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The scanning electron microscopy (SEM) is probably one the most fascinating examination approach that has been used since more than two decades to detailed inspection of micro scale objects. Most of the scanning electron microscopes could…

Computer Vision and Pattern Recognition · Computer Science 2016-02-18 Wichai Shanklin

Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by…

Scanning electron microscopy (SEM) has been widely utilized in the field of materials science due to its significant advantages, such as large depth of field, wide field of view, and excellent stereoscopic imaging. However, at high…

The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the…

Computer Vision and Pattern Recognition · Computer Science 2017-09-08 Shahar Tsiper , Or Dicker , Idan Kaizerman , Zeev Zohar , Mordechai Segev , Yonina C. Eldar

Modeling artificial scanning electron microscope (SEM) and scanning ion microscope images has recently become important. This is because of the need to provide repeatable images with a priori determined parameters. Modeled artificial images…

Instrumentation and Detectors · Physics 2015-05-19 Petr Cizmar , Andras E. Vladar , Michael T. Postek

The scanning electron microscope (SEM) delivers high resolution, high depth of focus and an image quality as if microscopic objects are seen by the naked eye. This makes it not only a powerful scientific instrument, but a tool inherently…

Applied Physics · Physics 2025-04-01 Casimir Kuzyk , Alexander Dimitrakopoulos , Alireza Nojeh

Scanning Electron Microscopy (SEM) is pivotal in revealing intricate micro- and nanoscale features across various research fields. However, obtaining high-resolution SEM images presents challenges, including prolonged scanning durations and…

Image and Video Processing · Electrical Eng. & Systems 2024-10-08 Tom Reclik , Setareh Medghalchi , Philipp Schumacher , Maximilian Wollenweber , Talal Al-Samman , Sandra Korte-Kerzel , Ulrich Kerzel

Microscopy images are powerful tools and widely used in the majority of research areas, such as biology, chemistry, physics and materials fields by various microscopies (scanning electron microscope (SEM), atomic force microscope (AFM) and…

Computer Vision and Pattern Recognition · Computer Science 2020-02-25 Israel Goytom , Qin Wang , Tianxiang Yu , Kunjie Dai , Kris Sankaran , Xinfei Zhou , Dongdong Lin

Scanning Transmission Electron Microscopy (STEM) has become the main stay for materials characterization on atomic level, with applications ranging from visualization of localized and extended defects to mapping order parameter fields. In…

Instrumentation and Detectors · Physics 2019-01-15 Xin Li , Ondrej Dyck , Sergei V. Kalinin , Stephen Jesse

We report resolution enhancement in scanning electron microscopy (SEM) images using a generative adversarial network. We demonstrate the veracity of this deep learning-based super-resolution technique by inferring unresolved features in…

Computer Vision and Pattern Recognition · Computer Science 2019-08-21 Kevin de Haan , Zachary S. Ballard , Yair Rivenson , Yichen Wu , Aydogan Ozcan

Scanning Transmission Electron Microscopy (STEM) offers high-resolution images that are used to quantify the nanoscale atomic structure and composition of materials and biological specimens. In many cases, however, the resolution is limited…

Signal Processing · Electrical Eng. & Systems 2021-12-23 Daniel Nicholls , Alex Robinson , Jack Wells , Amirafshar Moshtaghpour , Mounib Bahri , Angus Kirkland , Nigel Browning

Scanning electron microscopy (SEM) is indispensable in diverse applications ranging from microelectronics to food processing because it provides large depth-of-field images with a resolution beyond the optical diffraction limit. However,…

Recently it has been shown that precise dose control and an increase in the overall acquisition speed of atomic resolution scanning transmission electron microscope (STEM) images can be achieved by acquiring only a small fraction of the…

Semantic understanding of 3D scenes is essential for robots to operate effectively and safely in complex environments. Existing methods for semantic scene reconstruction and semantic-aware novel view synthesis often rely on dense multi-view…

Computer Vision and Pattern Recognition · Computer Science 2026-03-04 Sheng Ye , Zhen-Hui Dong , Ruoyu Fan , Tian Lv , Yong-Jin Liu

Single-beam scanning electron microscopes (SEM) are widely used to acquire massive data sets for biomedical study, material analysis, and fabrication inspection. Datasets are typically acquired with uniform acquisition: applying the…

Image and Video Processing · Electrical Eng. & Systems 2021-01-11 Lu Mi , Hao Wang , Yaron Meirovitch , Richard Schalek , Srinivas C. Turaga , Jeff W. Lichtman , Aravinthan D. T. Samuel , Nir Shavit

In electron microscopy, charging of non-conductive biological samples by focused electron beams hinders their high-resolution imaging. Gold or platinum coatings have been commonly used to prevent such sample charging, but it disables…

High resolution nanoscale imaging in liquid environments is crucial for studying molecular interactions in biological and chemical systems. In particular, electron microscopy is the gold-standard tool for nanoscale imaging, but its…

Soft Condensed Matter · Physics 2015-07-20 Wayne Yang , Yuning Zhang , Michael Hilke , Walter Reisner

This comprehensive review discusses the development of scanning electron microscopy and the application of this technology in different fields such as biology, nanobiotechnology and biomedical science. Besides being a tool for high…

Quantitative Methods · Quantitative Biology 2023-11-02 Aniruddha Acharya

Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20…

Instrumentation and Detectors · Physics 2016-01-06 Ing-Shouh Hwang

We demonstrate a multi-beam scanning transmission electron microscopy (STEM) imaging that integrates down-sampling with super-resolution image reconstruction via a compressive sensing framework. A custom condenser aperture with six randomly…

Instrumentation and Detectors · Physics 2026-03-19 Akira Yasuhara , Takumi Sannomiya , Ryoichi Horisaki
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