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Related papers: X-ray Strain and Stress Tensor Tomography

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Dielectric tensor tomography is an imaging technique for mapping three-dimensional distributions of dielectric properties in transparent materials. This work introduces an enhanced illumination strategy employing a micro-electromechanical…

Strength, ductility, and failure properties of metals are tailored by plastic deformation routes. Predicting these properties requires modeling of the structural dynamics and stress evolution taking place on several length scales. Progress…

Using the notion of eigenstrain produced by the defects formed in a material exposed to high energy neutron irradiation, we develop a method for computing macroscopic elastic stress and strain arising in components of a fusion power plant…

Materials Science · Physics 2021-12-22 Luca Reali , Max Boleininger , Mark R. Gilbert , Sergei L. Dudarev

X-ray computed tomography is a powerful tool for volumetric imaging, where three-dimensional (3D) images are generated from a large number of individual X-ray projection images. Collecting the required number of low noise projection images…

Image and Video Processing · Electrical Eng. & Systems 2025-04-30 Zhenduo Shang , Thomas Blumensath

Strain engineering is a powerful tool for tuning the electronic, magnetic, and topological properties of two-dimensional (2D) materials and thin films - particularly at high values of strain (>3%) where many electronic, magnetic, and…

Materials Science · Physics 2026-04-30 Yangchen He , Jessica Kienbaum , Wuzhang Fang , Hongrui Ma , Ying Wang , Ping Yuan , Daniel A. Rhodes

We present a methodology to impose micromechanical constraints, i.e. stress equilibrium at grain and sub-grain scale, to an arbitrary (non-equilibrated) voxelized stress field obtained, for example, by means of synchrotron X-ray diffraction…

Materials Science · Physics 2021-05-05 Hao Zhou , Ricardo A. Lebensohn , Péter Reischig , Wolfgang Ludwig , Kaushik Bhattacharya

Cyclic multiaxial loadings of soft materials are usually studied throughout experiments involving machines that prescribe a combination of uniaxial tension and torsion. Due to the large strain framework, classical kinematic analyses of…

Classical Physics · Physics 2022-06-29 Etienne Le Mire , Erwan Verron , Bertrand Huneau , Nathan Selles

Knowledge gained through X-ray crystallography fostered structural determination of materials and greatly facilitated the development of modern science and technology in the past century. Atomic details of sample structures is achievable by…

Optics · Physics 2016-09-14 Hong Yu , Ronghua Lu , Shensheng Han , Honglan Xie , Guohao Du , Tiqiao Xiao , Daming Zhu

We introduce a novel three-dimensional (3D) traction force microscopy (TFM) method motivated by the recent discovery that cells adhering on plane surfaces exert both in-plane and out-of-plane traction stresses. We measure the 3D deformation…

Strain engineering in semiconductor transistor devices has become vital in the semiconductor industry due to the ever increasing need for performance enhancement at the nanoscale. Raman spectroscopy is a non-invasive measurement technique…

Optics · Physics 2021-06-17 V. Prabhakara , T. Nuytten , H. Bender , W. Vandervorst , S. Bals , J. Verbeeck

Small-angle scattering tensor tomography is a technique for studying anisotropic nanostructures of millimeter-sized samples in a volume-resolved manner. It requires the acquisition of data through repeated tomographic rotations about an…

We report on the determination of high-pressure elasticity from thermal diffuse x-ray scattering of magnesium oxide at pressures up to 28 GPa. We find that the full elasticity tensor as a function of pressure can be extracted from x-ray…

Materials Science · Physics 2018-08-15 Björn Wehinger , Alessandro Mirone , Michael Krisch

Strain governs not only the mechanical response of materials but also their electronic, optical, and catalytic properties. For this reason, the measurement of the 3D strain field is crucial for a detailed understanding and for further…

Materials Science · Physics 2025-09-19 Laura Niermann , Tore Niermann , Chengyu Song , Colin Ophus

Lattice strain measurement of nanoscale semiconductor devices is crucial for the semiconductor industry as strain substantially improves the electrical performance of transistors. High resolution scanning transmission electron microscopy…

While $\beta$-Ga$_2$O$_3$ is considered a promising wide bandgap semiconductor, the impact of ion-induced defect formation and anisotropic elasticity remains poorly understood. Here, we combine a simulation and experiment X-ray diffraction…

Bulk-mode acoustic waves in a crystalline material exert lattice strain through the thickness of the sample, which couples to the spin Hamiltonian of defect-based qubits such as the nitrogen-vacancy (NV) center defect in diamond. This…

Deformation gradient tensor fields are reconstructed in three dimensions (mapping all 9 tensor components) using synthetic Dark-Field X-ray Microscopy data. Owing to the unique properties of the microscope, our results imply that the…

Materials Science · Physics 2025-09-09 Axel Henningsson , Sina Borgi , Grethe Winther , Anter El-Azab , Henning Friis Poulsen

Pressure ulcers are a severe disease affecting patients that are bedridden or in a wheelchair bound for long periods of time. These wounds can develop in the deep layers of the skin of specific parts of the body, mostly on heels or sacrum,…

When calculating residual strain via neutron or X-ray diffraction, uncertainties propagated from the peak fit are often inadequate to describe the true scatter of measurements about a singular strain state, such as one that should describe…

Materials Science · Physics 2026-05-07 Cole Franz , Michael B. Prime , Jeffrey Bunn , Andrew Payzant , Katharine Page

We demonstrate high-resolution non-iterative holographic coherent diffraction imaging with hard X-rays using a novel phase-shifting reference, fabricated by atomic layer deposition to produce nanosharp 3D structure. The method surpasses the…

Mesoscale and Nanoscale Physics · Physics 2016-10-17 Mirna Saliba , Jeroen Bosgra , Christoph Rau , Christian David , Aaron D. Parsons , Ulrich H. Wagner , Pierre Thibault
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