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Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM simulations using the particle probe model provide a…

Materials Science · Physics 2025-09-03 Jie Huang , Niko Oinonen , Fabio Priante , Filippo Federici Canova , Lauri Kurki , Chen Xu , Adam S. Foster

Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…

Materials Science · Physics 2015-06-24 F. J. Giessibl , H. Bielefeldt , S. Hembacher , J. Mannhart

In this paper we present a new machine learning workflow with unsupervised learning techniques to identify domains within atomic force microscopy images obtained from polymer films. The goal of the workflow is to identify the spatial…

Image and Video Processing · Electrical Eng. & Systems 2024-09-23 Aanish Paruchuri , Yunfei Wang , Xiaodan Gu , Arthi Jayaraman

Artificial intelligence (AI) and machine learning have promised to revolutionize the way we live and work, and one of particularly promising areas for AI is image analysis. Nevertheless, many current AI applications focus on post-processing…

Materials Science · Physics 2020-07-31 Boyuan Huang , Zhenghao Li , Jiangyu Li

Fluorescence lifetime imaging microscopy (FLIM) is a powerful technique in biomedical research that uses the fluorophore decay rate to provide additional contrast in fluorescence microscopy. However, at present, the calculation, analysis,…

Image and Video Processing · Electrical Eng. & Systems 2021-06-09 Varun Mannam , Yide Zhang , Xiaotong Yuan , Cara Ravasio , Scott S. Howard

Atomic force microscopy (AFM) with molecule-functionalized tips has emerged as the primary experimental technique for probing the atomic structure of organic molecules on surfaces. Most experiments have been limited to nearly planar…

This paper develops a resolution enhancement method for post-processing the images from Atomic Force Microscopy (AFM). This method is based on deep learning neural networks in the AFM topography measurements. In this study, a very deep…

Data Analysis, Statistics and Probability · Physics 2018-09-12 Y. Liu , Q. M. Sun , Dr. W. H. Lu , Dr. H. L. Wang , Y. Sun , Z. T. Wang , X. Lu , Prof. K. Y. Zeng

A novel application of machine-learning (ML) based image processing algorithms is proposed to analyze an all-sky map (ASM) obtained using the Fermi Gamma-ray Space Telescope. An attempt was made to simulate a one-year ASM from a…

High Energy Astrophysical Phenomena · Physics 2021-06-02 Shogo Sato , Jun Kataoka , Soichiro Ito , Jun'ichi Kotoku , Masato Taki , Asuka Oyama , Takaya Toyoda , Yuki Nakamura , Marino Yamamoto

Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…

Analyzing atomically resolved images is a time-consuming process requiring solid experience and substantial human intervention. In addition, the acquired images contain a large amount of information such as crystal structure, presence and…

Atomic force microscopy (AFM) is an essential nanoinstrument technique for several applications such as cell biology and nanoelectronics metrology and inspection. The need for statistically significant sample sizes means that data…

Instrumentation and Detectors · Physics 2017-04-05 H. Sadeghian , R. Herfst , B. Dekker , J. Winters , T. Bijnagte , R. Rijnbeek

Scanning probe experiments such as scanning tunneling microscopy (STM) and atomic force microscopy (AFM) on strongly correlated electronic systems often reveal complex pattern formation on multiple length scales. By studying the universal…

Strongly Correlated Electrons · Physics 2019-04-03 L. Burzawa , Shuo Liu , E. W. Carlson

Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…

Instrumentation and Detectors · Physics 2017-04-28 Gustavo Cordova , Brenda Yasie Lee , Zoya Leonenko

Atomic Force Microscopy (AFM) is a widely employed tool for micro-/nanoscale topographic imaging. However, conventional AFM scanning struggles to reconstruct complex 3D micro-/nanostructures precisely due to limitations such as incomplete…

Computer Vision and Pattern Recognition · Computer Science 2024-01-23 Shuo Chen , Mao Peng , Yijin Li , Bing-Feng Ju , Hujun Bao , Yuan-Liu Chen , Guofeng Zhang

Despite being the main tool to visualize molecules at the atomic scale, AFM with CO-functionalized metal tips is unable to chemically identify the observed molecules. Here we present a strategy to address this challenging task using deep…

Materials Science · Physics 2025-09-03 Jaime Carracedo-Cosme , Carlos Romero-Muñiz , Pablo Pou , Rubén Pérez

Atomic force microscopy (AFM) enables high-resolution imaging and quantitative force measurement, which is critical for understanding nanoscale mechanical, chemical, and biological interactions. In dynamic AFM modes, however, interaction…

Instrumentation and Detectors · Physics 2025-06-10 Simon Laflamme , Bugrahan Guner , Omur E. Dagdeviren

We explore the application of computer vision and machine learning (ML) techniques to predict material properties (e.g. compressive strength) based on SEM images. We show that it's possible to train ML models to predict materials…

The integration of machine learning in medical image analysis can greatly enhance the quality of healthcare provided by physicians. The combination of human expertise and computerized systems can result in improved diagnostic accuracy. An…

We propose a novel concept of asymmetric feature maps (AFM), which allows to evaluate multiple kernels between a query and database entries without increasing the memory requirements. To demonstrate the advantages of the AFM method, we…

Computer Vision and Pattern Recognition · Computer Science 2017-04-14 Giorgos Tolias , Ondřej Chum

Recent advancements in machine learning (ML) and deep learning (DL), particularly through the introduction of Foundation Models (FMs), have significantly enhanced surgical scene understanding within minimally invasive surgery (MIS). This…

Computer Vision and Pattern Recognition · Computer Science 2025-11-04 Ufaq Khan , Umair Nawaz , Adnan Qayyum , Shazad Ashraf , Yutong Xie , Muhammad Haris Khan , Muhammad Bilal , Junaid Qadir
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