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One-shot devices data represent an extreme case of interval censoring.Some kind of one-shot units do not get destroyed when tested, and so, survival units can continue within the test providing extra information about their lifetime.…
One-shot devices analysis involves an extreme case of interval censoring, wherein one can only know whether the failure time is either before or after the test time. Some kind of one-shot devices do not get destroyed when tested, and so can…
The prevalence of one-shot devices is quite prolific in engineering and medical domains. Unlike typical one-shot devices, nondestructive one-shot devices (NOSD) may survive multiple tests and offer additional data for reliability…
Many modern products exhibit high reliability, often resulting in long times to failure. Consequently, conducting experiments under normal operating conditions may require an impractically long duration to obtain sufficient failure data for…
A one-shot device is a unit that operates only once, after which it is either destroyed or needs to be rebuilt. For this type of device, the operational status can only be assessed at a specific inspection time, determining whether failure…
Many modern products exhibit high reliability under normal operating conditions. Conducting life tests under these conditions may result in very few observed failures, insufficient for accurate inferences. Instead, accelerated life tests…
In the literature, the reliability analysis of one-shot devices is found under accelerated life testing in the presence of various stress factors. The application of one-shot devices can be extended to the bio-medical field, where we often…
Accelerated life-tests (ALTs) are used for inferring lifetime characteristics of highly reliable products. In particular, step-stress ALTs increase the stress level at which units under test are subject at certain pre-fixed times, thus…
The present study aims to determine the lifetime prognosis of highly durable nondestructive one-shot devices (NOSD) units under a step-stress accelerated life testing (SSALT) experiment applying a cumulative risk model (CRM). In an SSALT…
This paper develops a new family of estimators, the minimum density power divergence estimators (MDPDEs), for the parameters of the one-shot device model as well as a new family of test statistics, Z-type test statistics based on MDPDEs,…
Many modern products are highly reliable, often exhibiting long lifetimes. As a result, conducting experiments under normal operating conditions can be prohibitively time-consuming to collect sufficient failure data for robust statistical…
Accelerated life tests (ALTs) play a crucial role in reliability analyses, providing lifetime estimates of highly reliable products. Among ALTs, step-stress design increases the stress level at predefined times, while maintaining a constant…
Many real-life data sets can be analyzed using Linear Mixed Models (LMMs). Since these are ordinarily based on normality assumptions, under small deviations from the model the inference can be highly unstable when the associated parameters…
In various practical situations, we encounter data from stochastic processes which can be efficiently modelled by an appropriate parametric model for subsequent statistical analyses. Unfortunately, the most common estimation and inference…
The minimum density power divergence estimator (MDPDE) has gained significant attention in the literature of robust inference due to its strong robustness properties and high asymptotic efficiency; it is relatively easy to compute and can…
Accurate estimation of parameters is paramount in developing high-fidelity models for complex dynamical systems. Model-based optimal experiment design (OED) approaches enable systematic design of dynamic experiments to generate input-output…
The semi-parametric Cox proportional hazards regression model has been widely used for many years in several applied sciences. However, a fully parametric proportional hazards model, if appropriately assumed, can often lead to more…
Recently, a growing amount interest is quite evident in modelling dependent competing risks in life time prognosis problem. In this work, we propose to model the dependent competing risks by Marshal-Olkin bivariate exponential distribution.…
Model selection is a cornerstone of statistical inference, where information criteria are widely employed to balance model fit and complexity. However, classical likelihood-based criteria are often highly sensitive to contamination,…
Most work on one-shot devices assume that there is only one possible cause of device failure. However, in practice, it is often the case that the products under study can experience any one of various possible causes of failure. Robust…