and Detectors · Physics 2025-05-21 Yifan Wang , Mai Tan , Carlos Fernandez-Granda , Peter A. Crozier

Noise manifests ubiquitously in nonlinear spectroscopy, where multiple sources contribute to experimental signals generating interrelated unwanted components, from random point-wise fluctuations to structured baseline signals. Mitigating…

The technological advance of High Numerical Aperture Extreme Ultraviolet Lithography (High NA EUVL) has opened the gates to extensive researches on thinner photoresists (below 30nm), necessary for the industrial implementation of High NA…

Computer Vision and Pattern Recognition · Computer Science 2023-10-24 Sara Sacchi , Bappaditya Dey , Iacopo Mochi , Sandip Halder , Philippe Leray

This paper proposes a deep sound-field denoiser, a deep neural network (DNN) based denoising of optically measured sound-field images. Sound-field imaging using optical methods has gained considerable attention due to its ability to achieve…

Signal Processing · Electrical Eng. & Systems 2023-09-22 Kenji Ishikawa , Daiki Takeuchi , Noboru Harada , Takehiro Moriya

With the development of deep learning, medical image processing has been widely used to assist clinical research. This paper focuses on the denoising problem of low-dose computed tomography using deep learning. Although low-dose computed…

Image and Video Processing · Electrical Eng. & Systems 2026-05-19 Zhilin Guan , Wei Zhang

Microscopy such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) are essential tools in material imaging at micro- and nanoscale resolutions to extract physical knowledge and…

Recently, super-resolution ultrasound imaging with ultrasound localization microscopy (ULM) has received much attention. However, ULM relies on low concentrations of microbubbles in the blood vessels, ultimately resulting in long…

Background: Dual-energy CT (DECT) and material decomposition play vital roles in quantitative medical imaging. However, the decomposition process may suffer from significant noise amplification, leading to severely degraded image…

This paper develops a resolution enhancement method for post-processing the images from Atomic Force Microscopy (AFM). This method is based on deep learning neural networks in the AFM topography measurements. In this study, a very deep…

Data Analysis, Statistics and Probability · Physics 2018-09-12 Y. Liu , Q. M. Sun , Dr. W. H. Lu , Dr. H. L. Wang , Y. Sun , Z. T. Wang , X. Lu , Prof. K. Y. Zeng

Nanoparticle surface structural dynamics is believed to play a significant role in regulating functionalities such as diffusion, reactivity, and catalysis but the atomic-level processes are not well understood. Atomic resolution…

Many microscopy applications are limited by the total amount of usable light and are consequently challenged by the resulting levels of noise in the acquired images. This problem is often addressed via (supervised) deep learning based…

Image and Video Processing · Electrical Eng. & Systems 2020-08-20 Anna S. Goncharova , Alf Honigmann , Florian Jug , Alexander Krull