Related papers: Point-Spread Function of the Optics in Scanning El…
Research in semiconductor physics has advanced to the study of two-dimensional (2D) materials where the surface controls electronic transport. A scanning probe microscope (SPM) is an ideal tool to image electronic motion in these devices by…
Experiments in nuclear and particle physics often use magnetic fields to guide charged reaction products to a detector. Due to their gyration in the guide field, the particles hit the detector within an area that can be considerably larger…
Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as…
We introduce a novel framework for upsampled Point Spread Function (PSF) modeling using pixel-level Bayesian inference. Accurate PSF characterization is critical for precision measurements in many fields including: weak lensing, astrometry,…
Point spread function (PSF) reconstruction (PSF-R) is a well established technique to determine reliably and accurately the PSF from Adaptive Optics (AO) control loop data. We have successfully applied this technique to improve the…
Incoherently illuminated or luminescent objects give rise to a low-contrast speckle-like pattern when observed through a thin diffusive medium, as such a medium effectively convolves their shape with a speckle-like point spread function…
The Scanning electron microscope (SEM) and Electron-Dispersive Spectroscope (EDS) are two highly effective instruments in the field of nanoscience and nanotechnology. The quality of these instruments is determined by various factors, with…
Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide the necessary spatial resolution, electron-optical…
Ultrasound imaging systems rely on accurate point spread function (PSF) estimation to support advanced image quality enhancement techniques such as deconvolution and speckle reduction. Phase aberration, caused by sound speed inhomogeneity…
Aberration-corrected scanning transmission electron microscopes (STEM) provide sub-angstrom lateral resolution; however, the large convergence angle greatly reduces the depth of field. For microscopes with a small depth of field,…
Free electron beams such as those employed in electron microscopes have evolved into powerful tools to investigate photonic nanostructures with an unrivaled combination of spatial and spectral precision through the analysis of electron…
We present the development of a data-driven, AI-based model of the Point Spread Function (PSF) that achieves higher accuracy than the current state-of-the-art approach, "PSF in the Full Field-of-View'' (PIFF). PIFF is widely used in leading…
We demonstrate the application of Atomic Force Microscopy (AFM) based optical force microscopy to map the optical near-fields with nanometer resolution, limited only by the AFM probe geometry. We map the electric field distributions of…
The point-spread function (PSF) of an imaging system describes the response of the system to a point source. Accurately determining the PSF enables one to correct for the combined effects of focussing and scattering within the imaging…
In both light optics and electron optics, the amplitude of a wave scattered by an object is an observable that is usually recorded in the form of an intensity distribution in a real space image or a diffraction image. In contrast, retrieval…
The point spread function (PSF) of a translation invariant imaging system is its impulse response, which cannot always be measured directly. This is the case in high energy X-ray radiography, and it must be estimated from images of…
Progress in electron-beam spectroscopies has recently enabled the study of optical excitations with combined space, energy and time resolution in the nanometer, millielectronvolt and femtosecond domain, thus providing unique access into…
Probing optical excitations with nanometer resolution is important for understanding their dynamics and interactions down to the atomic scale. Electron microscopes currently offer the unparalleled ability of rendering spatially-resolved…
The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the…
Electron energy loss spectroscopy is consolidating as a powerful tool to explore electronic (as well as vibrational) excitations of matter, including molecules. Performed in a scanning transmission electron microscope, this technique is…