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Related papers: Retrieval of phase information from low-dose elect…

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A number of visions for a new generation of dose-efficient electron microscopes have been advanced. These proposals, while inspired by quantum principles, make little contact with the broader field of quantum metrology. We discuss a…

The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…

Applied Physics · Physics 2025-02-18 Nikita Denisov , Andrey Orekhov , Johan Verbeeck

Atomic resolution imaging in transmission electron microscopy (TEM) and scanning TEM (STEM) of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered when…

Instrumentation and Detectors · Physics 2018-12-05 Fehmi S. Yasin , Tyler R. Harvey , Jordan J. Chess , Jordan S. Pierce , Colin Ophus , Peter Ercius , Benjamin J. McMorran

Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annular dark-field imaging, produces easily-interpretable…

The advantages of convergent beam electron diffraction for symmetry determination at the scale of a few nm are well known. In practice, the approach is often limited due to the restriction on the angular range of the electron beam imposed…

Materials Science · Physics 2013-07-09 Richard Beanland , Paul J. Thomas , David I. Woodward , Pamela A. Thomas , Rudolf A. Roemer

In coherent X-ray diffraction microscopy the diffraction pattern generated by a sample illuminated with coherent x-rays is recorded, and a computer algorithm recovers the unmeasured phases to synthesize an image. By avoiding the use of a…

In both light optics and electron optics, the amplitude of a wave scattered by an object is an observable that is usually recorded in the form of an intensity distribution in a real space image or a diffraction image. In contrast, retrieval…

The structural complexity and instability of many interference phase microscopy methods are the major obstacles toward high-precision phase measurement. In this vein, improving more efficient configurations as well as proposing new methods…

Optics · Physics 2020-01-08 Samira Ebrahimi , Masoomeh Dashtdar

Zernike phase-contrast imaging is unique among imaging techniques in that it enables the upper limit of Fisher information allowed by quantum mechanics. Here we show that, in a departure from an ideal setting, using an incident beam of…

Optics · Physics 2026-02-17 Christian Dwyer , David M. Paganin

A new method for dark field imaging is introduced which uses scanned electron diffraction (or 4DSTEM - 4-dimensional scanning transmission electron microscopy) datasets as its input. Instead of working on simple summation of intensity, it…

Materials Science · Physics 2024-09-18 Ian MacLaren , Andrew T. Fraser , Matthew R. Lipsett , Colin Ophus

New lensless diffractive X-ray technic for micro-scale imaging of biological tissue is based on quantitative phase retrieval schemes. By incorporating refraction, this method yields improved contrast compared to purely absorption-based…

Numerical Analysis · Mathematics 2018-03-28 Victor Palamodov

We analyze the quantum limit of sensitivity in four-dimensional scanning transmission electron microscopy (4D-STEM), which has emerged as a favored technique for imaging the structure of a wide variety of materials, including biological and…

Optics · Physics 2024-08-14 Christian Dwyer , David M. Paganin

We introduce a phase imaging mechanism for scanning transmission electron microscopy that exploits the complementary intensity changes of transmitted disks at different scattering angles. For scanning transmission electron microscopy, this…

Instrumentation and Detectors · Physics 2023-07-06 Binbin Wang , David W. McComb

This paper proposes a non-computational method of counteracting the effect of image degradation introduced by the diffraction phenomenon in lensless microscopy. All the optical images (whether focused by lenses or not) are diffraction…

Optics · Physics 2021-04-08 Sanjeev Kumar , Manjunatha Mahadevappa , Pranab Kumar Dutta

Since the invention of Zernike phase contrast method in 1930, it has been widely used in optical microscopy and more recently in X-ray microscopy. Considering the image contrast is a mixture of absorption and phase information, we recently…

Optics · Physics 2015-12-03 Heng Chen , Kun Gao , Dajiang Wang , Li Song , Zhili Wang

Machine learning is attracting surging interest across nearly all scientific areas by enabling the analysis of large datasets and the extraction of scientific information from incomplete data. Data-driven science is rapidly growing,…

Applied Physics · Physics 2025-03-17 Sung Yun Lee , Do Hyung Cho , Chulho Jung , Daeho Sung , Daewoong Nam , Sangsoo Kim , Changyong Song

We propose a Zernike phase contrast electron microscope that uses an intense laser focus to convert a phase image into a visible image. We present the relativistic quantum theory of the phase shift caused by the laser-electron-interaction,…

Instrumentation and Detectors · Physics 2010-09-10 Holger Mueller , Jian Jin , Radostin Danev , John Spence , Howard Padmore , Robert M. Glaeser

Coherent Diffractive Imaging is a lensless technique that allows imaging of matter at a spatial resolution not limited by lens aberrations. This technique exploits the measured diffraction pattern of a coherent beam scattered by periodic…

Computational Physics · Physics 2025-08-27 Alessandro Colombo , Davide Emilio Galli , Liberato De Caro , Francesco Scattarella , Elvio Carlino

Optical microscopy is without a doubt an essential component of life science research, but many objects of interest in biology are transparent. Chemical or immunological dyes, which can often be toxic, fluorescent transgenes, which require…

Optics · Physics 2012-09-11 Quintin Tyrell Davis

In this second part of a series we attempt to construct an empirical model that can mimick all experimental observations made regarding the role of an alternative interleaved scan pattern in STEM imaging on the beam damage in a specific…

Materials Science · Physics 2021-05-03 D. Jannis , A. Velazco , A. Béché , J. Verbeeck
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