Related papers: Differential Magnetic Force Microscopy with a Swit…
A method for the separation and quantitative characterization of the electrostatic and Van der Waals contribution to tip-sample interaction in non-contact Scanning Force Microscopy is presented. It is based on the simultaneous measurement…
Magnetic force microscopy (MFM) is long established as a powerful tool for probing the local manifestation of magnetic nanostructures across a range of temperatures and applied stimuli. A major drawback of the technique, however, is that…
We report a new spin manipulation protocol for periodically reversing the sample magnetization for Magnetic Resonance Force Microscopy. The protocol modulates the microwave excitation frequency synchronously with the position of the…
A number of aspects of magnetic force microscopy (MFM) specific to the imaging of hard magnetic films have been studied. Firstly, we show that topographic images made in tapping mode with probes characterized by the moderate cantilever…
The magnetic moment of a single spin interacting with a cantilever in magnetic resonance force microscopy (MRFM) experiences quantum jumps in orientation rather than smooth oscillations. These jumps cannot be detected by a conventional MRFM…
We present an alternative switching-magnetization magnetic force microscopy (SM- MFM) method using planar tip-on-chip probes. Unlike traditional needle-like tips, the planar probe approach integrates a microdevice near the tip apex with…
In this paper, we present a focused-ion-beam-assisted method for preparing magnet tips for magnetic resonance force microscopy measurements. The method electrostatically transfers prefabricated magnetic nanoparticles to microcantilevers,…
Torsional harmonic cantilevers allow measurement of time varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate…
Magnetic Resonance Force Microscopy (MRFM) is a powerful technique to detect a small number of spins that relies on force-detection by an ultrasoft magnetically tipped cantilever and selective magnetic resonance manipulation of the spins.…
A recent advance in improving the spatial resolution of magnetic force microscopy (MFM) uses as sensor tips carbon nanotubes grown at the apex of conventional silicon cantilever pyramids and coated with a thin ferromagnetic layer. Magnetic…
Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…
Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a…
We have developed the experimental approach to characterize spatial distribution of the magnetic field produced by cantilever tips used in magnetic resonance force microscopy (MRFM). We performed MRFM measurements on a well characterized…
The electric forces acting on an atomic force microscope tip in solution have been measured using a microelectrochemical cell formed by two periodically biased electrodes. The forces were measured as a function of lift height and bias…
We study a model of a magnetic resonance force microscope (MRFM) based on the cyclic adiabatic inversion technique as a high-resolution tool to detect single electron spins. We investigate the quantum dynamics of spin and cantilever in the…
We have studied theoretically magnetic resonance force microscopy (MRFM) with a high frequency nanomechanical cantilever when the cantilever frequency matches the resonant frequency of a single electron spin. Our estimations show that in…
Mechanical properties of biological samples have been imaged with a \textit{Force Feedback Microscope}. Force, force gradient and dissipation are measured simultaneously and quantitatively, merely knowing the AFM cantilever spring constant.…
We study theoretically the magnetic resonance force microscopy (MRFM) in oscillating cantilever-driven adiabatic reversals (OSCAR) technique, for the case when the cantilever tip oscillates parallel to the surface of a sample. The main…
Atomic force microscope (AFM) generally works on the basis of manipulating absolute magnitude of van der Waals (vdW) force between the tip and specimen. The force is, however, less sensitive to alternation of atom species than to tip-sample…
Magnetic force microscopy (MFM) allows detection of stray magnetic fields around magnetic materials and the two-dimensional visualization of these fields. This paper presents a theoretical analysis of the oscillations of an MFM tip above a…