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Self-assembled semiconductor quantum dots show remarkable optical and spin coherence properties, which have lead to a concerted research effort examining their potential as a quantum bit for quantum information science1-6. Here, we present…
Strong confinement of charges in few electron systems such as in atoms, molecules and quantum dots leads to a spectrum of discrete energy levels that are often shared by several degenerate quantum states. Since the electronic structure is…
The atomic force microscope (AFM) is a versatile, high-resolution tool used to characterize the topography and material properties of a large variety of specimens at nano-scale. The interaction of the micro-cantilever tip with the specimen…
Milli-Kelvin atomic force microscopy (mK-AFM) presents an ongoing experimental challenge due to the intense vibrations in a cryogen-free dilution refrigerator and the low cooling power available at mK temperatures. A viable approach is to…
We report low-temperature transport spectroscopy of a graphene quantum dot fabricated by atomic force microscope nanolithography. The excellent spatial resolution of the atomic force microscope allows us to reliably fabricate quantum dots…
The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional…
Contact electrification (CE) remains a critical challenge in advanced material technologies where uncontrolled surface charging can compromise manufacturability, reliability, and performance in practical applications. Ultrathin glass with…
Microscopic imaging of local magnetic fields provides a window into the organizing principles of complex and technologically relevant condensed matter materials. However, a wide variety of intriguing strongly correlated and topologically…
Atomic-scale characteristics of surfaces dictate the principles governing numerous scientific phenomena ranging from catalysis to friction. Despite this fact, our ability to visualize and alter surfaces on the atomic scale is severely…
Atomic force microscopy (AFM) using qPlus sensors is a powerful tool for high-resolution analysis in various liquids, including high-viscosity or opaque environments. However, the relatively high displacement sensor noise density (n_{ds}),…
Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties. Contact resonance-enhanced methods of Atomic Force Microscopy (AFM) have been…
Electrostatic force microscopy (EFM) can image nanoscale objects buried below the surface. Here, we theoretically show that this capability can be used to obtain nanotomographic information, i.e., the physical dimensions and dielectric…
Self-assembled quantum dots have remarkable optical, electronic and spintronic properties that make them leading candidates for quantum information technologies. Their characterization requires rapid and local determination of both charge…
A new technique for the fabrication of highly sensitive qPlus sensor for atomic force microscopy (AFM) is described. Focused ion beam was used to cut then weld onto a bare quartz tuning fork a sharp micro-tip from an electrochemically…
Efficient detection of magnetic fields is central to many areas of research and has important practical applications ranging from materials science to geomagnetism. High sensitivity detectors are commonly built using direct…
Atomic force spectroscopy and microscopy (AFM) are invaluable tools to characterize nanostructures and biological systems. Most experiments, including state-of-the-art images of molecular bonds, are achieved by driving probes at their…
Self-assembled, epitaxially-grown InAs/GaAs quantum dots are promising semiconductor quantum emitters that can be integrated on a chip for a variety of photonic quantum information science applications. However, self-assembled growth…
Stretchable conductors are of crucial relevance for emerging technologies such as wearable electronics, low-invasive bioelectronic implants or soft actuators for robotics. A critical issue for their development regards the understanding of…
Atomic force microscopy (AFM) phase approach-curves have significant potential for nanoscale material characterization, however, the availability of robust datasets and automated analysis tools has been limited. In this paper, we introduce…
An exponential increase in the performance of silicon microelectronics and the demand to manufacture in great volumes has created an ecosystem that requires increasingly complex tools to fabricate and characterize the next generation of…