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We present a high-resolution microwave spectrometer to measure the frequency-dependent complex conductivity of a superconducting thin film near the critical temperature. The instrument is based on a broadband measurement of the complex…

Exact analytical results (in terms of Bessel functions) for the bandgaps, reflectance, and transmittance of one-dimensional photonic crystals with a sawtooth refractive index profile on the period are derived for the first time. This…

Uncertainties of refractive and group index in dispersion measurement by spectrally resolved white light interferometry are deeply analyzed. First, the contribution to uncertainty of the different parameters affecting both indices is…

Silicon and germanium are perhaps the two most well-understood semiconductor materials in the context of solid state device technologies and more recently micromachining and nanotechnology. Meanwhile, these two materials are also important…

Electron backscatter diffraction (EBSD) is a well-established method of characterisation for crystalline materials. This technique can rapidly acquire and index diffraction patterns to provide phase and orientation information about the…

We analyzed the behavior of the complex Fourier spectrum of the angle-resolved light scattering pattern (LSP) of a sphere in the framework of the Wentzel-Kramers-Brillouin (WKB) approximation. Specifically, we showed that the phase value at…

Using the Cryogenic, High-Accuracy Refraction Measuring System (CHARMS) at NASA's Goddard Space Flight Center, we have measured the absolute refractive index of five specimens taken from a very large boule of Corning 7980 fused silica from…

Phase-sensitive integrated photonic devices are highly susceptible to minor manufacturing deviations, resulting in significant performance inconsistencies. This variability has limited the scalability and widespread adoption of these…

We present a full-spectrum machine learning framework for refractive index sensing using simulated absorption spectra from meta-grating structures composed of titanium or silicon nanorods under TE and TM polarizations. Linear regression was…

Precise measurement of the refractive index of stable silicon isotopes $^{28}$Si, $^{29}$Si, $^{30}$Si single crystals with enrichments above 99.9 at.% and a silicon single crystal $^{nat}$Si of natural isotopic composition is performed…

We further miniaturize a recently established silver-based negative-index metamaterial design. By comparing transmittance, reflectance and phase-sensitive time-of-flight experiments to theory, we infer a real part of the refractive index of…

Materials combining both a high refractive index and a wide band gap are of great interest for optoelectronic and sensor applications. However, these two properties are typically described by an inverse correlation with high refractive…

We report the observation of imaging beyond the diffraction limit due to bound surface states in negative refraction photonic crystals. We achieve an effective negative index figure-of-merit [-Re(n)/Im(n)] of at least 380, ~125x improvement…

There are two main physical properties needed to fabricate 1D photonic structures and form perfect photonic bandgaps: the quality of the thickness periodicity and the refractive index of their components. Porous silicon (PS) is a…

We present a metamaterial-based terahertz (THz) sensor for thickness measurements of subwavelength-thin materials and refractometry of liquids and liquid mixtures. The sensor operates in reflection geometry and exploits the frequency shift…

The refractive index of silicon at $\gamma$-ray energies from 181 - 1959 keV was investigated using the GAMS6 double crystal spectrometer and found to follow the predictions of the classical scattering model. This is in contrast to earlier…

Fully reconfigurable metasurfaces would enable new classes of optical devices that provide unprecedented control of electromagnetic beamforms. The principal challenge for achieving reconfigurability is the need to generate large tunability…

We report extensive enhancement in the refractive index of artificially designed metamaterials by exploiting the deep subwavelength coupling in a free-standing, thin-film metal-dielectric-metal checkboard structure. A record high refractive…

Increasing the refractive index available for optical and nanophotonic systems opens new vistas for design: for applications ranging from broadband metalenses to ultrathin photovoltaics to high-quality-factor resonators, higher index…

Resistivity is one of the most important characteristics in the semiconductor industry. The most common way to measure resistivity is the four-point probe method, which requires physical contact with the material under test. Terahertz time…