Related papers: Light-based electron aberration corrector
In this theoretical study we analyze contrast transfer of weak-phase objects in a transmission electron microscope, which is equipped with an aberration corrector (Cs-corrector) in the imaging lens system and a physical phase plate in the…
Imaging energy filters in photoelectron microscopes and momentum microscopes use spherical fields with deflection angles of 90{\deg}, 180{\deg}, and even 2 x 180{\deg}. These instruments are optimized for high energy resolution, but exhibit…
High quality imaging usually requires bulky and expensive lenses to compensate geometric and chromatic aberrations. This poses high constraints on the optical hash or low cost applications. Although one can utilize algorithmic…
When light is passed through aberrated optical systems, the resulting degradation in amplitude and phase has deleterious effects, for example, on resolution in imaging, spot sizes in focussing, and the beam quality factor of the output…
Diffraction of light at lateral inhomogenities is a central process in the near-field studies of nanoscale phenomena, especially the propagation of surface waves. Theoretical description of this process is extremely challenging due to…
One of the missing elements for realising an integrated optical circuit is a rectifying device playing the role of an optical diode. A proposal based on a pair of two-level atoms strongly coupled to a one-dimenisonal waveguide showed a…
We demonstrate a new approach to calibrating the spectral-spatial response of a wide-field spectrograph using a fibre etalon comb. Conventional wide-field instruments employed on front-line telescopes are mapped with a grid of…
We calculate corrections to the power spectrum predictions of weak lensing by large scale structure due to higher order effects in the gravitational potential. Using a perturbative approach to third order in transverse displacements, we…
Ptychography has become prominent at synchrotron facilities worldwide for characterizing biological and material specimens' topological structures and properties at the nanometer or atomic scale, due to its lens - less, highly quantitative…
Scattering-based single-particle tracking (S-SPT) has opened new avenues for highly sensitive label-free detection and characterization of nanoscopic objects, making it particularly attractive for various analytical applications. However, a…
Motivated by their great potential to reduce the size, cost and weight, flat lenses, a category that includes diffractive lenses and metalenses, are rapidly emerging as key components with the potential to replace the traditional refractive…
The diagram showing off-center nested spheres which is traditionally used to illustrate the Doppler effect, is misleading and its trigonometric analysis leads to errors concerning light, because electromagnetic Doppler and aberration…
The resolution of optical imaging devices is ultimately limited by the diffraction of light. To circumvent this limit, modern super-resolution microscopy techniques employ active interaction with the object by exploiting its optical…
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher voltages. To improve resolution, spherical aberration can be…
Detector counting rate nonlinearity, though a known problem, is commonly ignored in the analysis of angle resolved photoemission spectroscopy where modern multichannel electron detection schemes using analog intensity scales are used. We…
Aperture based scanning near field optical microscopes are important instruments to study light at the nanoscale and to understand the optical functionality of photonic nanostructures. In general, a detected image is affected by both, the…
A solution to the inversion problem of scattering would offer aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems. Powerful algorithms are increasingly being…
The coherent reflectivity of a dense, relativistic, ultra-thin electron layer is derived analytically for an obliquely incident probe beam. Results are obtained by two-fold Lorentz transformation. For the analytical treatment, a plane…
Oblique plane microscopy is a method enabling light-sheet fluorescence imaging through a single microscope objective lens by focusing on a tilted plane within the sample. To focus the fluorescence emitted by the oblique plane on a camera,…
A notorious problem in high-resolution biological electron microscopy is radiation damage to the specimen caused by probe electrons. Hence, acquisition of data with minimal number of electrons is of critical importance. Quantum approaches…