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We show that the symmetries of image formation by scattering enable graph-theoretic manifold-embedding techniques to extract structural and timing information from simulated and experimental snapshots at extremely low signal. The approach…

Computational Physics · Physics 2011-09-27 Peter Schwander , Chun Hong Yoon , Abbas Ourmazd , Dimitrios Giannakis

Scanning transmission electron microscopy (STEM) provides high-resolution visualization of atomic structures as well as various functional imaging modes utilizing phase contrast. In this study we introduce a semicircular aperture in STEM…

Quantum phase transitions in Rydberg atom arrays present significant opportunities for studying many-body physics, yet distinguishing between different ordered phases without explicit order parameters remains challenging. We present a…

Quantum Physics · Physics 2025-10-28 Hemish Ahuja , Samradh Bhardwaj , Kirti Dhir , Roman Bagdasarian , Ziwoong Jang

Three-dimensional electron diffraction (3D ED) has emerged as a powerful method for solving the structures of sub-micron-sized particles down to nanoparticles. However, it faces technical challenges when applied to beam-sensitive samples or…

Topologically ordered systems in the presence of symmetries can exhibit new structures which are referred to as symmetry enriched topological (SET) phases. We introduce simple methods to detect the SET order directly from a complete set of…

Strongly Correlated Electrons · Physics 2014-08-06 Ching-Yu Huang , Xie Chen , Frank Pollmann

Orbital angular momentum of photons is an intriguing system for the storage and transmission of quantum information, but it is rapidly degraded by atmospheric turbulence. We explore the ability of adaptive optics to compensate for this…

Quantum Physics · Physics 2016-12-09 Jose Raul Gonzalez Alonso , Todd Brun

Four-dimensional scanning transmission electron microscopy (4D-STEM) provides rich, atomic-scale insights into materials structures. However, extracting specific physical properties - such as polarization directions essential for…

Analysis of the imaging of some simple distributions of object phase by a phase plate of Zernike type shows that sharp transitions in the object phase are well transmitted. The low-frequency components of the complete object function are…

Instrumentation and Detectors · Physics 2013-07-26 C. J. Edgcombe

We directly measured the normalized $\it{s}$-wave scattering cross-section of ultracold $^{40}\rm{K}$ atoms across a magnetic-field Feshbach resonance by colliding pairs of degenerate Fermi gases (DFGs) and imaging the scattered atoms. We…

The performance of electron energy-loss spectrometers can often be limited by their electron-optical aberrations. Due to recent developments in high energy-resolution and momentum-resolved electron energy loss spectroscopy (EELS), there is…

Materials Science · Physics 2023-02-28 Yueming Guo , Andrew R. Lupini

Quantum state tomography is a fundamental task in quantum information science, enabling detailed characterization of correlations, entanglement, and electronic structure in quantum systems. However, its exponential measurement and…

In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably…

Four dimensional scanning transmission electron microscopy (4D STEM) records the scattering of electrons in a material in great detail. The benefits offered by 4D STEM are substantial, with the wealth of data it provides facilitating for…

Instrumentation and Detectors · Physics 2021-12-09 Daen Jannis , Christoph Hofer , Chuang Gao , Xiaobin Xie , Armand Béché , Timothy J. Pennycook , Jo Verbeeck

Quantifying the effects on electromagnetic waves scattered by objects of uncertain shape is key for robust design, particularly in high precision applications. Assuming small random perturbations departing from a nominal domain, the…

Computational Engineering, Finance, and Science · Computer Science 2023-08-04 Paul Escapil-Inchauspé , Carlos Jerez-Hanckes

Secondary electron (SE) imaging techniques, such as scanning electron microscopy and helium ion microscopy (HIM), use electrons emitted by a sample in response to a focused beam of charged particles incident at a grid of raster scan…

Signal Processing · Electrical Eng. & Systems 2026-03-12 Vaibhav Choudhary , Akshay Agarwal , Vivek K Goyal

Quantitative Transmission Electron Microscopy (TEM) during in-situ straining experiment is able to reveal the motion of dislocations -- linear defects in the crystal lattice of metals. In the domain of materials science, the knowledge about…

Computer Vision and Pattern Recognition · Computer Science 2023-09-08 Karina Ruzaeva , Kishan Govind , Marc Legros , Stefan Sandfeld

Optical aberrations significantly degrade image quality in microscopy, particularly when imaging deeper into samples. These aberrations arise from distortions in the optical wavefront and can be mathematically represented using Zernike…

Computer Vision and Pattern Recognition · Computer Science 2026-05-13 Yong En Kok , Bowen Deng , Alexander Bentley , Andrew J. Parkes , Michael G. Somekh , Amanda J. Wright , Michael P. Pound

Scanning Transmission Electron Microscopy (STEM) is a critical tool for imaging the properties of materials and biological specimens at atomic scale, yet our understanding of relevant electron beam damage mechanisms is incomplete. Recent…

Signal Processing · Electrical Eng. & Systems 2025-07-02 Amir Javadi Rad , Amirafshar Moshtaghpour , Dongdong Chen , Angus I. Kirkland

The influence of low-spatial frequency errors of an optical component of an imaging system on the point spread function can be quantified using Zernike polynomials. High-spatial frequency errors cause strong scattering due to which the…

Optics · Physics 2026-04-03 Luuk Zonneveld , Paul Urbach , Aurèle Adam

A conversion matrix approach to solving network problems involving time-varying circuit components is applied to the method of moments for electromagnetic scattering analysis. Detailed formulations of this technique's application to the…

Systems and Control · Electrical Eng. & Systems 2022-09-21 S. F. Bass , A. M. Palmer , K. R. Schab , K. C. Kerby-Patel , J. E. Ruyle
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