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Particle Size Analysis (PSA) is an important process carried out in a number of industries, which can significantly influence the properties of the final product. A ubiquitous instrument for this purpose is the Optical Microscope (OM).…

Image and Video Processing · Electrical Eng. & Systems 2020-10-26 Sarvesh Patil , Chava Y P D Phani Rajanish , Naveen Margankunte

This paper discusses the reconstruction of partially sampled spectrum-images to accelerate the acquisition in scanning transmission electron microscopy (STEM). The problem of image reconstruction has been widely considered in the literature…

Image and Video Processing · Electrical Eng. & Systems 2020-02-05 Etienne Monier , Thomas Oberlin , Nathalie Brun , Xiaoyan Li , Marcel Tencé , Nicolas Dobigeon

With the advent of smart devices that support 4K and 8K resolution, Single Image Super Resolution (SISR) has become an important computer vision problem. However, most super resolution deep networks are computationally very expensive. In…

Image and Video Processing · Electrical Eng. & Systems 2022-03-21 Kartikeya Bhardwaj , Milos Milosavljevic , Liam O'Neil , Dibakar Gope , Ramon Matas , Alex Chalfin , Naveen Suda , Lingchuan Meng , Danny Loh

Aberration-corrected optics have made electron microscopy at atomic-resolution a widespread and often essential tool for nanocharacterization. Image resolution is dominated by beam energy and the numerical aperture of the lens ({\alpha}),…

(Scanning) transmission electron microscopy ((S)TEM) has significantly advanced materials science but faces challenges in correlating precise atomic structure information with the functional properties of devices due to its time-intensive…

Microscopic characterizations, such as Scanning Electron Microscopy (SEM), are widely used in scientific research for visualizing and analyzing microstructures. Determining the scale bars is an important first step of accurate SEM analysis;…

Computer Vision and Pattern Recognition · Computer Science 2025-10-14 Yuxuan Chen , Ruotong Yang , Zhengyang Zhang , Mehreen Ahmed , Yanming Wang

A non-linear system governed by multi-spatial and multi-temporal physics scales cannot be fully understood with a single diagnostic, as each provides only a partial view, leading to information loss. Combining multiple diagnostics may also…

We develop an imaging algorithm that exploits strong scattering to achieve super-resolution in changing random media. The method processes large and diverse array datasets using sparse dictionary learning, clustering, and multidimensional…

Surveillance scenarios are prone to several problems since they usually involve low-resolution footage, and there is no control of how far the subjects may be from the camera in the first place. This situation is suitable for the…

Computer Vision and Pattern Recognition · Computer Science 2021-01-27 Angelo G. Menezes

Central to the application of many multi-view geometry algorithms is the extraction of matching points between multiple viewpoints, enabling classical tasks such as camera pose estimation and 3D reconstruction. Many approaches that…

Computer Vision and Pattern Recognition · Computer Science 2021-10-15 Alexander Mai , Allen Yang , Dominique E. Meyer

In Environmental Scanning Electron Microscopy (ESEM) experiments, the acquisition parameters are generally kept constant throughout the collection of a data set. This limits data collection to one data set at a time, and frequent human…

In the last few years, several deep learning models, especially Generative Adversarial Networks have received a lot of attention for the task of Single Image Super-Resolution (SISR). These methods focus on building an end-to-end framework,…

Image and Video Processing · Electrical Eng. & Systems 2020-10-12 Vibhu Bhatia , Yatender Kumar

High resolution magnetic resonance~(MR) imaging~(MRI) is desirable in many clinical applications, however, there is a trade-off between resolution, speed of acquisition, and noise. It is common for MR images to have worse through-plane…

Image and Video Processing · Electrical Eng. & Systems 2018-02-27 Can Zhao , Aaron Carass , Blake E. Dewey , Jerry L. Prince

In this paper, we demonstrate a computationally efficient new approach based on deep learning (DL) techniques for analysis, design, and optimization of electromagnetic (EM) nanostructures. We use the strong correlation among features of a…

Machine Learning · Computer Science 2020-02-13 Yashar Kiarashinejad , Sajjad Abdollahramezani , Ali Adibi

Super-resolution imaging aims at improving the resolution of an image by enhancing it with other images or data that might have been acquired using different imaging techniques or modalities. In this paper we consider the task of doubling,…

Data Structures and Algorithms · Computer Science 2018-11-08 Andreas Alpers , Peter Gritzmann

Transmission Electron Microscopy (TEM) is a powerful tool for imaging material structure and characterizing material chemistry. Recent advances in data collection technology for TEM have enabled high-volume and high-resolution data…

Computer Vision and Pattern Recognition · Computer Science 2021-08-24 Josh Kacher , Yao Xie , Sven P. Voigt , Shixiang Zhu , Henry Yuchi , Jordan Key , Surya R. Kalidindi

Transmission electron microscopy (TEM) is a powerful imaging tool that has found broad application in materials science, nanoscience and biology(1-3). With the introduction of aberration-corrected electron lenses, both the spatial…

Background: Single-particle cryo-electron microscopy (cryo-EM) has become a popular tool for structural determination of biological macromolecular complexes. High-resolution cryo-EM reconstruction often requires hundreds of thousands of…

Data Analysis, Statistics and Probability · Physics 2017-09-05 Yanan Zhu , Qi Ouyang , Youdong Mao

Instance segmentation in electron microscopy (EM) volumes is tough due to complex shapes and sparse annotations. Self-supervised learning helps but still struggles with intricate visual patterns in EM. To address this, we propose a…

Computer Vision and Pattern Recognition · Computer Science 2023-09-06 Yinda Chen , Wei Huang , Xiaoyu Liu , Shiyu Deng , Qi Chen , Zhiwei Xiong

Structured Illumination Microscopy (SIM) allows access to spatial information beyond the diffraction limit by folding high frequency components into the optical system's base-band. Using various algorithmic techniques, an image containing…

Optics · Physics 2024-10-16 Doron Shterman , Guy Bartal