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Intense lasers can accelerate electrons to very high energy over a short distance. Such compact accelerators have several potential applications including fast ignition, high energy physics, and radiography. Among the various schemes of…
We report the development of a detection optics for the integration of Raman scattering and scanning probe microscopy at low temperature based on a parabolic mirror. In our set-up half of the paraboloid mirror covers a solid angle of $\pi$…
In this paper we propose a low-cost high-speed imaging line scan system. We replace an expensive industrial line scan camera and illumination with a custom-built set-up of cheap off-the-shelf components, yielding a measurement system with…
We predict collective 'free-space' lasing in a dense nanoscopic emitter arrangement where dipole-dipole coupled atomic emitters synchronize their emission and exhibit lasing behavior without the need for an optical resonator. At the example…
The interaction of a weak probe laser with an inverted-Y type four-level atomic system driven by two additional coherent fields is investigated theoretically. Under the influence of the coherent coupling fields, the steady-state linear…
Fast polarization switching of light sources is required over a wide spectral range to investigate the symmetry of matter. In this Letter, we report the first experimental demonstration of the crossed-planar undulator technique at a seeded…
The scanning electron microscope (SEM) delivers high resolution, high depth of focus and an image quality as if microscopic objects are seen by the naked eye. This makes it not only a powerful scientific instrument, but a tool inherently…
We propose a magnetic measurement method utilizing a patterned post-sample aperture in a transmission electron microscope. While utilizing electron magnetic circular dichroism, the method circumvents previous needs to shape the electron…
We introduce a phase imaging mechanism for scanning transmission electron microscopy that exploits the complementary intensity changes of transmitted disks at different scattering angles. For scanning transmission electron microscopy, this…
Optical imaging below the limit of light diffraction offers an unprecedented opportunity to study outlook, organization, interactions or in-situ functioning of sub-micrometer, highly transparent objects such as subcellular structures in…
We present a conceptual design for the input optical system for a multi-object spectrometer operating at submillimeter wavelengths. The Mirror MOS is based on a sequence of mirrors that enables low-loss propagation of beams from selected…
Low image contrast is a major limitation in transmission electron microscopy, since samples with low atomic number only weakly phase-modulate the illuminating electron beam, and beam-induced sample damage limits the usable electron dose.…
We propose an approach to optical imaging beyond the diffraction limit, based on transformation optics in concentric circular cylinder domains. The resulting systems allow image magnification and minimize reflection losses due to the…
We report on the development of an ultrafast Transmission Electron Microscope based on a laser-driven cold-field emission source. We first describe the instrument before reporting on numerical simulations of the laser-driven electron…
We report the modification of a label-free image scanning microscope (ISM) to perform asynchronous 2D imaging at 24kHz while keeping the lateral resolution gain and background rejection of a regular label-free ISM setup. Our method uses a…
We report on a reflective wave-plate system utilizing phase-shifting mirrors (PSM) for a continuous variation of elliptical polarization without changing the beam position and direction. The scalability of multilayer optics to large…
We introduce the concept of a squeezed laser, in which a squeezed cavity mode develops a macroscopic photonic occupation due to stimulated emission. Above the lasing threshold, the emitted light retains both the spectral purity inherent of…
A new approach to separation of a variety of microscopic and mesoscopic objects in dilute solution is presented. The approach takes advantage of unique properties of a specially designed separation device (sieve), which can be readily built…
Layered materials (LMs) are at the centre of an ever increasing research effort due to their potential use in a variety of applications. The presence of imperfections, such as bi- or multilayer areas, holes, grain boundaries, isotropic and…
Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by…