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Despite decades of research, the ultimate goal of nanotechnology--top-down manipulation of individual atoms--has been directly achieved with only one technique: scanning probe microscopy. In this Review, we demonstrate that scanning…

Images captured in harsh environments often exhibit blurred details, reduced contrast, and color distortion, which hinder feature detection and matching, thereby affecting the accuracy and robustness of homography estimation. While visual…

Computer Vision and Pattern Recognition · Computer Science 2025-03-19 Zeru Shi , Zengxi Zhang , Kemeng Cui , Ruizhe An , Jinyuan Liu , Zhiying Jiang

Scanning Electron Microscopy (SEM) is a widely used tool for nanoparticle characterization, but long-term directional drift can compromise image quality. We present a novel algorithm for post-imaging drift correction in SEM nanoparticle…

In this article, a new scanning electron microscopy (SEM) image composition technique is described, which can significantly reduce drift related image corruptions. Drift-distortion commonly causes blur and distortions in the SEM images.…

Instrumentation and Detectors · Physics 2010-08-09 Petr Cizmar , Andras E. Vladar , Michael T. Postek

Scanning tunneling microscope (STM) has presented a revolutionary methodology to the nanoscience and nanotechnology. It enables imaging the topography of surfaces, mapping the distribution of electronic density of states, and manipulating…

Mesoscale and Nanoscale Physics · Physics 2020-09-07 Wonhee Ko , Chuanxu Ma , Giang D. Nguyen , Marek Kolmer , An-Ping Li

Machine learning (ML) methods are extraordinarily successful at denoising photographic images. The application of such denoising methods to scientific images is, however, often complicated by the difficulty in experimentally obtaining a…

The reliable characterization of quantum states is a fundamental task in quantum information science. For this purpose, quantum state tomography provides a standard framework for reconstructing quantum states from measurement data, yet it…

Quantum Physics · Physics 2026-04-14 Yixuan Hu , Mengru Ma , Jiangwei Shang

Super-resolution and denoising are ill-posed yet fundamental image restoration tasks. In blind settings, the degradation kernel or the noise level are unknown. This makes restoration even more challenging, notably for learning-based…

Image and Video Processing · Electrical Eng. & Systems 2020-07-24 Majed El Helou , Ruofan Zhou , Sabine Süsstrunk

Stochastic resonance describes the utility of noise in improving the detectability of weak signals in certain types of systems. It has been observed widely in natural and engineered settings, but its utility in image classification with…

Computer Vision and Pattern Recognition · Computer Science 2025-02-21 Siegfried Ludwig

Automated experiments in scanning transmission electron microscopy (STEM) require rapid image segmentation to optimize data representation for human interpretation, decision-making, site-selective spectroscopies, and atomic manipulation.…

Materials Science · Physics 2024-09-23 Kamyar Barakati , Utkarsh Pratiush , Austin C. Houston , Gerd Duscher , Sergei V. Kalinin

A simple, yet general, formalism for the optimized linear combination of astrophysical images is constructed and demonstrated. The formalism allows the user to combine multiple undersampled images to provide oversampled output at high…

Instrumentation and Methods for Astrophysics · Physics 2015-05-28 Barnaby Rowe , Christopher Hirata , Jason Rhodes

The Noise2Void technique is demonstrated for successful denoising of atomic-resolution scanning transmission electron microscopy (STEM) images. The technique is applied to denoising atomic resolution images and videos of gold adatoms on a…

Current self-supervised denoising methods for paired noisy images typically involve mapping one noisy image through the network to the other noisy image. However, after measuring the spectral bias of such methods using our proposed Image…

Computer Vision and Pattern Recognition · Computer Science 2025-10-02 Wang Zhang , Huaqiu Li , Xiaowan Hu , Tao Jiang , Zikang Chen , Haoqian Wang

Scanning transmission electron microscopy (STEM) is widely used tool for materials characterisation. However, being a scanned technique, STEM is susceptible to sample, stage or beam drift, manifesting as distortions within images or…

Instrumentation and Detectors · Physics 2026-04-23 Matthew Mosse , Jonathan J. P. Peters , Eoin Moynihan , James A. Gott , Ana M. Sanchez , Michele Conroy , Lewys Jones

In order to leverage the full power of quantum noise squeezing with unavoidable decoherence, a complete understanding of the degradation in the purity of squeezed light is demanded. By implementing machine learning architecture with a…

The requirement of high spectrum efficiency puts forward higher requirements on frame synchronization (FS) in wireless communication systems. Meanwhile, a large number of nonlinear devices or blocks will inevitably cause nonlinear…

Signal Processing · Electrical Eng. & Systems 2021-03-30 Chaojin Qing , Wang Yu , Shuhai Tang , Chuangui Rao , Jiafan Wang

With the development of affordable aberration-correctors, analytical scanning transmission electron microscopy (STEM) studies of complex interfaces can now be conducted at high spatial resolution at laboratories worldwide. Energy-dispersive…

Materials Science · Physics 2017-04-10 Steven R. Spurgeon , Yingge Du , Scott A. Chambers

Scanning transmission electron microscopy (STEM) is now the primary tool for exploring functional materials on the atomic level. Often, features of interest are highly localized in specific regions in the material, such as ferroelectric…

Materials Science · Physics 2021-08-11 Nicole Creange , Ondrej Dyck , Rama K. Vasudevan , Maxim Ziatdinov , Sergei V. Kalinin

Analog Compute-In-Memory (CIM) architectures promise significant energy efficiency gains for neural network inference, but suffer from complex hardware-induced noise that poses major challenges for deployment. While noise-aware training…

Machine Learning · Computer Science 2025-08-19 Yuannuo Feng , Wenyong Zhou , Yuexi Lyu , Yixiang Zhang , Zhengwu Liu , Ngai Wong , Wang Kang

A deep convolutional neural network has been developed to denoise atomic-resolution TEM image datasets of nanoparticles acquired using direct electron counting detectors, for applications where the image signal is severely limited by shot…