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Adaptive measurements were recently shown to significantly improve the performance of quantum state tomography. Utilizing information about the system for the on-line choice of optimal measurements allows to reach the ultimate bounds of…
Scanning Electron Microscopy (SEM) is critical in nanotechnology, materials science, and biological imaging due to its high spatial resolution and depth of focus. Signal-to-noise ratio (SNR) is an essential parameter in SEM because it…
The evolution of the scanning modules for scanning transmission electron microscopes (STEM) has realized the possibility to generate arbitrary scan pathways, an approach currently explored to improve acquisition speed and to reduce electron…
Novel schemes for generating ultra-low emittance electron beams have been developed in the last years and promise compact particle sources with excellent beam quality suitable for future high-energy physics experiments and free-electron…
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with electron scattering simulations. However, using the…
This paper investigates robust beamforming for system-centric energy efficiency (EE) optimization in the vehicular integrated sensing and communication (ISAC) system, where the mobility of vehicles poses significant challenges to channel…
The standard beam management procedure in 5G requires the user equipment (UE) to periodically measure the received signal reference power (RSRP) on each of a set of beams proposed by the basestation (BS). It is prohibitively expensive to…
Electron microscopes have been improved to achieve ever smaller beam spots, a key parameter that determines the instrument's resolution. The techniques to measure the size of the beam, however, have not progressed to the same degree. There…
Correctly setting the parameters of a production machine is essential to improve product quality, increase efficiency, and reduce production costs while also supporting sustainability goals. Identifying optimal parameters involves an…
A way to lower computational cost in large scale inverse problems and problems depending on poorly known model parameters is to replace the detailed model by an approximate one. Inverse problems are typically ill-posed, and the model…
We develop a new approach to robust adaptive beamforming in the presence of signal steering vector errors. Since the signal steering vector is known imprecisely, its presumed (prior) value is used to find a more accurate estimate of the…
This paper proposes a model-based optimization method for the production of automotive seals in an extrusion process. The high production throughput, coupled with quality constraints and the inherent uncertainty of the process, encourages…
The highly energetic electrons in a transmission electron microscope (TEM) can alter or even completely destroy the structure of samples before sufficient information can be obtained. This is especially problematic in the case of zeolites,…
The beam squint effect, which manifests in different steering matrices in different sub-bands, has been widely considered a challenge in millimeter wave (mmWave) multiinput multi-output (MIMO) channel estimation. Existing methods either…
The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…
In preparation for operation of multiple Rare Isotope Beams (RIBs) when the Advanced Rare Isotope Laboratory (ARIEL) becomes operational, TRIUMF embarked on a program of advanced beam tuning applications and machine learning tools. The…
The manuscript considers Scanning Transmission Electron Microscopy (STEM) images and derives transformations needed to correct various distortions occurring during scanning. These transformations form the basis for the correction algorithms…
Even with the recent rapid developments in quantum hardware, noise remains the biggest challenge for the practical applications of any near-term quantum devices. Full quantum error correction cannot be implemented in these devices due to…
We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving structural analysis of materials at the atomic scale. This…
The convergence of expectation-maximization (EM)-based algorithms typically requires continuity of the likelihood function with respect to all the unknown parameters (optimization variables). The requirement is not met when parameters…