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This article addresses extraction of physically meaningful information from STEM EELS and EDX spectrum-images using methods of Multivariate Statistical Analysis. The problem is interpreted in terms of data distribution in a…

Data Analysis, Statistics and Probability · Physics 2021-05-24 Pavel Potapov , Axel Lubk

The manuscript considers Scanning Transmission Electron Microscopy (STEM) images and derives transformations needed to correct various distortions occurring during scanning. These transformations form the basis for the correction algorithms…

Instrumentation and Detectors · Physics 2026-05-13 Pavel Potapov , Giulio Guzzinati

(Scanning) transmission electron microscopy ((S)TEM) has significantly advanced materials science but faces challenges in correlating precise atomic structure information with the functional properties of devices due to its time-intensive…

The reduced dimensionality in two-dimensional materials leads a wealth of unusual properties, which are currently explored for both fundamental and applied sciences. In order to study the crystal structure, edge states, the formation of…

Mesoscale and Nanoscale Physics · Physics 2021-01-04 Felix Kern , Martin Linck , Daniel Wolf , Nasim Alem , Himani Arora , Sibylle Gemming , Artur Erbe , Alex Zettl , Bernd Büchner , Axel Lubk

Harnessing electron spin is crucial in developing energy-saving and high-speed devices for the next generation. In this scheme, visualizing spin-polarized electronic states aids in designing and developing new materials and devices.…

Materials Science · Physics 2024-04-03 Koichiro Yaji , Shunsuke Tsuda

The robust approach for real-time analysis of the scanning transmission electron microscopy (STEM) data streams, based on the ensemble learning and iterative training (ELIT) of deep convolutional neural networks, is implemented on an…

Disordered Systems and Neural Networks · Physics 2022-07-27 Kevin M. Roccapriore , Matthew G. Boebinger , Ondrej Dyck , Ayana Ghosh , Raymond R. Unocic , Sergei V. Kalinin , Maxim Ziatdinov

We present annular dark field scanning transmission electron microscopy (ADF-STEM) as an efficient, fast, and non-destructive nanoscale tool for monitoring solid-state phase transition. Using metal-insulator transition in vanadium dioxide…

Future complementary metal oxide semiconductor (CMOS) scaling for advanced integrated circuit (IC) technologies may well depend on "More than Moore" (MtM) approaches using heterogeneous integration of semiconductor-based devices. In order…

Materials Science · Physics 2012-04-09 J. Stopford , A. Henry , D. Allen , N. Bennett , D. Manessis , L. Boettcher , J. Wittge , A. N. Danilewsky , P. J. McNally

Light carries rich information across space, spectrum, polarization, and time, yet conventional cameras capture only a narrow projection of this multidimensional structure. A thin diffuser encodes wavelength-dependent information into…

In Environmental Scanning Electron Microscopy (ESEM) experiments, the acquisition parameters are generally kept constant throughout the collection of a data set. This limits data collection to one data set at a time, and frequent human…

Significant progress has been made in spatial resolution using environmental transmission electron microscopes (ETEM), which now enables atomic resolution visualization of structural transformation under variable temperature and gas…

Materials Science · Physics 2015-06-18 Wenpei Gao , Jianbo Wu , Xiaofeng Zhang , Aram Yoon , J. Mabon , W. Swiech , W. L. Wilson , H. Yang , Jian-Min Zuo

In this thesis we investigate high throughput computational methods for processing large quantities of data collected from synchrotrons and their application to spectral analysis of powder diffraction data. We also present the main product…

Data Analysis, Statistics and Probability · Physics 2013-01-22 Taha Sochi

Central to the application of many multi-view geometry algorithms is the extraction of matching points between multiple viewpoints, enabling classical tasks such as camera pose estimation and 3D reconstruction. Many approaches that…

Computer Vision and Pattern Recognition · Computer Science 2021-10-15 Alexander Mai , Allen Yang , Dominique E. Meyer

Ptychography provides highly efficient imaging in scanning transmission electron microscopy (STEM), but questions have remained over its applicability to strongly scattering samples such as those most commonly seen in materialsscience.…

Applied Physics · Physics 2022-09-07 C. Gao , C. Hofer , D. Jannis , A. Béché , J. Verbeeck , T. J. Pennycook

Electron tomography (ET) has been demonstrated to be a powerful tool in addressing challenging problems, such as understanding 3D interactions among various microstructures. Advancing ET to broader applications requires novel…

Applied Physics · Physics 2020-01-22 Yizhi Zhang , Yeqiang Bu , Xiaoyang Fang , Hongtao Wang

Instrumentation developments in electron energy-loss spectroscopy (EELS) in the scanning transmission electron microscope (STEM) one decade ago paved the way for combining milli-electronvolt energy resolution in spectroscopy with…

Mesoscale and Nanoscale Physics · Physics 2024-10-15 Benedikt Haas , Christoph T. Koch , Peter Rez

Scanning Transmission Electron Microscopy (STEM) enables the observation of atomic arrangements at sub-angstrom resolution, allowing for atomically resolved analysis of the physical and chemical properties of materials. However, due to the…

Computer Vision and Pattern Recognition · Computer Science 2025-04-04 Hesong Li , Ziqi Wu , Ruiwen Shao , Tao Zhang , Ying Fu

Strong multiple scattering of the probe in scanning transmission electron microscopy (STEM) means image simulations are usually required for quantitative interpretation and analysis of elemental maps produced by electron energy-loss…

Materials Science · Physics 2019-12-25 Hamish G. Brown , Jim Ciston , Colin Ophus

SUePDF is a graphic-user-interface program written in MATLAB to achieve quantitative pair distribution functions (PDF) from electron diffraction data. The program facilitates the structural studies of amorphous materials and small…

Materials Science · Physics 2017-08-24 Dung Trung Tran , Gunnar Svensson , Cheuk-Wai Tai

We measured the local composition and thickness of SiO2-based glass material from diffraction. By using four dimensional scanning transmission electron microscopy (4D-STEM), we obtained diffraction at each scanning point. Comparing the…

Materials Science · Physics 2020-05-20 K. Nakazawa , K. Mitsuishi , K. Shibata , S. Amma , T. Mizoguchi