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Absorption of infrared and visible radiation from stellar emission spectra by the negatively charged hydrogen ions H$^{-}$ is considered. The explicit formula for the photodetachment cross-section of the negatively charged hydrogen ion(s)…
Radar Cross Section measurement data is often analyzed using Inverse Synthetic Aperture Radar images. This paper compares backprojection and iterative smooth reweighted $\ell_1$-minimization as methods to analyze radar cross section…
A test of Geant4 simulation of electron backscattering recently published in this journal prompted further investigation into the causes of the observed behaviour. An interplay between features of geometry and physics algorithms implemented…
A precision measurement of jet cross sections in neutral current deep-inelastic scattering for photon virtualities $5.5<Q^2<80\,{\rm GeV}^2$ and inelasticities $0.2<y<0.6$ is presented, using data taken with the H1 detector at HERA,…
Quantitative interpretation of transmission electron microscopy (TEM) data of crystalline specimens often requires the accurate knowledge of the local crystal orientation. A method is presented which exploits momentum-resolved scanning TEM…
In everyday research, it is tacitly assumed that the scattering cross-sections have fixed values for the given particle species, centre-of-mass energy, and particle polarizations. However, this assumption has been called into question after…
The structure of low-carbon steel after twist extrusion is tested with using electron backscattered diffraction. It has been shown that warm twist extrusion results in grain refinement with conservation of a substantial part of high-angle…
Coherent anti-Stokes Raman scattering is a widely used imaging technique that provides chemical contrast without the need for labels, making it an extremely valuable tool in physics, chemistry, and biology. In this work, we explore its…
Achieving quantum-limited motional control of optically trapped particles beyond the sub-micrometer scale is an outstanding problem in levitated optomechanics. A key obstacle is solving the light scattering problem and identifying particle…
In the scanning transmission electron microscope, fast-scanning and frame-averaging are two widely used approaches for reducing electron-beam damage and increasing image signal-noise ratio which require no additional specialised hardware.…
This paper describes the impedance spectroscopy adapted for analysis of small electrochemical changes in fluids. To increase accuracy of measurements the differential approach with temperature stabilization of fluid samples and electronics…
In Phys. Lett. B 753, 629-638 (2016) [arXiv:1507.08188] the BESIII collaboration published a cross section measurement of the process $e^+e^-\to \pi^+ \pi^-$ in the energy range between 600 and 900 MeV. In this erratum we report a corrected…
The nature of stacking faults - whether intrinsic or extrinsic - plays a pivotal role in defect-mediated processes in crystalline materials. Yet, current electron microscopy techniques for their reliable analysis remain limited to either…
Low energy ion scattering is a technique to detect the energy of ions which are scattered from a surface. For noble gas ions, it is predominantly sensitive to the topmost surface layer due to strong neutralisation processes. Depending on…
Molecular helium represents a benchmark system for testing $\textit{ab initio}$ calculations on few-electron molecules. We report on the determination of the adiabatic ionization energy of the $a\,^3\Sigma_u^+$ state of He$_2$,…
The image-charge detection provides a new direct method for the detection of the Rydberg transition in electrons trapped on the surface of liquid helium. The interest in this method is motivated by the possibility to accomplish the spin…
This paper presents an attractive method towards sensing and quantifying the concentration of dielectric particles suspended in a highly conductive medium. Fast electrical impedance spectroscopy (EIS) measurements were performed, based on…
The differential and total cross sections for electron capture by positrons from helium atoms are calculated using a first-order distorted wave theory satisfying the Coulomb boundary conditions. In this formalism a parametric potential is…
Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration corrector to produce a sub-{\AA}ngstr\"om probe is a complex…
Understanding ion-matter interactions at the atomistic level is key to advancing materials for the semiconductor industry, space systems, and nuclear fusion technologies. However, most atomistic frameworks still rely on simplified…