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Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as…

Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the number of secondary electrons from a material of interest, and…

The detection of spatial or temporal variations in very thin samples has important applications in the biological sciences. For example, cellular membranes exhibit changes in lipid composition and order, which in turn modulate their…

Recent work on atomic-precision dopant incorporation technologies has led to the creation of both boron and aluminum $\delta$-doped layers in silicon with densities above the solid solubility limit. We use density functional theory to…

Materials Science · Physics 2023-08-23 Quinn T. Campbell , Shashank Misra , Andrew D. Baczewski

Two-dimensional dopant layers ($\delta$-layers) in semiconductors provide the high-mobility electron liquids (2DELs) needed for nanoscale quantum-electronic devices. Key parameters such as carrier densities, effective masses, and…

Dielectric metasurfaces are structured thin films with thickness smaller than the wavelength that aim at replacing and enhancing conventional bulk optical components by structuring local resonances across an aperture. At visible and…

Nonlinear frequency conversion unlocks technologies ranging from telecommunications to quantum computation; however, weak nonlinearities and architectures that resist miniaturization currently limit devices. Here, we combine a…

Functional properties of transition-metal oxides strongly depend on crystallographic defects. In transition-metal-oxide electrocatalysts such as SrIrO3 (SIO), crystallographic lattice deviations can affect ionic diffusion and adsorbate…

When modelling discontinuities (interfaces) using the finite element method, the standard approach is to use a conforming finite-element mesh in which the mesh matches the interfaces. However, this approach can prove cumbersome if the…

Computational Engineering, Finance, and Science · Computer Science 2024-06-06 Jedrzej Dobrzanski , Kajetan Wojtacki , Stanislaw Stupkiewicz

This article discusses electromagnetic properties of volumetric metamaterial samples with essentially discrete structure, that is, assembled as a periodic array of electromagnetic resonators. We develop an efficient numerical procedure for…

Applied Physics · Physics 2025-09-19 Aleksander O. Makarenko , Maxim A. Yurkin , Alexey A. Shcherbakov , Mikhail Lapine

By patterning a freestanding dielectric membrane into a photonic crystal reflector (PCR), it is possible to resonantly enhance its normal-incidence reflectivity, thereby realizing a thin, single-material mirror. In many PCR applications,…

Periodic structures of phases with orientational order of molecules, but homogenous electron density distribution: a short pitch cholesteric, blue phase and twist-bend nematic phase, were probed by a resonant soft x-ray scattering (RSoXS)…

Soft Condensed Matter · Physics 2017-04-19 Mirosław Salamończyk , Nataša Vaupotič , Damian Pociecha , Cheng Wang , Chenhui Zhu , Ewa Gorecka

An application of resonant inelastic x-ray scattering technique for studying of optical scale excitations in electron-correlated materials is discussed. Examples are given including data obtained for 3d transition metal, lanthanide, and…

Strongly Correlated Electrons · Physics 2007-05-23 Sergei M. Butorin

Transient X-ray absorption techniques can measure ultrafast dynamics of the elemental edges in a material or multiple layer junction, giving them immense potential for deconvoluting concurrent processes. However, the interpretation of the…

Materials Science · Physics 2021-06-10 Hanzhe Liu , Isabel M. Klein , Jonathan M. Michelsen , Scott K. Cushing

A key optical parameter characterizing the existence of negative refraction in a thin layer of a composite material is the effective refractive index of an equivalent, homogenized layer with the same physical thickness as the initial…

The switching and optical properties of phase-change thin films are actively investigated for future smart optical devices. The possibility of having more than one stable state, the large optical contrast between phases, and the fast and…

Optics · Physics 2024-02-15 Daniel T. Yimam , Minpeng Liang , Jianting Ye , Bart J. Kooi

Scanning transmission electron microscopy (STEM) has become a cornerstone instrument for semiconductor materials metrology, enabling nanoscale analysis of complex multilayer structures that define device performance. Developing effective…

The traditional display of elements in the periodic table is convenient for the study of chemistry and physics. However, the atomic number alone is insufficient for training statistical machine learning models to describe and extract…

Materials Science · Physics 2023-08-25 Anthony Onwuli , Ashish V. Hegde , Kevin Nguyen , Keith T. Butler , Aron Walsh

For reconstruction of the spatial structure of many-component objects, it is proposed to use multi-radiography with detection of X-ray by combined detector arrays using detectors of ``scintillator-photodiode'' type. A theoretical model has…

Instrumentation and Detectors · Physics 2007-05-23 S. V. Naydenov , V. D. Ryzhikov , B. V. Grinyov , E. K. Lisetskaya , A. D. Opolonin , D. N. Kozin

In this article we propose and numerically implement a mathematical model for the simulation of three-dimensional semiconductor devices characterized by an heterogeneous material structure. The model consists of a system of nonlinearly…

Numerical Analysis · Mathematics 2013-07-12 A. Mauri , R. Sacco , M. Verri
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