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Electron lenses are pulsed, magnetically confined electron beams whose current-density profile is shaped to obtain the desired effect on the circulating beam. Electron lenses were used in the Fermilab Tevatron collider for bunch-by-bunch…

Accelerator Physics · Physics 2014-09-15 Giulio Stancari

Dual-energy computed tomography (DECT) is of great significance for clinical practice due to its huge potential to provide material-specific information. However, DECT scanners are usually more expensive than standard single-energy CT…

Medical Physics · Physics 2020-06-02 Tianling Lyu , Zhan Wu , Yikun Zhang , Yang Chen , Lei Xing , Wei Zhao

Electron microscopy is a powerful tool for studying the properties of materials down to their atomic structure. In many cases, the quantitative interpretation of images requires simulations based on atomistic structure models. These…

We present the results of an experiment where a short focal length (~ 1.3 cm) permanent magnet electron lens is used to image micron-size features of a metal sample in a single shot, using an ultra- high brightness ps-long 4 MeV electron…

Accelerator Physics · Physics 2016-07-13 D. Cesar , J. Maxson , P. Musumeci , Y. Sun , J. Harrison , P. Frigola , F. H. O'Shea , H. To , D. Alesini , R. K. Li

Photoelectron holography constitutes a powerful tool for the ultrafast imaging of matter, as it combines high electron currents with subfemtosecond resolution, and gives information about transition amplitudes and phase shifts. Similarly to…

Atomic Physics · Physics 2020-02-19 C. Figueira de Morisson Faria , A. S. Maxwell

Electron tomography has been studied in various fields. Various methods have been developed to align projection sets to construct ideally focused reconstruction. In this paper, we present how to align the projection set to distinguish…

Medical Physics · Physics 2017-06-14 Dongwook Kim , Kyungtaek Jun

Purpose: To describe a concept of a compact electron accelerator for external radiation therapy with variable energy in the range of 6 - 20 MeV, based on linotron principle. Methods: Beam dynamics simulation using the CST and MAD-X code.…

Accelerator Physics · Physics 2020-08-04 L. Yu. Ovchinnikova , V. I. Shvedunov

Neutron computed tomography (nCT) is a 3D characterization technique used to image the internal morphology or chemical composition of samples in biology and materials sciences. A typical workflow involves placing the sample in the path of a…

This publication presents an investigation of the performance of different analytical electron ptychography methods for low-dose imaging. In particular, benchmarking is performed for two model-objects, monolayer MoS$_2$ and apoferritin, by…

Applied Physics · Physics 2025-05-20 Hoelen L. Lalandec Robert , Max Leo Leidl , Knut Müller-Caspary , Jo Verbeeck

We describe the design and performance of a magnetic bottle electron spectrometer~(MBES) for high-energy electron spectroscopy. Our design features a ${\sim2}$~m long electron drift tube and electrostatic retardation lens, achieving…

State-of-the-art attosecond metrology deals with the detection and characterization of photon pulses with typical energies up to the hundreds of eV and time resolution of several tens of attoseconds. Such short pulses are used for example…

Instrumentation and Detectors · Physics 2015-06-04 Andreas Ipp , Jörg Evers , Christoph H. Keitel , Karen Z. Hatsagortsyan

New techniques for imaging electromagnetic near-fields in nanostructures drive advancements in nanotechnology, optoelectronics, materials science, and biochemistry. Most existing techniques probe near-fields along surfaces, lacking the…

We propose to use the near-threshold electron scattering data for atoms to guide the reliable experimental determination of their electron affinities (EAs), extracted using the Wigner Threshold Law, from laser photodetachment threshold…

Atomic Physics · Physics 2014-03-05 Zineb Felfli , Alfred Z. Msezane

Transmission electron microscopy at very low energy is a promising way to avoid damaging delicate biological samples with the incident electrons, a known problem in conventional transmission electron microscopy. For imaging in the 0-30 eV…

Materials Science · Physics 2020-09-22 Peter S. Neu , Daniël Geelen , Aniket Thete , Rudolf M. Tromp , Sense Jan van der Molen

We employ ptychography, a phase-retrieval imaging technique, to show experimentally for the first time that a partially coherent high-energy matter (electron) wave emanating from an extended source can be decomposed into a set of mutually…

Mesoscale and Nanoscale Physics · Physics 2017-01-04 S. Cao , P. Kok , P. Li , A. M. Maiden , J. M. Rodenburg

The inelastic scattering of electrons is one route to study the vibrational and electronic properties of materials. Such experiments, also called electron energy-loss spectroscopy, are particularly useful for the investigation of the…

Materials Science · Physics 2014-06-24 Friedrich Roth , Andreas König , Jörg Fink , Bernd Büchner , Martin Knupfer

A review of electron beam bunching methods and new bunching methods are presented. Linear accelerator, storage ring and buncher technologies offer high-beam quality and short bunches necessary for operation of high efficiency, high-power,…

Classical Physics · Physics 2009-11-10 E. G. Bessonov

In this work we introduce the Rytov approximation in the scope of high-energy electron scattering with the motivation of developing better linear models for electron scattering. Such linear models play an important role in tomography and…

Classical Physics · Physics 2017-06-14 Jonas Krehl , Axel Lubk

The investigation of paramagnetic species (such as point defects, dopants, and impurities) in solid-state electronic devices is significant because of their effect on device performance. Conventionally, these species are detected and imaged…

Materials Science · Physics 2015-05-20 Itai Katz , Matthias Fehr , Alexander Schnegg , Klaus Lips , Aharon Blank

Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the number of secondary electrons from a material of interest, and…