Related papers: Advancing SEM Based Nano-Scale Defect Analysis in …
New production techniques have emerged that have made it possible to produce metal parts with more complex shapes, making the quality control process more difficult. This implies that the visual and superficial analysis has become even more…
Change Detection (CD) is an essential field in remote sensing, with a primary focus on identifying areas of change in bi-temporal image pairs captured at varying intervals of the same region by a satellite. The data annotation process for…
Defect inspection is paramount within the closed-loop manufacturing system. However, existing datasets for defect inspection often lack precision and semantic granularity required for practical applications. In this paper, we introduce the…
This study introduces a novel self-supervised learning approach for volumetric segmentation of defect indications captured by phased array ultrasonic testing data from Carbon Fiber Reinforced Polymers (CFRPs). By employing this…
In light of globalized hardware supply chains, the assurance of hardware components has gained significant interest, particularly in cryptographic applications and high-stakes scenarios. Identifying metal lines on scanning electron…
Semantic segmentation requires dense pixel-level annotations, which are costly and time-consuming to acquire. To address this, we present SeSAM, a framework that uses a foundational segmentation model, i.e. Segment Anything Model (SAM),…
This study introduces SAMatch, a SAM-guided Match-based framework for semi-supervised medical image segmentation, aimed at improving pseudo label quality in data-scarce scenarios. While Match-based frameworks are effective, they struggle…
Automated visual inspection in the semiconductor industry aims to detect and classify manufacturing defects utilizing modern image processing techniques. While an earliest possible detection of defect patterns allows quality control and…
Segment anything model (SAM) has emerged as the leading approach for zero-shot learning in segmentation tasks, offering the advantage of avoiding pixel-wise annotations. It is particularly appealing in medical image segmentation, where the…
Defect detection in the manufacturing industry is of utmost importance for product quality inspection. Recently, optical defect detection has been investigated as an anomaly detection using different deep learning methods. However, the…
Despite the eye-catching breakthroughs achieved by deep visual networks in detecting region-level surface defects, the challenge of high-quality pixel-wise defect detection remains due to diverse defect appearances and data scarcity. To…
As the integration density and design intricacy of semiconductor wafers increase, the magnitude and complexity of defects in them are also on the rise. Since the manual inspection of wafer defects is costly, an automated artificial…
This paper presents an IoT-enhanced deep learning framework for automated crack detection in Additive Manufacturing (AM) surfaces using convolutional neural networks (CNNs). By integrating IoT-enabled real-time monitoring, high-resolution…
In this work, we perform semantic segmentation of multiple defect types in electron microscopy images of irradiated FeCrAl alloys using a deep learning Mask Regional Convolutional Neural Network (Mask R-CNN) model. We conduct an in-depth…
Automated nodule segmentation is essential for computer-assisted diagnosis in ultrasound images. Nevertheless, most existing methods depend on precise pixel-level annotations by medical professionals, a process that is both costly and…
The precise tracking and segmentation of surgical instruments have led to a remarkable enhancement in the efficiency of surgical procedures. However, the challenge lies in achieving accurate segmentation of surgical instruments while…
In modern electronic manufacturing, defect detection on Printed Circuit Boards (PCBs) plays a critical role in ensuring product yield and maintaining the reliability of downstream assembly processes. However, existing methods often suffer…
Several supermodular losses have been shown to improve the perceptual quality of image segmentation in a discriminative framework such as a structured output support vector machine (SVM). These loss functions do not necessarily have the…
Exploiting multi-scale representations is critical to improve edge detection for objects at different scales. To extract edges at dramatically different scales, we propose a Bi-Directional Cascade Network (BDCN) structure, where an…
Unsupervised pixel-level defective region segmentation is an important task in image-based anomaly detection for various industrial applications. The state-of-the-art methods have their own advantages and limitations:…