Related papers: Recognizing Beam Profiles from Silicon Photonics G…
Light yield and spatial uniformity for a large variety of configurations of scintillator tiles was studied. The light from each scintillator was collected by a Silicon Photomultiplier (SiPM) directly viewing the produced scintillation light…
Parameter-efficient fine-tuning (PEFT) has attracted significant attention due to the growth of pre-trained model sizes and the need to fine-tune (FT) them for superior downstream performance. Despite a surge in new PEFT methods, a…
Focused ion beams (FIBs) are widely used in nanofabrication for applications such as circuit repair, ultra-thin lamella preparation, strain engineering, and quantum device prototyping. Although the lateral spread of the ion beam is often…
A novel modular high-resolution charged-particle tracking detector design using $250\mu m$ diameter, round, scintillating fibers and SiPM arrays for readout is presented. The fiber modules consist of 8 layers of 128 fibers, mechanically sta…
Silicon Photomultipliers (SiPM) represent a promising alternative to classical photomultipliers, for instance, for the detection of photons in high energy physics and medical physics. In the present work, electrical characterizations of…
We report systematic studies of plasmonic and photonic guiding modes in large-area chemical-vapor-deposition-grown graphene on nanostructured silicon substrates. Light interaction in graphene with substrate photonic crystals can be…
Efficient fiber-to-chip couplers for multi-port access to photonic integrated circuits are paramount for a broad class of applications, ranging, e.g., from telecommunication to photonic computing and quantum technologies. While…
In this paper, we calculate the material specific absorption accurately using a modal method by determining the integral of the Poynting vector around the boundary of a specific material. Given that the accuracy of our method is only…
The recently developed and publicly available synthetic image generation methods and services make it possible to create extremely realistic imagery on demand, raising great risks for the integrity and safety of online information.…
For the purpose of withstanding very high radiation doses, silicon pixel sensors with a 3D electrode geometry are being developed. Detectors of this kind are highly interesting for harch radiation environments such as expected in the High…
Structured illumination microscopy (SIM) is a wide-field super-resolution technique normally limited to roughly twice the diffraction-limited resolution ($\approx 100$--$200$~nm). Surpassing this bound is a classic ill-posed inverse…
Silicon Photomultipliers (SiPMs) are photon-counting detectors with great potential to improve the sensitivity of optical receivers. Recent studies of SiPMs in communication focus on the speed rather than the power consumption of the…
The paper reports on a high precision equipment designed to modify over 3-dimensions (3D) by means of high-energy gold ions the local properties of thin and thick films. A target-moving system aimed at creating patterns across the volume is…
We report on the possibility of using Silicon Photomultipliers (SiPMs) to detect the scintillation light from neutron conversion in ZnS:6LiF scintillators. The light is collected by wavelength-shifting fibers embedded into the scintillator.…
Silicon photomultipliers (SiPM) are the photon detectors chosen for the tracking readout in NEXT, a neutrinoless {\beta}{\beta} decay experiment which uses a high pressure gaseous xenon time projection chamber (TPC). The reconstruction of…
Meeting the high data rate demands of modern applications necessitates the utilization of high-frequency spectrum bands, including millimeter-wave and sub-terahertz bands. However, these frequencies require precise alignment of narrow…
Intelligent reflecting surface (IRS), which consists of a large number of tunable reflective elements, is capable of enhancing the wireless propagation environment in a cellular network by intelligently reflecting the electromagnetic waves…
Measurements of transverse profiles using Ionization Profile Monitors (IPMs) for high brightness beams are affected by the electromagnetic field of the beam. This interaction may cause a distortion of the measured profile shape despite…
Existing beamforming-based full-duplex solutions for multi-antenna wireless systems often rely on explicit estimation of the self-interference channel. The pilot overhead of such estimation, however, can be prohibitively high in…
As the demand for wireless connectivity continues to soar, the fifth generation and beyond wireless networks are exploring new ways to efficiently utilize the wireless spectrum and reduce hardware costs. One such approach is the integration…