Related papers: Differential Magnetic Force Microscopy with a Swit…
Frequency dependent dynamic behavior in Piezoresponse Force Microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analyzed using a combination of modeling and experimental measurements. The PFM signal comprises…
Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…
We present a detailed experimental study on the electrostatic interaction between a quantum dot and the metallic tip of a scanning force microscope. Our method allowed us to quantitatively map the tip-induced potential and to determine the…
We discuss the influence of external forces on the motion of the tip in dynamic atomic force microscopy (AFM). First, a compact solution for the steady-state problem is derived employing a Fourier approach. Founding on this solution, we…
The computer processing of images of magnetic force microscopy of cobalt nanodots was performed. The solution of reverse task of magnetic force microscopy is obtained for surface points of samples. Superposition of fields, which are…
Magnetic force microscopy is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative spatially resolved magnetization data in units of A/m by determining…
Recently experimental techniques, such as magnetic force microscopy (MFM), have enabled the magnetic state of individual sub-micron particles to be resolved. Motivated by these experimental developments, we use Monte Carlo simulations of…
Force spectroscopy using magnetic tweezers (MT) is a powerful method to probe the physical characteristics of single polymers. Typically, molecules are functionalized for specific attachment to a glass surface at one end and a micron-scale…
We propose a novel high resolution microscopy technique for enantio-specific detection of chiral samples down to sub-100 nm size, based on force measurement. We delve into the differential photo-induced optical force exerted on an achiral…
The invention of scanning probe microscopy has revolutionized the way electronic phenomena are visualized. While present-day probes can access a variety of electronic properties at a single location in space, a scanning microscope that can…
When light illuminates the junction formed between a sharp metal tip and a sample, different mechanisms can con-tribute to the measured photo-induced force simultaneously. Of particular interest are the instantaneous force be-tween the…
We propose and evaluate a new type of optical force microscope based on a standing wave optical trap. Our microscope, calibrated in-situ and operating in a dynamic mode, is able to trap, without heating, a single metallic nanoparticle of…
Stacking van der Waals magnets holds promise for creating new hybrid materials with properties that do not exist in bulk materials. Here we investigate orthogonally twisted stacks of the van der Waals antiferromagnet CrSBr, aiming to…
Magnetic force microscopy (MFM) signals have recently been detected from whole pieces of mechanically exfoliated graphene and molybdenum disulfide (MoS2) nanosheets and magnetism of the two nanomaterials was claimed based on these…
The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{\"i}dal probe and the surface. From this measure one can…
It was shown recently that the Force Feedback Microscope can avoid the jump-to-contact in Atomic force Microscopy even when the cantilevers used are very soft, thus increasing force resolution. In this letter, we explore theoretical aspects…
Using a magnetic resonance force microscope (MRFM), the power emitted by a spin transfer nano-oscillator consisting of a normally magnetized Py$|$Cu$|$Py circular nanopillar is measured both in the autonomous and forced regimes. From the…
In this work we present a novel, compact, power efficient magnetic field source design for magnetic field imaging microscopy. The device is based on a pair of diametrically magnetized permanent magnet cylinders with electro-mechanical…
Self-assembled nanowire (NW) crystals can be grown into nearly defect-free nanomechanical resonators with exceptional properties, including small motional mass, high resonant frequency, and low dissipation. Furthermore, by virtue of slight…
We consider a simple version of a cyclic adiabatic inversion (CAI) technique in magnetic resonance force microscopy (MRFM). We study the problem: What component of the spin is measured in the CAI MRFM? We show that the non-destructive…