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Image matching is a fundamental and critical task of multisource remote sensing image applications. However, remote sensing images are susceptible to various noises. Accordingly, how to effectively achieve accurate matching in noise images…
Automated experimentation with real time data analysis in scanning transmission electron microscopy (STEM) often require end-to-end framework. The four-dimensional scanning transmission electron microscopy (4D-STEM) with high-throughput…
Traditional metrics for evaluating the efficacy of image processing techniques do not lend themselves to understanding the capabilities and limitations of modern image processing methods - particularly those enabled by deep learning. When…
Many imaging modalities involve reconstruction of unknown objects from collections of noisy projections related by random rotations. In one of these modalities, cryogenic electron microscopy (cryo-EM), the extremely low signal-to-noise…
Secondary electron (SE) imaging techniques, such as scanning electron microscopy and helium ion microscopy (HIM), use electrons emitted by a sample in response to a focused beam of charged particles incident at a grid of raster scan…
Laser cutting of semiconductor wafers and transparent dielectrics has become a dominant process in manufacturing industries, encompassing a wide range of applications from flat display panels to microelectronic chips. Limited by the…
Introduction. Noisy measurements frequently cause noisy and inaccurate images in impedance imaging. No post-processing technique exists to calculate the propagation of measurement noise and use this to suppress noise in the image.…
In this study, we have used a Zr-Nb alloy containing well-defined nano-precipitates as a model material in which to study imaging contrast inversions (atomic number or diffraction contrast) observed with the forescattered electron imaging…
Patient scans from MRI often suffer from noise, which hampers the diagnostic capability of such images. As a method to mitigate such artifact, denoising is largely studied both within the medical imaging community and beyond the community…
Scanning Transmission Electron Microscopy (STEM) has become the main stay for materials characterization on atomic level, with applications ranging from visualization of localized and extended defects to mapping order parameter fields. In…
Cryo-electron microscopy (cryo-EM) has achieved near-atomic level resolution of biomolecules by reconstructing 2D micrographs. However, the resolution and accuracy of the reconstructed particles are significantly reduced due to the…
In this research work, we have demonstrated the application of Mask-RCNN (Regional Convolutional Neural Network), a deep-learning algorithm for computer vision and specifically object detection, to semiconductor defect inspection domain.…
An undesirable side effect of reversible color space transformation, which consists of lifting steps (LSs), is that while removing correlation it contaminates transformed components with noise from other components. Noise affects…
Aberration corrected scanning transmission electron microscopes (STEM) enable to determine local strain fields, composition and bonding states at atomic resolution. The precision to locate atomic columns is often obstructed by scan…
Traditional image acquisition for cryo focused ion-beam scanning electron microscopy tomography often sees thousands of images being captured over a period of many hours, with immense data sets being produced. When imaging beam sensitive…
The nature of optical metrology is to perform efficient transfer and precise retrieval for lasers and optical signals, which is beneficial for a variety of applications ranging from optical clocking, spectroscopy, to telecommunications and…
In the Reverse Engineering and Hardware Assurance domain, a majority of the data acquisition is done through electron microscopy techniques such as Scanning Electron Microscopy (SEM). However, unlike its counterparts in optical imaging,…
Transmission electron microscope (TEM) images are often corrupted by noise, hindering their interpretation. To address this issue, we propose a deep learning-based approach using simulated images. Using density functional theory…
Although defocus can be used to generate partial phase contrast in transmission electron microscope images, cryo-electron microscopy (cryo-EM) can be further improved by the development of phase plates which increase contrast by applying a…
Single-beam scanning electron microscopes (SEM) are widely used to acquire massive data sets for biomedical study, material analysis, and fabrication inspection. Datasets are typically acquired with uniform acquisition: applying the…