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Related papers: Electron Ptychography

200 papers

Low voltage scanning electron microscopy is a powerful tool for examining surface features and imaging beam sensitive materials. Improving resolution during low voltage imaging is then an important area of development. Decreasing the effect…

Instrumentation and Detectors · Physics 2022-12-07 Frances Quigley , Clive Downing , Cormac McGuinness , Lewys Jones

Shaping the electron wavefunction in three dimensions may prove to be an indispensable tool for research involving atomic-sized particle trapping, manipulation, and synthesis. We utilize computer-generated holograms to sculpt electron…

Instrumentation and Detectors · Physics 2017-03-13 Roy Shiloh , Ady Arie

Fourier ptychography microscopy (FPM) is a new computational imaging technique that can provide gigapixel images with both high resolution and a wide field of view (FOV). However, time consuming of the data-acquisition process is a critical…

Image and Video Processing · Electrical Eng. & Systems 2018-08-15 Ao Zhou , Ni Chen , Haichao Wang , Guohai Situ

Ever brighter light sources, fast parallel detectors, and advances in phase retrieval methods, have made ptychography a practical and popular imaging technique. Compared to previous techniques, ptychography provides superior robustness and…

Data Analysis, Statistics and Probability · Physics 2016-07-20 Stefano Marchesini , Hari Krishnan , Benedikt J. Daurer , David A. Shapiro , Talita Perciano , James A. Sethian , Filipe R. N. C. Maia

Electrical impedance tomography aims at reconstructing the conductivity inside a physical body from boundary measurements of current and voltage at a finite number of contact electrodes. In many practical applications, the shape of the…

Numerical Analysis · Mathematics 2017-03-08 Nuutti Hyvönen , Helle Majander , Stratos Staboulis

Ptychography provides high dose efficiency images that can reveal light elements next to heavy atoms. However, despite ptychography having an otherwise single signed contrast transfer function, contrast reversals can occur when the…

Applied Physics · Physics 2023-06-16 C. Gao , C. Hofer , T. J. Pennycook

Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annular dark-field imaging, produces easily-interpretable…

Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by…

Electron matter interactions in electron microscopy produce both elastic and inelastic scattering, forming the basis for imaging and spectroscopy. However, the integration of electron energy loss spectroscopy (EELS) with 4D-STEM and…

Materials Science · Physics 2025-07-22 Yu Lei , Peng Wang

Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three dimensions. We present a reconstruction algorithm that takes as input a focal…

Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial…

X-ray ptychography imaging at synchrotron facilities like the Advanced Photon Source (APS) involves controlling instrument hardwares to collect a set of diffraction patterns from overlapping coherent illumination spots on extended samples,…

Instrumentation and Detectors · Physics 2022-02-10 Ke Yue , Junjing Deng , Yi Jiang , Youssef Nashed , David Vine , Stefan Vogt

Modern electron tomography has progressed to higher resolution at lower doses by leveraging compressed sensing methods that minimize total variation (TV). However, these sparsity-emphasized reconstruction algorithms introduce tunable…

Medical Physics · Physics 2023-09-12 William Millsaps , Jonathan Schwartz , Zichao Wendy Di , Yi Jiang , Robert Hovden

Strain and defects in crystalline materials are responsible for the distinct mechanical, electric and magnetic properties of a desired material, making their study an essential task in material characterization, fabrication and design.…

Ptychography involves a sample being illuminated by a coherent, localised probe of illumination. When the probe interacts with the sample, the light is diffracted and a diffraction pattern is detected. Then the probe or sample is shifted…

Numerical Analysis · Mathematics 2023-05-09 Mark Philip Roach

In this article, we report some examples of how high-energy electron irradiation can be used as a tool for shaping material properties turning the generation of point-defects into an advantage beyond the presumed degradation of the…

Materials Science · Physics 2023-09-04 A. Alessi , O. Cavani , R. Grasset , H. -J. Drouhin , V. I. Safarov , M. Konczykowski

Analytical electron microscopy and spectroscopy of biological specimens, polymers, and other beam sensitive materials has been a challenging area due to irradiation damage. There is a pressing need to develop novel imaging and spectroscopic…

Machine Learning · Computer Science 2017-07-14 Yan Zhang , G. M. Dilshan Godaliyadda , Nicola Ferrier , Emine B. Gulsoy , Charles A. Bouman , Charudatta Phatak

Muon tomography is a relatively new method of radiography that utilizes muons from cosmic rays and their multiple Coulomb scattering property to distinguish materials. Researchers around the world have been developing various detection…

Instrumentation and Detectors · Physics 2019-12-20 Weihe Zeng , Xingyu Pan , Zhi Zeng , Hao Ma , Ming Zeng , Jianping Cheng

Ptychography is an imaging technique which involves a sample being illuminated by a coherent, localized probe of illumination. When the probe interacts with the sample, the light is diffracted and a diffraction pattern is detected. Then the…

Numerical Analysis · Mathematics 2023-01-31 Mark Iwen , Michael Perlmutter , Mark Philip Roach

By profiting from recent developments in detector technologies, making it possible to access a stream of detection events with few-ns time resolutions, a new ptychographic workflow is established. This methodological framework, referred to…

Applied Physics · Physics 2026-03-27 Hoelen L. Lalandec Robert , Arno Annys , Tamazouzt Chennit , Jo Verbeeck