Related papers: Simulating Charged Defects at Database Scale
In the realm of industrial quality inspection, defect detection stands as a critical component, particularly in high-precision, safety-critical sectors such as automotive components aerospace, and medical devices. Traditional methods,…
We study the problem of detecting change points (CPs) that are characterized by a subset of dimensions in a multi-dimensional sequence. A method for detecting those CPs can be formulated as a two-stage method: one for selecting relevant…
The large-scale search for high-performing candidate 2D materials is limited to calculating a few simple descriptors, usually with first-principles density functional theory calculations. In this work, we alleviate this issue by extending…
Atomic-level modeling performed at large scales enables the investigation of mesoscale materials properties with atom-by-atom resolution. The spatial complexity of such cross-scale simulations renders them unsuitable for simple human visual…
With high device integration density and evolving sophisticated device structures in semiconductor chips, detecting defects becomes elusive and complex. Conventionally, machine learning (ML)-guided failure analysis is performed with offline…
The presence of atomic-scale defects at multilayer interfaces significantly degrades performance in CdTe-based photovoltaic technologies. The ability to accurately predict and understand defect formation mechanisms during overlayer growth…
Conventionally, high-throughput computational materials searches start from an input set of bulk compounds extracted from material databases, and this set is screened for candidate materials for specific applications. In contrast, many…
The processes of radiation defects formation and evolution have been simulated in cubic dielectric crystals by the computational method of cellular automata. If suppose that the defects concentration as a parameter, which characterizes a…
The surface defect detection method based on visual perception has been widely used in industrial quality inspection. Because defect data are not easy to obtain and the annotation of a large number of defect data will waste a lot of…
Defect engineering in two-dimensional (2D) materials is essential for advancing applications such as gas sensing, single-atom catalysis, and guided nanoparticle self-assembly, enabling the creation of materials with tailored…
The density functional theory (DFT) is used in a study of point defects on both UN (001) surface and sub-surface layers. We compare results for slabs of different thicknesses (both perfect and containing nitrogen or uranium vacancies) with…
We present a simple and general framework for feature learning from point clouds. The key to the success of CNNs is the convolution operator that is capable of leveraging spatially-local correlation in data represented densely in grids…
Solar photovoltaic (PV) modules are prone to damage during manufacturing, installation and operation which reduces their power conversion efficiency. This diminishes their positive environmental impact over the lifecycle. Continuous…
Quality management in semiconductor manufacturing often relies on template matching with known golden standards. For Indium-Phosphide (InP) multi-project wafer manufacturing, low production scale and high design variability lead to such…
Recently, various convolutions based on continuous or discrete kernels for point cloud processing have been widely studied, and achieve impressive performance in many applications, such as shape classification, scene segmentation and so on.…
Detecting and evaluating surface coating defects is important for marine vessel maintenance. Currently, the assessment is carried out manually by qualified inspectors using international standards and their own experience. Automating the…
The term defect tolerance is widely used in literature to describe materials such as lead-halides which exhibit long non-radiative lifetimes of carriers despite possessing a large concentration of point defects. Studies on defect tolerance…
With continuous progression of Moore's Law, integrated circuit (IC) device complexity is also increasing. Scanning Electron Microscope (SEM) image based extensive defect inspection and accurate metrology extraction are two main challenges…
3D perception in point clouds is transforming the perception ability of future intelligent machines. Point cloud algorithms, however, are plagued by irregular memory accesses, leading to massive inefficiencies in the memory sub-system,…
In recent years, three-dimensional point clouds are used increasingly to document natural environments. Each dataset contains a diverse set of objects, at varying shapes and sizes, distributed throughout the data and intricately intertwined…