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Deep metric learning (DML) involves training a network to learn a semantically meaningful representation space. Many current approaches mine n-tuples of examples and model interactions within each tuplets. We present a novel, compositional…

Computer Vision and Pattern Recognition · Computer Science 2025-04-22 Shubhang Bhatnagar , Narendra Ahuja

Deep Metric Learning (DML) is helpful in computer vision tasks. In this paper, we firstly introduce DML into image co-segmentation. We propose a novel Triplet loss for Image Segmentation, called IS-Triplet loss for short, and combine it…

Computer Vision and Pattern Recognition · Computer Science 2021-03-22 Zhengwen Li , Xiabi Liu

Deep metric learning is an important area due to its applicability to many domains such as image retrieval and person re-identification. The main drawback of such models is the necessity for labeled data. In this work, we propose to…

Computer Vision and Pattern Recognition · Computer Science 2019-11-19 Xuefei Cao , Bor-Chun Chen , Ser-Nam Lim

Deep Metric Learning (DML) loss functions traditionally aim to control the forces of separability and compactness within an embedding space so that the same class data points are pulled together and different class ones are pushed apart.…

Computer Vision and Pattern Recognition · Computer Science 2024-09-04 Michael G. DeMoor , John J. Prevost

With the remarkable success achieved by the Convolutional Neural Networks (CNNs) in object recognition recently, deep learning is being widely used in the computer vision community. Deep Metric Learning (DML), integrating deep learning with…

Computer Vision and Pattern Recognition · Computer Science 2018-03-08 Bowen Wu , Zhangling Chen , Jun Wang , Huaming Wu

Deep metric learning, which learns discriminative features to process image clustering and retrieval tasks, has attracted extensive attention in recent years. A number of deep metric learning methods, which ensure that similar examples are…

Computer Vision and Pattern Recognition · Computer Science 2019-04-05 Tongtong Yuan , Weihong Deng , Jian Tang , Yinan Tang , Binghui Chen

Supervised contrastive learning (SupCL) has emerged as a prominent approach in representation learning, leveraging both supervised and self-supervised losses. However, achieving an optimal balance between these losses is challenging;…

Machine Learning · Computer Science 2025-03-12 Chungpa Lee , Jeongheon Oh , Kibok Lee , Jy-yong Sohn

Deep metric learning algorithms have been utilized to learn discriminative and generalizable models which are effective for classifying unseen classes. In this paper, a novel noise tolerant deep metric learning algorithm is proposed. The…

Machine Learning · Computer Science 2019-04-09 Soumyadeep Ghosh , Richa Singh , Mayank Vatsa

In this paper, we reveal that metric learning would suffer from serious inseparable problem if without informative sample mining. Since the inseparable samples are often mixed with hard samples, current informative sample mining strategies…

Machine Learning · Computer Science 2022-01-21 Kun Song , Junwei Han , Gong Cheng , Jiwen Lu , Feiping Nie

This paper presents a hardness-aware deep metric learning (HDML) framework. Most previous deep metric learning methods employ the hard negative mining strategy to alleviate the lack of informative samples for training. However, this mining…

Computer Vision and Pattern Recognition · Computer Science 2019-12-05 Wenzhao Zheng , Zhaodong Chen , Jiwen Lu , Jie Zhou

This paper proposes a deep representation learning using an information-theoretic loss with an aim to increase the inter-class distances as well as within-class similarity in the embedded space. Tasks such as anomaly and out-of-distribution…

Machine Learning · Computer Science 2022-02-08 Shin Ando

This work presents a new deep learning approach for keystroke biometrics based on a novel Distance Metric Learning method (DML). DML maps input data into a learned representation space that reveals a "semantic" structure based on distances.…

Computer Vision and Pattern Recognition · Computer Science 2021-09-03 Aythami Morales , Julian Fierrez , Alejandro Acien , Ruben Tolosana , Ignacio Serna

Many recent loss functions in deep metric learning are expressed with logarithmic and exponential forms, and they involve margin and scale as essential hyper-parameters. Since each data class has an intrinsic characteristic, several…

Audio and Speech Processing · Electrical Eng. & Systems 2023-05-24 Myunghun Jung , Hoirin Kim

Ensembles of Convolutional neural networks have shown remarkable results in learning discriminative semantic features for image classification tasks. Though, the models in the ensemble often concentrate on similar regions in images. This…

Computer Vision and Pattern Recognition · Computer Science 2023-02-28 Tobias Schlagenhauf , Yiwen Lin , Benjamin Noack

Recent contrastive learning methods have shown to be effective in various tasks, learning generalizable representations invariant to data augmentation thereby leading to state of the art performances. Regarding the multifaceted nature of…

Machine Learning · Computer Science 2022-05-27 MinGyu Choi , Wonseok Shin , Yijingxiu Lu , Sun Kim

In this paper, we present a novel deep metric learning method to tackle the multi-label image classification problem. In order to better learn the correlations among images features, as well as labels, we attempt to explore a latent space,…

Computer Vision and Pattern Recognition · Computer Science 2020-07-28 Changsheng Li , Chong Liu , Lixin Duan , Peng Gao , Kai Zheng

Learning similarity functions between image pairs with deep neural networks yields highly correlated activations of embeddings. In this work, we show how to improve the robustness of such embeddings by exploiting the independence within…

Computer Vision and Pattern Recognition · Computer Science 2018-01-16 Michael Opitz , Georg Waltner , Horst Possegger , Horst Bischof

Metric learning is an important problem in machine learning. It aims to group similar examples together. Existing state-of-the-art metric learning approaches require class labels to learn a metric. As obtaining class labels in all…

Computer Vision and Pattern Recognition · Computer Science 2020-09-29 Ujjal Kr Dutta , Mehrtash Harandi , Chellu Chandra Sekhar

Overparameterized models have proven to be powerful tools for solving various machine learning tasks. However, overparameterization often leads to a substantial increase in computational and memory costs, which in turn requires extensive…

Machine Learning · Computer Science 2024-03-13 Soo Min Kwon , Zekai Zhang , Dogyoon Song , Laura Balzano , Qing Qu

The deep metric learning (DML) objective is to learn a neural network that maps into an embedding space where similar data are near and dissimilar data are far. However, conventional proxy-based losses for DML have two problems: gradient…

Computer Vision and Pattern Recognition · Computer Science 2023-06-13 Shozo Saeki , Minoru Kawahara , Hirohisa Aman