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This paper addresses the critical bottleneck of infrared (IR) data scarcity in Printed Circuit Board (PCB) defect detection by proposing a cross-modal data augmentation framework integrating CycleGAN and YOLOv8. Unlike conventional methods…

Computer Vision and Pattern Recognition · Computer Science 2026-05-05 Chao Yang , Haoyuan Zheng , Yue Ma

Spurious credit card transactions are a significant source of financial losses and urge the development of accurate fraud detection algorithms. In this paper, we use machine learning strategies for such an aim. First, we apply a mixed…

Machine Learning · Computer Science 2021-12-07 Daniel H. M. de Souza , Claudio J. Bordin

Quality assurance is crucial in the smart manufacturing industry as it identifies the presence of defects in finished products before they are shipped out. Modern machine learning techniques can be leveraged to provide rapid and accurate…

Computer Vision and Pattern Recognition · Computer Science 2023-02-28 Atah Nuh Mih , Hung Cao , Joshua Pickard , Monica Wachowicz , Rickey Dubay

In this paper, we propose a new technique that applies automated image analysis in the area of structural corrosion monitoring and demonstrate improved efficacy compared to existing approaches. Structural corrosion monitoring is the initial…

Computer Vision and Pattern Recognition · Computer Science 2022-01-12 Abdur Rahim Mohammad Forkan , Yong-Bin Kang , Prem Prakash Jayaraman , Kewen Liao , Rohit Kaul , Graham Morgan , Rajiv Ranjan , Samir Sinha

Ensemble methods are powerful machine learning algorithms that combine multiple models to enhance prediction capabilities and reduce generalization errors. However, their potential to generate effective test cases for fault detection in a…

Software Engineering · Computer Science 2024-09-10 Sheikh Md. Mushfiqur Rahman , Nasir U. Eisty

Classification is one of the main applications of supervised learning. Recent advancement in developing quantum computers has opened a new possibility for machine learning on such machines. Due to the noisy performance of near-term quantum…

Quantum Physics · Physics 2026-03-02 Qingyu Li , Yuhan Huang , Xiaokai Hou , Ying Li , Xiaoting Wang , Abolfazl Bayat

This paper presents a cutting-edge robotic inspection solution designed to automate quality control in automotive manufacturing. The system integrates a pair of collaborative robots, each equipped with a high-resolution camera-based vision…

Software fault prediction model are employed to optimize testing resource allocation by identifying fault-prone classes before testing phases. Several researchers' have validated the use of different classification techniques to develop…

Software Engineering · Computer Science 2017-04-17 Lov Kumar , Santanu Rath , Ashish Sureka

Within (semi-)automated visual inspection, learning-based approaches for assessing visual defects, including deep neural networks, enable the processing of otherwise small defect patterns in pixel size on high-resolution imagery. The…

Computer Vision and Pattern Recognition · Computer Science 2024-01-18 André Luiz B. Vieira e Silva , Francisco Simões , Danny Kowerko , Tobias Schlosser , Felipe Battisti , Veronica Teichrieb

With the sweeping digitalization of societal, medical, industrial, and scientific processes, sensing technologies are being deployed that produce increasing volumes of time series data, thus fueling a plethora of new or improved…

Machine Learning · Computer Science 2024-04-23 David Campos , Tung Kieu , Chenjuan Guo , Feiteng Huang , Kai Zheng , Bin Yang , Christian S. Jensen

Incipient anomalies present milder symptoms compared to severe ones, and are more difficult to detect and diagnose due to their close resemblance to normal operating conditions. The lack of incipient anomaly examples in the training data…

Machine Learning · Computer Science 2020-08-21 Baihong Jin , Yingshui Tan , Albert Liu , Xiangyu Yue , Yuxin Chen , Alberto Sangiovanni Vincentelli

In this review, automatic defect inspection algorithms that analyze Scanning Electron Microscopy (SEM) images for Semiconductor Manufacturing (SM) are identified, categorized, and discussed. This is a topic of critical importance for the SM…

Image and Video Processing · Electrical Eng. & Systems 2025-06-02 Enrique Dehaerne , Bappaditya Dey , Victor Blanco , Jesse Davis

The ubiquitous presence of printed circuit boards (PCBs) in modern electronic systems and embedded devices makes their integrity a top security concern. To take advantage of the economies of scale, today's PCB design and manufacturing are…

Cryptography and Security · Computer Science 2023-06-23 Huifeng Zhu , Haoqi Shan , Dean Sullivan , Xiaolong Guo , Yier Jin , Xuan Zhang

Deep learning has become very popular for tasks such as predictive modeling and pattern recognition in handling big data. Deep learning is a powerful machine learning method that extracts lower level features and feeds them forward for the…

Machine Learning · Computer Science 2018-03-07 Steven Young , Tamer Abdou , Ayse Bener

Handwritten digit recognition remains a fundamental challenge in computer vision, with applications ranging from postal code reading to document digitization. This paper presents an ensemble-based approach that combines Convolutional Neural…

Computer Vision and Pattern Recognition · Computer Science 2025-03-11 Syed Sajid Ullah , Li Gang , Mudassir Riaz , Ahsan Ashfaq , Salman Khan , Sajawal Khan

Quality control is a fundamental component of many manufacturing processes, especially those involving casting or welding. However, manual quality control procedures are often time-consuming and error-prone. In order to meet the growing…

Computer Vision and Pattern Recognition · Computer Science 2018-09-05 Max Ferguson , Ronay Ak , Yung-Tsun Tina Lee , Kincho H. Law

Ensemble learning serves as a straightforward way to improve the performance of almost any machine learning algorithm. Existing deep ensemble methods usually naively train many different models and then aggregate their predictions. This is…

Computer Vision and Pattern Recognition · Computer Science 2022-12-15 Le Zhang , Qibin Hou , Yun Liu , Jia-Wang Bian , Xun Xu , Joey Tianyi Zhou , Ce Zhu

In this study, we present an analysis of model-based ensemble learning for 3D point-cloud object classification and detection. An ensemble of multiple model instances is known to outperform a single model instance, but there is little study…

Computer Vision and Pattern Recognition · Computer Science 2019-05-24 Daniel Koguciuk , Łukasz Chechliński , Tarek El-Gaaly

Automatic defect detection for 3D printing processes, which shares many characteristics with change detection problems, is a vital step for quality control of 3D printed products. However, there are some critical challenges in the current…

Computer Vision and Pattern Recognition · Computer Science 2023-08-04 Yushuo Niu , Ethan Chadwick , Anson W. K. Ma , Qian Yang

Structural crack detection is a critical task for public safety as it helps in preventing potential structural failures that could endanger lives. Manual detection by inexperienced personnel can be slow, inconsistent, and prone to human…

Computer Vision and Pattern Recognition · Computer Science 2025-07-04 Subhasis Dasgupta , Jaydip Sen , Tuhina Halder
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