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Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns.…

Materials Science · Physics 2024-06-04 Jiake Wei , Zhangze Xu , Wenjie Shen , Bin Feng , Ryo Ishikawa , Naoya Shibata , Yuichi Ikuhara , Xuedong Bai

We present a coherent population trapping based scheme to attain sub-nanoscale resolution for atom localization, microscopy and lithography. Our method uses three-level atoms coupled to amplitude modulated probe field and spatially…

Quantum Physics · Physics 2009-12-08 K. T. Kapale , G. S. Agarwal

Measuring the three-dimensional (3D) distribution of chemistry in nanoscale matter is a longstanding challenge for metrological science. The inelastic scattering events required for 3D chemical imaging are too rare, requiring high beam…

Phase imaging in electron microscopy is sensitive to the local potential, including charge redistribution from bonding. We demonstrate that electron ptychography provides the necessary sensitivity to detect this subtle effect by directly…

Ptychography is a scanning coherent diffraction imaging technique successfully applied in the electron, visible and x-ray regimes. One of the distinct features of ptychography with respect to other coherent diffraction techniques is its…

Modern nanomaterials contain complexity that spans all three dimensions - from multigate semiconductors to clean energy nanocatalysts to complex block copolymers. For nanoscale characterization, it has been a long-standing goal to observe…

Applied Physics · Physics 2020-06-03 Robert Hovden , David A. Muller

We propose a magnetic measurement method based on combining depth sectioning and electron magnetic circular dichroism in scanning transmission electron microscopy. Electron vortex beams with large convergence angles, as those achievable in…

Materials Science · Physics 2018-11-14 Devendra Negi , Lewys Jones , Juan-Carlos Idrobo , Jan Rusz

Three-dimensional reconstruction of atomic structure, known as atomic electron tomography (AET), has found increasing applications in materials science. The AET has been limited to very small nanoparticles due to the challenges of obtaining…

Materials Science · Physics 2024-01-24 Liangze Mao , Jizhe Cui , Rong Yu

While multislice electron ptychography can provide thermal-vibration limited resolution and 3D information, it relies on the proper selection of many intertwined experimental and computational parameters. Here, we outline a theoretical…

Materials Science · Physics 2023-11-28 Colin Gilgenbach , Xi Chen , James M. LeBeau

We report the optical imaging of a single atom with nanometer resolution using an adaptive optical alignment technique that is applicable to general optical microscopy. By decomposing the image of a single laser-cooled atom, we identify and…

Atomic Physics · Physics 2016-09-21 J. D. Wong-Campos , K. G. Johnson , B. Neyenhuis , J. Mizrahi , C. Monroe

The exceptional electronic, optical and chemical properties of two-dimensional materials strongly depend on the 3D atomic structure and crystal defects. Using Re-doped MoS2 as a model, here we develop scanning atomic electron tomography…

Electron ptychography provides highly sensitive, dose efficient phase images which can be corrected for aberrations after the data has been acquired. This is crucial when very precise quantification is required, such as with sensitivity to…

Materials Science · Physics 2023-07-27 Christoph Hofer , Timothy J. Pennycook

The fusion of rigorous physical laws with flexible data-driven learning represents a new frontier in scientific simulation, yet bridging the gap between physical interpretability and computational efficiency remains a grand challenge. In…

Digital images from crystals, as projected from the third spatial dimension and recorded in atomic resolution with any kind of real-world microscope, feature necessarily broken symmetries of the translation-periodicity-restricted Euclidean…

Materials Science · Physics 2025-11-25 Tyler Bortel , Peter Moeck

To date, high-resolution (< 1 nm) imaging of extended objects in three-dimensions (3D) has not been possible. A restriction known as the Crowther criterion forces a tradeoff between object size and resolution for 3D reconstructions by…

Materials Science · Physics 2014-11-20 Robert Hovden , Peter Ercius , Yi Jiang , Deli Wang , Yingchao Yu , Hector D. Abruna , Veit Elser , David A. Muller

Ptychography has become prominent at synchrotron facilities worldwide for characterizing biological and material specimens' topological structures and properties at the nanometer or atomic scale, due to its lens - less, highly quantitative…

Image and Video Processing · Electrical Eng. & Systems 2025-01-28 Tao Liu , Bingyang Wang , JiangTao Zhao , Maik Kahnt , Fucai Zhang

Functional properties of nanomaterials strongly depend on their surface atomic structure, but they often become largely different from their bulk structure, exhibiting surface reconstructions and relaxations. However, most of the surface…

Materials Science · Physics 2021-10-01 Juhyeok Lee , Chaehwa Jeong , Yongsoo Yang

Electronic charge transfer at the atomic scale can reveal fundamental information about chemical bonding, but is far more challenging to directly image than the atomic structure. The charge density is dominated by the atomic nuclei, with…

Materials Science · Physics 2025-05-01 Christoph Hofer , Jacob Madsen , Toma Susi , Timothy J. Pennycook

Three-dimensional electron diffraction (3D ED) has emerged as a powerful method for solving the structures of sub-micron-sized particles down to nanoparticles. However, it faces technical challenges when applied to beam-sensitive samples or…

Freestanding oxide films offer significant potential for integrating exotic quantum functionalities with semiconductor technologies. However, their performance is critically limited by surface roughness and interfacial imperfection caused…

Materials Science · Physics 2025-11-04 Huaicheng Yuan , Yu-Chen Liu , Li-Shu Wang , Zehao Dong , Jan-Chi Yang , Zhen Chen