Related papers: BEACON -- Automated Aberration Correction for Scan…
Lensfree on-chip microscopy is an emerging imaging technique that can be used to visualize and study biological specimens without the need for imaging lens systems. Important issues that can limit the performance of lensfree on-chip…
Aberration-corrected scanning transmission electron microscopes (STEM) provide sub-angstrom lateral resolution; however, the large convergence angle greatly reduces the depth of field. For microscopes with a small depth of field,…
Achieving atomic resolution in electron microscopy has historically been hindered by spherical aberration, a fundamental limitation of conventional electron lenses. Its correction typically requires complex assemblies of electromagnetic…
Neural sequence-to-sequence systems deliver state-of-the-art performance for automatic speech recognition. When using appropriate modeling units, e.g., byte-pair encoding, these systems are in principle open vocabulary systems. In practice,…
Fast frame-rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling electron beam dose, capturing in-situ events or reducing the appearance of scan distortions. Whilst several strategies exist…
Aberration correctors are essential elements for achieving atomic resolution in state-of-the-art electron microscopes. Conventional correctors are based on a series of multipolar electron lenses, but more versatile alternatives are…
Doing quantitative computed tomography (CT) using Bremsstrahlung sources requires an estimate of the spectrum emitted by the X-ray source. One method of beam hardening correction (BHC), as described by Lifton[1], first uses transmission…
The optics of any camera degrades the sharpness of photographs, which is a key visual quality criterion. This degradation is characterized by the point-spread function (PSF), which depends on the wavelengths of light and is variable across…
This paper presents a new preprocessing method to correct blinking artifacts in Electroencephalography (EEG) based Brain-Computer Interfaces (BCIs). This Algorithm for Blink Correction (ABC) directly corrects the signal in the time domain…
Photon attenuation and scatter are the two main physical factors affecting the diagnostic quality of SPECT in its applications in brain imaging. In this work, we present a novel Bayesian Optimization approach for Attenuation Correction…
We theoretically demonstrate that ponderomotive interactions near the electron cross-over can be used for aberration correction in ultrafast electron microscopes. Highly magnified electron shadow images from Si$_3$N$_4$ thin films are…
Sampling multiple responses is a common way to improve LLM output quality, but it comes at the cost of additional computation. The key challenge is deciding when to stop generating new samples to balance accuracy gains against efficiency.…
The single sideband (SSB) framework of analytical electron ptychography can account for the presence of residual geometrical aberrations induced by the probe-forming lens. However, the accuracy of this aberration correction method is highly…
Diffraction-limited imaging in epi-fluorescence microscopy remains a challenge when sample aberrations are present or when the region of interest rests deep within an inhomogeneous medium. Adaptive optics is an attractive solution albeit…
Reliable transmission of quantum optical states through real-world environments is key for quantum communication and imaging. Yet, aberrations and scattering in the propagation path can scramble the transmitted signal and hinder its use. A…
Aligning beamlines at synchrotron light sources is a high-dimensional, expensive-to-sample optimization problem, as beams are focused using a series of dynamic optical components. Bayesian Optimization is an efficient machine learning…
The correction of multiple aberrations in an optical system requires different optical elements, which increases its cost and complexity. Metasurfaces hold great promise to providing new functionality for miniaturized and low-cost optical…
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher voltages. To improve resolution, spherical aberration can be…
In the scanning transmission electron microscope, fast-scanning and frame-averaging are two widely used approaches for reducing electron-beam damage and increasing image signal-noise ratio which require no additional specialised hardware.…
Noise bias is a significant source of systematic error in weak gravitational lensing measurements that must be corrected to satisfy the stringent standards of modern imaging surveys in the era of precision cosmology. This paper reviews the…