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Recent advances in high-throughput experimentation for combinatorial studies have accelerated the discovery and analysis of materials across a wide range of compositions and synthesis conditions. However, many of the more powerful…

Emergent behavior at complex oxide interfaces has driven much of the research in the oxide thin film community for the past twenty years. Interfaces have been engineered for potential applications in spintronics, topological quantum…

Materials Science · Physics 2021-07-06 Suresh Thapa , Rajendra Paudel , Miles D. Blanchet , Patrick T. Gemperline , Ryan B. Comes

The distinction between point and line resolution in transmission electron microscopy (TEM) arises because an ability to image sub-0.2 nm fringes is a necessary, but not a sufficient, condition for imaging individual atoms. In scanned tip…

Instrumentation and Detectors · Physics 2007-05-23 P. Fraundorf , J. Tentschert

We introduce a new direction in the field of atom optics, atom interferometry, and neutral-atom quantum information processing. It is based on the use of microfabricated optical elements. With these elements versatile and integrated atom…

Quantum Physics · Physics 2009-11-06 G. Birkl , F. B. J. Buchkremer , R. Dumke , W. Ertmer

Quantum technologies based on quantum point defects in crystals require control over the defect charge state. Here we tune the charge state of shallow nitrogen-vacancy and silicon-vacancy centers by locally oxidizing a hydrogenated surface…

The properties of bulk nanostructured materials are often controlled by atomic scale features like segregation along defects or composition gradients. Here we discuss about the complimentary use of TEM and APT to obtain a full description…

Materials Science · Physics 2009-04-15 Xavier Sauvage , Williams Lefebvre , Cécile Genevois , S. Ohsaki , Kazuhiro Hono

An original setup combining a very stable loading stage, an atomic force microscope and an environmental chamber, allows to obtain very stable sub-critical fracture propagation in oxide glasses under controlled environment, and subsequently…

An analytical model of the electrostatic force between the tip of a non-contact Atomic Force Microscope (nc-AFM) and the (001) surface of an ionic crystal is reported. The model is able to account for the atomic contrast of the local…

Atomic and Molecular Clusters · Physics 2008-07-10 Franck Bocquet , Laurent Nony , Christian Loppacher , Thilo Glatzel

Atomic-level modeling performed at large scales enables the investigation of mesoscale materials properties with atom-by-atom resolution. The spatial complexity of such cross-scale simulations renders them unsuitable for simple human visual…

Materials Science · Physics 2022-04-05 Heejung Chung , Rodrigo Freitas , Gowoon Cheon , Evan J. Reed

The structure of single atoms in real space is investigated by scanning tunneling microscopy. Very high resolution is possible by a dramatic reduction of the tip-sample distance. The instabilities which are normally encountered when using…

Materials Science · Physics 2009-11-10 M. Herz , F. J. Giessibl , J. Mannhart

In this introductory review, we give an overview of the computational chemistry methods commonly used in the field of metal-organic frameworks (MOFs), to describe or predict the structures themselves and characterize their various…

Materials Science · Physics 2016-02-02 François-Xavier Coudert , Alain H. Fuchs

High resolution Atomic Force Microscopy (AFM) and Scanning Tunnelling Microscopy (STM) imaging with functionalized tips is well established, but a detailed understanding of the imaging mechanism is still missing. We present a numerical…

Mesoscale and Nanoscale Physics · Physics 2014-08-27 Prokop Hapala , Georgy Kichin , Christian Wagner , F. Stefan Tautz , Ruslan Temirov , Pavel Jelinek

We present an aberration corrected scanning transmission electron microscopy (ac-STEM) analysis of the perovskite (LaFeO3) and pyrochlore (Yb2Ti2O7 and Pr2Zr2O7) oxides and demonstrate that both the shape and contrast of visible atomic…

Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM simulations using the particle probe model provide a…

Materials Science · Physics 2025-09-03 Jie Huang , Niko Oinonen , Fabio Priante , Filippo Federici Canova , Lauri Kurki , Chen Xu , Adam S. Foster

Imaging of structural defects in a material can be realized with a radio-frequency atomic magnetometer by monitoring the material's response to a radio-frequency excitation field. We demonstrate two measurement configurations that enable…

Applied Physics · Physics 2019-03-27 P. Bevington , R. Gartman , W. Chalupczak

Photonic components based on structured metallic elements show great potential for device applications where field enhancement and confinement of the radiation on a subwavelength scale is required. In this paper we report a detailed study…

The Field Ion Microscope (FIM) can be used to characterize the atomic configuration of the apex of sharp tips. These tips are well suited for Scanning Probe Microscopy (SPM) since they predetermine SPM resolution and electronic structure…

Mesoscale and Nanoscale Physics · Physics 2012-08-07 William Paul , Yoichi Miyahara , Peter Grütter

We present a theoretical study on the magnetic signals of structural surface defects like cracks or indents combined with rough surfaces or subsurface inclusions of soft ferromagnetic metals like body-centered cubic Fe or amorphous CoFeB.…

Materials Science · Physics 2024-06-25 Wolfgang Körner , Daniel F. Urban , Christian Elsässer

Twisted oxide membranes represent a promising platform for exploring moire physics and emergent quantum phenomena. However, the presence of amorphous interfacial dead layers in conventional oxide heterostructures impedes coherent coupling…

Materials Science · Physics 2026-01-30 Young-Hoon Kim , Reza Ghanbari , Min-Hyoung Jung , Young-Min Kim , Ruijuan Xu , Miaofang Chi

Characterizing crystal structures and interfaces down to the atomic level is an important step for designing advanced materials. Modern electron microscopy routinely achieves atomic resolution and is capable to resolve complex arrangements…

Materials Science · Physics 2023-09-07 Andreas Leitherer , Byung Chul Yeo , Christian H. Liebscher , Luca M. Ghiringhelli