Related papers: Soft Error Rate in Space: A Unified Analytical App…
A simple physical model for calculation of the ion-induced soft error rate in space environment has been proposed, based on the phenomenological cross section notion. Proposed numerical procedure is adapted to the multiple cell upset…
A self-consistent procedure for the ion-induced soft error rate calculation in space environment taking into account Error Correcting Codes is proposed. The method is based on the partitioning of the multiple cell events into groups with…
In this paper, we present an accurate but very fast soft error rate (SER) estimation technique for digital circuits based on error propagation probability (EPP) computation. Experiments results and comparison of the results with the random…
As technology scales, nano-scale digital circuits face heightened susceptibility to single event upsets (SEUs) and transients (SETs) due to shrinking feature sizes and reduced operating voltages. While logical, electrical, and timing…
A procedure of space proton-induced Soft Error Rate calculation based on heavy ion testing data is proposed. The approach relies on Geant4-assisted Monte Carlo simulation of the secondary particle LET spectra produced by proton…
The soft error rate (SER) of integrated circuits (ICs) operating in space environment may vary by several orders of magnitude due to the variable intensity of radiation exposure. To ensure the radiation hardness without compromising the…
This paper addresses the problem of unsupervised soft bit error rate (BER) estimation for any communications system, where no prior knowledge either about transmitted information bits, or the transceiver scheme is available. We show that…
Over past years, the easy accessibility to the large scale datasets has significantly shifted the paradigm for developing highly accurate prediction models that are driven from Neural Network (NN). These models can be potentially impacted…
A single event upset (SEU) is a critical soft error that occurs in semiconductor devices on exposure to ionising particles from space environments. SEUs cause bit flips in the memory component of semiconductors. This creates a multitude of…
The aim of this paper is the modeling and simulation of impact of space radiation variability on total dose and single event effects in spaceborne electronics. It has been shown that the simultaneous thermal annealing may lead to…
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and supply/threshold voltage scaling reduces noise margins. It is…
A simple and self-consistent approach has been proposed for simulation of the proton-induced soft error rate based on the heavy ion induced single event upset cross-section data and vice versa. The approach relies on the GEANT4 assisted…
Physical symmetries provide a strong inductive bias for constructing functions to analyze data. In particular, this bias may improve robustness, data efficiency, and interpretability of machine learning models. However, building machine…
Atmospheric attenuation, atmospheric turbulence, geometric spread, and pointing errors, degrade the performance of free-space optical transmission. In the weak turbulence regime, the probability density function describing the distribution…
For the diffraction of an incident plane electromagnetic wave by a slotted metallic film, the previous analytical calculation for a single slot [Technical Phys. 50, 1076 (2005)] is generalized into a model for an arbitrary linear array of…
The typical model for measurement noise in quantum error correction is to randomly flip the binary measurement outcome. In experiments, measurements yield much richer information - e.g., continuous current values, discrete photon counts -…
Whether it is oil and gas exploration or geological science research, it is necessary to accurately grasp the structural information of underground media. Full waveform inversion is currently the most popular seismic wave inversion method,…
High-throughput optical communication systems utilize binary soft-decision forward error correction (SD-FEC) with bit interleaving over the bit channels. The generalized mutual information (GMI) is an achievable information rate (AIR) in…
Estimating the probability of rare failure events is an essential step in the reliability assessment of engineering systems. Computing this failure probability for complex non-linear systems is challenging, and has recently spurred the…
Soft errors in large VLSI circuits pose dramatic influence on computing- and memory-intensive neural network (NN) processing. Understanding the influence of soft errors on NNs is critical to protect against soft errors for reliable NN…