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Field-of-view and resolution trade-offs in X-Ray micro-computed tomography (micro-CT) imaging limit the characterization, analysis and model development of multi-scale porous systems. To this end, we developed an applied methodology…

Cryo-electron microscopy (cryo-EM) has emerged as a powerful technique for determining the three-dimensional structures of biological molecules at near-atomic resolution. However, reconstructing helical assemblies presents unique challenges…

Instrumentation developments in electron energy-loss spectroscopy (EELS) in the scanning transmission electron microscope (STEM) one decade ago paved the way for combining milli-electronvolt energy resolution in spectroscopy with…

Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…

The simulation of transmission electron microscopy (TEM) images or diffraction patterns is often required to interpret their contrast and extract specimen features. This is especially true for high-resolution phase-contrast imaging of…

Medical images acquired from standardized protocols show consistent macroscopic or microscopic anatomical structures, and these structures consist of composable/decomposable organs and tissues, but existing self-supervised learning (SSL)…

To date, high-resolution electron microscopy has largely relied on using the phase of the exit wave function at the exit surface to form a high-resolution electron microscopic image. We have for the first time used chromatic aberration…

This study introduces the first 3D spectral-element method (SEM) simulation of ultrasonic wave propagation in a bottlenose dolphin (Tursiops truncatus) head. Unlike traditional finite-element methods (FEM), which struggle with…

Efficient and accurate extraction of microstructures in micrographs of materials is essential in process optimization and the exploration of structure-property relationships. Deep learning-based image segmentation techniques that rely on…

High-resolution segmentation is critical for precise disease diagnosis by extracting fine-grained morphological details. Existing hierarchical encoder-decoder frameworks have demonstrated remarkable adaptability across diverse medical…

In this paper, 3D image data of ore particle systems is investigated. By combining X-ray micro tomography (XMT) with scanning electron microscope (SEM) based image analysis additional information about the mineralogical composition from…

Recently, learned image compression has attracted considerable attention due to its superior performance over traditional methods. However, most existing approaches employ a single entropy model to estimate the probability distribution of…

This study explores the application of Convolutional Autoencoders (CAEs) for analyzing and reconstructing Scanning Tunneling Microscopy (STM) images of various crystalline lattice structures. We developed two distinct CAE architectures to…

Feature sizes in integrated circuits have decreased substantially over time, and it has become increasingly difficult to three-dimensionally image these complex circuits after fabrication. This can be important for process development,…

Analytical electron microscopy and spectroscopy of biological specimens, polymers, and other beam sensitive materials has been a challenging area due to irradiation damage. There is a pressing need to develop novel imaging and spectroscopic…

In electron microscopy, charging of non-conductive biological samples by focused electron beams hinders their high-resolution imaging. Gold or platinum coatings have been commonly used to prevent such sample charging, but it disables…

Metasurfaces constitute effective media for manipulating and transforming impinging EM waves. Related studies have explored a series of impactful MS capabilities and applications in sectors such as wireless communications, medical imaging…

Scanning transmission electron microscopy (STEM) is an indispensable tool for atomic-resolution structural analysis for a wide range of materials. The conventional analysis of STEM images is an extensive hands-on process, which limits…

Beam damage is a major limitation in electron microscopy that becomes increasingly severe at higher resolution. One possible route to circumvent radiation damage, which forms the basis for single-particle electron microscopy and related…

This proposes a novel ensemble deep learning-based model to accurately classify, detect and localize different defect categories for aggressive pitches and thin resists (High NA applications).In particular, we train RetinaNet models using…