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Industrial Anomaly Detection (IAD) is critical for quality control, but existing methods struggle with subtle, geometric defects. Standard 2D (RGB) images are sensitive to texture and lighting but often miss fine geometric anomalies. While…

Computer Vision and Pattern Recognition · Computer Science 2026-05-11 Wenbing Zhu , Jianing Liang , Linjie Cheng , Yurui Pan , Zhuhao Chen , Qingwang Yan , Yudong Cheng , Jianghui Zhang , Mingmin Chi , Bo Peng

Industrial anomaly detection (IAD) has garnered significant attention and experienced rapid development. However, the recent development of IAD approach has encountered certain difficulties due to dataset limitations. On the one hand, most…

Computer Vision and Pattern Recognition · Computer Science 2024-03-20 Chengjie Wang , Wenbing Zhu , Bin-Bin Gao , Zhenye Gan , Jianning Zhang , Zhihao Gu , Shuguang Qian , Mingang Chen , Lizhuang Ma

3D anomaly detection (3D-AD) plays a critical role in industrial manufacturing, particularly in ensuring the reliability and safety of core equipment components. Although existing 3D datasets like Real3D-AD and MVTec 3D-AD offer broad…

Computer Vision and Pattern Recognition · Computer Science 2025-11-06 Bingyang Guo , Hongjie Li , Ruiyun Yu , Hanzhe Liang , Jinbao Wang

High-precision point cloud anomaly detection is the gold standard for identifying the defects of advancing machining and precision manufacturing. Despite some methodological advances in this area, the scarcity of datasets and the lack of a…

Computer Vision and Pattern Recognition · Computer Science 2023-10-24 Jiaqi Liu , Guoyang Xie , Ruitao Chen , Xinpeng Li , Jinbao Wang , Yong Liu , Chengjie Wang , Feng Zheng

Industrial Anomaly Detection (IAD) is a cornerstone for ensuring operational safety, maintaining product quality, and optimizing manufacturing efficiency. However, the advancement of IAD algorithms is severely hindered by the limitations of…

Computer Vision and Pattern Recognition · Computer Science 2026-02-13 Wenbing Zhu , Chengjie Wang , Bin-Bin Gao , Jiangning Zhang , Guannan Jiang , Jie Hu , Zhenye Gan , Lidong Wang , Ziqing Zhou , Jianghui Zhang , Linjie Cheng , Yurui Pan , Bo Peng , Mingmin Chi , Lizhuang Ma

In the advancement of industrial informatization, unsupervised anomaly detection technology effectively overcomes the scarcity of abnormal samples and significantly enhances the automation and reliability of smart manufacturing. As an…

Computer Vision and Pattern Recognition · Computer Science 2025-03-24 Yuxuan Lin , Yang Chang , Xuan Tong , Jiawen Yu , Antonio Liotta , Guofan Huang , Wei Song , Deyu Zeng , Zongze Wu , Yan Wang , Wenqiang Zhang

The paper explores the industrial multimodal Anomaly Detection (AD) task, which exploits point clouds and RGB images to localize anomalies. We introduce a novel light and fast framework that learns to map features from one modality to the…

Computer Vision and Pattern Recognition · Computer Science 2024-07-09 Alex Costanzino , Pierluigi Zama Ramirez , Giuseppe Lisanti , Luigi Di Stefano

Although self-supervised 3D anomaly detection assumes that acquiring high-precision point clouds is computationally expensive, in real manufacturing scenarios it is often feasible to collect a limited number of anomalous samples. Therefore,…

Computer Vision and Pattern Recognition · Computer Science 2026-04-02 Hanzhe Liang , Luocheng Zhang , Junyang Xia , HanLiang Zhou , Bingyang Guo , Yingxi Xie , Can Gao , Ruiyun Yu , Jinbao Wang , Pan Li

Multimodal industrial anomaly detection benefits from integrating RGB appearance with 3D surface geometry, yet existing \emph{unsupervised} approaches commonly rely on memory banks, teacher-student architectures, or fragile fusion schemes,…

Computer Vision and Pattern Recognition · Computer Science 2026-03-05 Radia Daci , Vito Renò , Cosimo Patruno , Angelo Cardellicchio , Abdelmalik Taleb-Ahmed , Marco Leo , Cosimo Distante

Industrial anomaly detection for 2D objects has gained significant attention and achieved progress in anomaly detection (AD) methods. However, identifying 3D depth anomalies using only 2D information is insufficient. Despite explicitly…

Computer Vision and Pattern Recognition · Computer Science 2025-07-28 An Xiang , Zixuan Huang , Xitong Gao , Kejiang Ye , Cheng-zhong Xu

2D-based Industrial Anomaly Detection has been widely discussed, however, multimodal industrial anomaly detection based on 3D point clouds and RGB images still has many untouched fields. Existing multimodal industrial anomaly detection…

Computer Vision and Pattern Recognition · Computer Science 2023-09-08 Yue Wang , Jinlong Peng , Jiangning Zhang , Ran Yi , Yabiao Wang , Chengjie Wang

The recent rapid development of deep learning has laid a milestone in industrial Image Anomaly Detection (IAD). In this paper, we provide a comprehensive review of deep learning-based image anomaly detection techniques, from the…

Computer Vision and Pattern Recognition · Computer Science 2024-04-02 Jiaqi Liu , Guoyang Xie , Jinbao Wang , Shangnian Li , Chengjie Wang , Feng Zheng , Yaochu Jin

Multimodal Industrial Anomaly Detection (MIAD), which utilizes 3D point clouds and 2D RGB images to identify abnormal regions in products, plays a crucial role in industrial quality inspection. However, traditional MIAD settings assume that…

Computer Vision and Pattern Recognition · Computer Science 2025-10-28 Bingchen Miao , Wenqiao Zhang , Juncheng Li , Wangyu Wu , Siliang Tang , Zhaocheng Li , Haochen Shi , Jun Xiao , Yueting Zhuang

Recent studies of multimodal industrial anomaly detection (IAD) based on 3D point clouds and RGB images have highlighted the importance of exploiting the redundancy and complementarity among modalities for accurate classification and…

Computer Vision and Pattern Recognition · Computer Science 2025-10-17 Wenbo Sui , Daniel Lichau , Josselin Lefèvre , Harold Phelippeau

Surface defects are a primary source of yield loss in manufacturing, yet existing anomaly detection methods often fail in real-world deployment due to limited and unrepresentative datasets. To overcome this, we introduce 3D-ADAM, a 3D…

Computer Vision and Pattern Recognition · Computer Science 2025-09-24 Paul McHard , Florent P. Audonnet , Oliver Summerell , Sebastian Andraos , Paul Henderson , Gerardo Aragon-Camarasa

Multi-class Unsupervised Anomaly Detection algorithms (MUAD) are receiving increasing attention due to their relatively low deployment costs and improved training efficiency. However, the real-world effectiveness of MUAD methods is…

Computer Vision and Pattern Recognition · Computer Science 2025-04-18 Qishan Wang , Shuyong Gao , Junjie Hu , Jiawen Yu , Xuan Tong , You Li , Wenqiang Zhang

We propose SiM3D, the first benchmark considering the integration of multiview and multimodal information for comprehensive 3D anomaly detection and segmentation (ADS), where the task is to produce a voxel-based Anomaly Volume. Moreover,…

Computer Vision and Pattern Recognition · Computer Science 2025-08-05 Alex Costanzino , Pierluigi Zama Ramirez , Luigi Lella , Matteo Ragaglia , Alessandro Oliva , Giuseppe Lisanti , Luigi Di Stefano

Image anomaly detection (IAD) is an emerging and vital computer vision task in industrial manufacturing (IM). Recently, many advanced algorithms have been reported, but their performance deviates considerably with various IM settings. We…

Computer Vision and Pattern Recognition · Computer Science 2024-01-30 Guoyang Xie , Jinbao Wang , Jiaqi Liu , Jiayi Lyu , Yong Liu , Chengjie Wang , Feng Zheng , Yaochu Jin

Current anomaly detection methods primarily focus on low-resolution scenarios. For high-resolution images, conventional downsampling often results in missed detections of subtle anomalous regions due to the loss of fine-grained…

Computer Vision and Pattern Recognition · Computer Science 2025-08-19 Ximiao Zhang , Min Xu , Xiuzhuang Zhou

Industrial anomaly detection achieves progress thanks to datasets such as MVTec-AD and VisA. However, they suffer from limitations in terms of the number of defect samples, types of defects, and availability of real-world scenes. These…

Computer Vision and Pattern Recognition · Computer Science 2025-02-19 Enquan Yang , Peng Xing , Hanyang Sun , Wenbo Guo , Yuanwei Ma , Zechao Li , Dan Zeng
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