Related papers: Space-Time Encoded Modulation for High-Fidelity Di…
Four-dimensional scanning transmission electron microscopy (4D-STEM) of local atomic diffraction patterns is emerging as a powerful technique for probing intricate details of atomic structure and atomic electric fields. However, efficient…
Four-dimensional scanning transmission electron microscopy (4D-STEM) enables mapping of diffraction information with nanometer-scale spatial resolution, offering detailed insight into local structure, orientation, and strain. However, as…
We propose an enhanced spatial modulation (SM)-based scheme for indoor visible light communication systems. This scheme enhances the achievable throughput of conventional SM schemes by transmitting higher order complex modulation symbol,…
Fast pixelated detectors incorporating direct electron detection (DED) technology are increasingly being regarded as universal detectors for scanning transmission electron microscopy (STEM), capable of imaging under multiple modes of…
A single-pixel digital holography system with phase-encoded illumination using a digital micromirror device (DMD) as a spatial light modulator (SLM) is presented. The enhanced switching rate of DMDs, far exceeding the stringent frame-rate…
Low-light images suffer from complex degradation, and existing enhancement methods often encode all degradation factors within a single latent space. This leads to highly entangled features and strong black-box characteristics, making the…
Scanning transmission electron microscopy (STEM) has a broad range of applications in materials characterization, including real-space imaging, spectroscopy, and diffraction, at length scales from the micron to sub-{\AA}ngstr\"om. The…
Complex Semi-Definite Programming (SDP) is introduced as a novel approach to phase retrieval enabled control of monochromatic light transmission through highly scattering media. In a simple optical setup, a spatial light modulator is used…
Momentum-resolved scanning transmission electron microscopy (MRSTEM) is a powerful phase-contrast technique that can map lateral magnetic and electric fields ranging from the micrometer to the subatomic scale. Resolving fields ranging from…
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the…
The concept of compressive sensing was recently proposed to significantly reduce the electron dose in scanning transmission electron microscopy (STEM) while still maintaining the main features in the image. Here, an experimental setup based…
Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure-property relationships. 4D-STEM, a technique where diffraction…
Recent advances in diffusion models have enabled the creation of deceptively real images, posing significant security risks when misused. In this study, we empirically show that different timesteps of DDIM inversion reveal varying subtle…
Scanning Transmission Electron Microscopy (STEM) is a critical tool for imaging the properties of materials and biological specimens at atomic scale, yet our understanding of relevant electron beam damage mechanisms is incomplete. Recent…
The Segment Anything Model (SAM) represents a significant breakthrough into foundation models for computer vision, providing a large-scale image segmentation model. However, despite SAM's zero-shot performance, its segmentation masks lack…
Spatial modes of light provide a high-dimensional space that can be used to encode both classical and quantum information. Current approaches for dynamically generating and measuring these modes are slow, due to the need to reconfigure a…
Detecting glass regions is a challenging task due to the ambiguity of their transparency and reflection properties. These transparent glasses share the visual appearance of both transmitted arbitrary background scenes and reflected objects,…
Differential phase contrast (DPC) imaging in scanning transmission electron microscopy (STEM) maps projected electric fields through the phase sensitivity of segmented low-angle detectors. Although typically applied to atomic-resolution…
A new method for dark field imaging is introduced which uses scanned electron diffraction (or 4DSTEM - 4-dimensional scanning transmission electron microscopy) datasets as its input. Instead of working on simple summation of intensity, it…
Precession of a converged beam during acquisition of a 4D-STEM dataset improves strain, orientation, and phase mapping accuracy by averaging over continuous angles of illumination. Precession experiments usually rely on integrated systems,…