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Images from adaptive optics systems are generally affected by significant distortions of the point spread function (PSF) across the field of view, depending on the position of natural and artificial guide stars. Image reduction techniques…
Blind deconvolution is the problem of recovering a sharp image and a blur kernel from a noisy blurry image. Recently, there has been a significant effort on understanding the basic mechanisms to solve blind deconvolution. While this effort…
A novel phase retrieval algorithm for broadband hyperspectral phase imaging from noisy intensity observations is proposed. It utilizes advantages of the Fourier Transform spectroscopy in the self-referencing optical setup and provides,…
Aberration-corrected scanning transmission electron microscopes (STEM) provide sub-angstrom lateral resolution; however, the large convergence angle greatly reduces the depth of field. For microscopes with a small depth of field,…
We propose a solution to the image deconvolution problem where the convolution kernel or point spread function (PSF) is assumed to be only partially known. Small perturbations generated from the model are exploited to produce a few…
Microscopy such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) are essential tools in material imaging at micro- and nanoscale resolutions to extract physical knowledge and…
Deconvolution is a fundamental inverse problem in signal processing and the prototypical model for recovering a signal from its noisy measurement. Nevertheless, the majority of model-based inversion techniques require knowledge on the…
The paper introduces the weighted convolution, a novel approach to the convolution for signals defined on regular grids (e.g., 2D images) through the application of an optimal density function to scale the contribution of neighbouring…
The goal of this note is to state the optimal decay rate for solutions of the nonlinear fast diffusion equation and, in self-similar variables, the optimal convergence rates to Barenblatt self-similar profiles and their generalizations. It…
Image blurring refers to the degradation of an image wherein the image's overall sharpness decreases. Image blurring is caused by several factors. Additionally, during the image acquisition process, noise may get added to the image. Such a…
In multi-photon microscopy (MPM), a recent in-vivo fluorescence microscopy system, the task of image restoration can be decomposed into two interlinked inverse problems: firstly, the characterization of the Point Spread Function (PSF) and…
Examining the detailed structure of galaxy populations provides valuable insights into their formation and evolution mechanisms. Significant barriers to such analysis are the non-trivial noise properties of real astronomical images and the…
Deconvolution is a statistical inverse problem to estimate the distribution of a random variable based on its noisy observations. Despite the extensive studies on the topic, deconvolution with unknown noise distribution remains as a…
This study introduces {\tt{PI-AstroDeconv}}, a physics-informed semi-supervised learning method specifically designed for removing beam effects in astronomical telescope observation systems. The method utilizes an encoder-decoder network…
Image subtraction is essential for transient detection in time-domain astronomy. The point spread function (PSF), photometric scaling, and sky background generally vary with time and across the field-of-view for imaging data taken with…
In this paper the dynamical spin effects of the light-front holographic wavefunctions for light pseudoscalar mesons are studied using two different assumptions. These improved wavefunctions are then confronted with a number of sensitive…
Fluorescence lifetime imaging microscopy (FLIM) systems are limited by their slow processing speed, low signal-to-noise ratio (SNR), and expensive and challenging hardware setups. In this work, we demonstrate applying a denoising…
Ptychography involves a sample being illuminated by a coherent, localised probe of illumination. When the probe interacts with the sample, the light is diffracted and a diffraction pattern is detected. Then the probe or sample is shifted…
Super-resolution microscopes (such as STED) illuminate samples with a tiny spot, and achieve very high resolution. But structures smaller than the spot cannot be resolved in this way. Therefore, we propose a technique to solve this problem.…
Lattice strain measurement of nanoscale semiconductor devices is crucial for the semiconductor industry as strain substantially improves the electrical performance of transistors. High resolution scanning transmission electron microscopy…